| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Jannis, D.; Hofer, C.; Gao, C.; Xie, X.; Béché, A.; Pennycook, Tj.; Verbeeck, J. |
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications |
2022 |
Ultramicroscopy |
233 |
31 |
UA library record; WoS full record; WoS citing articles |
| Bladt, E.; Pelt, D.M.; Bals, S.; Batenburg, K.J. |
Electron tomography based on highly limited data using a neural network reconstruction technique |
2015 |
Ultramicroscopy |
158 |
25 |
UA library record; WoS full record; WoS citing articles |
| Vanrompay, H.; Skorikov, A.; Bladt, E.; Béché, A.; Freitag, B.; Verbeeck, J.; Bals, S. |
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges |
2021 |
Ultramicroscopy |
221 |
15 |
UA library record; WoS full record; WoS citing articles |
| Javon, E.; Lubk; Cours, R.; Reboh, S.; Cherkashin, N.; Houdellier, F.; Gatel, C.; Hytch, M.J. |
Dynamical effects in strain measurements by dark-field electron holography |
2014 |
Ultramicroscopy |
147 |
10 |
UA library record; WoS full record; WoS citing articles |
| Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. |
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy |
2014 |
Ultramicroscopy |
137 |
74 |
UA library record; WoS full record; WoS citing articles |
| Denisov, N.; Jannis, D.; Orekhov, A.; Müller-Caspary, K.; Verbeeck, J. |
Characterization of a Timepix detector for use in SEM acceleration voltage range |
2023 |
Ultramicroscopy |
253 |
|
UA library record; WoS full record |
| Koo, J.; Dahl, A.B.; Bærentzen, J.A.; Chen, Q.; Bals, S.; Dahl, V.A. |
Shape from projections via differentiable forward projector for computed tomography |
2021 |
Ultramicroscopy |
224 |
3 |
UA library record; WoS full record; WoS citing articles |
| Fatermans, J.; den Dekker, Aj.; Müller-Caspary, K.; Gauquelin, N.; Verbeeck, J.; Van Aert, S. |
Atom column detection from simultaneously acquired ABF and ADF STEM images |
2020 |
Ultramicroscopy |
219 |
9 |
UA library record; WoS full record; WoS citing articles |
| Chen, D.; Goris, B.; Bleichrodt, F.; Heidari Mezerji, H.; Bals, S.; Batenburg, K.J.; de With, G.; Friedrich, H. |
The properties of SIRT, TVM, and DART for 3D imaging of tubular domains in nanocomposite thin-films and sections |
2014 |
Ultramicroscopy |
147 |
42 |
UA library record; WoS full record; WoS citing articles |
| van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. |
Correction of non-linear thickness effects in HAADF STEM electron tomography |
2012 |
Ultramicroscopy |
116 |
67 |
UA library record; WoS full record; WoS citing articles |
| Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
Direct structure inversion from exit waves: part 1: theory and simulations |
2010 |
Ultramicroscopy |
110 |
25 |
UA library record; WoS full record; WoS citing articles |
| Martinez, G.T.; van den Bos, K.H.W.; Alania, M.; Nellist, P.D.; Van Aert, S. |
Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy |
2018 |
Ultramicroscopy |
187 |
4 |
UA library record; WoS full record; WoS citing articles |
| de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. |
Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations |
2013 |
Ultramicroscopy |
134 |
48 |
UA library record; WoS full record; WoS citing articles |
| Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design |
2016 |
Ultramicroscopy |
170 |
6 |
UA library record; WoS full record; WoS citing articles |
| de Backer, A.; De wael, A.; Gonnissen, J.; Van Aert, S. |
Optimal experimental design for nano-particle atom-counting from high-resolution STEM images |
2015 |
Ultramicroscopy |
151 |
24 |
UA library record; WoS full record; WoS citing articles |
| Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. |
Bandgap measurement of high refractive index materials by off-axis EELS |
2017 |
Ultramicroscopy |
182 |
3 |
UA library record; WoS full record; WoS citing articles |
| Zhang, X.F.; Zhang, X.B.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Werner, H. |
A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60 |
1994 |
Ultramicroscopy |
55 |
2 |
UA library record; WoS full record; WoS citing articles |
| Van den Broek, W.; Jannis, D.; Verbeeck, J. |
Convexity constraints on linear background models for electron energy-loss spectra |
2023 |
Ultramicroscopy |
254 |
|
UA library record |
| Guzzinati, G.; Clark, L.; Béché, A.; Juchtmans, R.; Van Boxem, R.; Mazilu, M.; Verbeeck, J. |
Prospects for versatile phase manipulation in the TEM : beyond aberration correction |
2015 |
Ultramicroscopy |
151 |
19 |
UA library record; WoS full record; WoS citing articles |
| Şentürk, D.G.; De Backer, A.; Van Aert, S. |
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination |
2024 |
Ultramicroscopy |
259 |
|
UA library record |
| de Backer, A.; Van Aert, S.; van Dyck, D. |
High precision measurements of atom column positions using model-based exit wave reconstruction |
2011 |
Ultramicroscopy |
111 |
8 |
UA library record; WoS full record; WoS citing articles |
| Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. |
How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? |
2017 |
Ultramicroscopy |
181 |
3 |
UA library record; WoS full record; WoS citing articles |
| Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. |
Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? |
2012 |
Ultramicroscopy |
114 |
5 |
UA library record; WoS full record; WoS citing articles |
| Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process |
2022 |
Ultramicroscopy |
|
4 |
UA library record; WoS full record; WoS citing articles |
| Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. |
Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question |
2016 |
Ultramicroscopy |
174 |
2 |
UA library record; WoS full record; WoS citing articles |
| Goris, B.; Roelandts, T.; Batenburg, K.J.; Heidari Mezerji, H.; Bals, S. |
Advanced reconstruction algorithms for electron tomography : from comparison to combination |
2013 |
Ultramicroscopy |
127 |
63 |
UA library record; WoS full record; WoS citing articles |
| van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. |
Throughput maximization of particle radius measurements by balancing size and current of the electron probe |
2011 |
Ultramicroscopy |
111 |
7 |
UA library record; WoS full record; WoS citing articles |
| Verbeeck, J.; Sc hattschneider, P.; Rosenauer, A. |
Image simulation of high resolution energy filtered TEM images |
2009 |
Ultramicroscopy |
109 |
36 |
UA library record; WoS full record; WoS citing articles |
| Verbeeck, J.; Bertoni, G.; Lichte, H. |
A holographic biprism as a perfect energy filter? |
2011 |
Ultramicroscopy |
111 |
13 |
UA library record; WoS full record; WoS citing articles |
| Heidari Mezerji, H.; van den Broek, W.; Bals, S. |
A practical method to determine the effective resolution in incoherent experimental electron tomography |
2011 |
Ultramicroscopy |
111 |
26 |
UA library record; WoS full record; WoS citing articles |
