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  Author Title Year Publication Volume Times cited Additional Links Links
Idrissi, H.; Béché, A.; Gauquelin, N.; Ul-Haq, I.; Bollinger, C.; Demouchy, S.; Verbeeck, J.; Pardoen, T.; Schryvers, D.; Cordier, P. On the formation mechanisms of intragranular shear bands in olivine by stress-induced amorphization 2022 Acta materialia 239 5 UA library record; WoS full record; WoS citing articles url doi
Savchenko, T.M.; Buzzi, M.; Howald, L.; Ruta, S.; Vijayakumar, J.; Timm, M.; Bracher, D.; Saha, S.; Derlet, P.M.; Béché, A.; Verbeeck, J.; Chantrell, R.W.; Vaz, C.A.F.; Nolting, F.; Kleibert, A. Single femtosecond laser pulse excitation of individual cobalt nanoparticles 2020 Physical Review B 102 1 UA library record; WoS full record pdf url doi
Prabhakara, V.; Jannis, D.; Guzzinati, G.; Béché, A.; Bender, H.; Verbeeck, J. HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale 2020 Ultramicroscopy 219 4 UA library record; WoS full record; WoS citing articles url doi
Guzzinati, G.; Béché, A.; McGrouther, D.; Verbeeck, J. Prospects for out-of-plane magnetic field measurements through interference of electron vortex modes in the TEM 2019 Journal of optics 21 3 UA library record; WoS full record; WoS citing articles pdf url doi
Kleibert, A.; Balan, A.; Yanes, R.; Derlet, P.M.; Vaz, C.A.F.; Timm, M.; Fraile Rodríguez, A.; Béché, A.; Verbeeck, J.; Dhaka, R.S.; Radovic, M.; Nowak, U.; Nolting, F. Direct observation of enhanced magnetism in individual size- and shape-selected 3d transition metal nanoparticles 2017 Physical review B 95 21 UA library record; WoS full record; WoS citing articles pdf url doi
Bhat, S.G.; Gauquelin, N.; Sebastian, N.K.; Sil, A.; Béché, A.; Verbeeck, J.; Samal, D.; Kumar, P.S.A. Orthorhombic vs. hexagonal epitaxial SrIrO3 thin films : structural stability and related electrical transport properties 2018 Europhysics letters 122 4 UA library record; WoS full record; WoS citing articles pdf doi
Prabhakara, V.; Jannis, D.; Béché, A.; Bender, H.; Verbeeck, J. Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique 2019 Semiconductor science and technology 8 UA library record; WoS full record; WoS citing articles url doi
Rouvière, J.-L.; Béché, A.; Martin, Y.; Denneulin, T.; Cooper, D. Improved strain precision with high spatial resolution using nanobeam precession electron diffraction 2013 Applied physics letters 103 53 UA library record; WoS full record; WoS citing articles doi
Gauquelin, N.; van den Bos, K.H.W.; Béché, A.; Krause, F.F.; Lobato, I.; Lazar, S.; Rosenauer, A.; Van Aert, S.; Verbeeck, J. Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques 2017 Ultramicroscopy 181 34 UA library record; WoS full record; WoS citing articles pdf url doi
Vanrompay, H.; Béché, A.; Verbeeck, J.; Bals, S. Experimental Evaluation of Undersampling Schemes for Electron Tomography of Nanoparticles 2019 Particle and particle systems characterization 36 12 UA library record; WoS full record; WoS citing articles pdf doi
Guzzinati, G.; Béché, A.; Lourenço-Martins, H.; Martin, J.; Kociak, M.; Verbeeck, J. Probing the symmetry of the potential of localized surface plasmon resonances with phase-shaped electron beams 2017 Nature communications 8 84 UA library record; WoS full record; WoS citing articles pdf url doi
Lepot, K.; Addad, A.; Knoll, A.H.; Wang, J.; Troadec, D.; Béché, A.; Javaux, E.J. Iron minerals within specific microfossil morphospecies of the 1.88 Ga Gunflint Formation 2017 Nature communications 8 20 UA library record; WoS full record; WoS citing articles pdf url doi
Altantzis, T.; Lobato, I.; De Backer, A.; Béché, A.; Zhang, Y.; Basak, S.; Porcu, M.; Xu, Q.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Tendeloo, G.; Van Aert, S.; Bals, S. Three-Dimensional Quantification of the Facet Evolution of Pt Nanoparticles in a Variable Gaseous Environment 2019 Nano letters 19 82 UA library record; WoS full record; WoS citing articles url doi
Gao, C.; Hofer, C.; Jannis, D.; Béché, A.; Verbeeck, J.; Pennycook, T.J. Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science 2022 Applied physics letters 121 9 UA library record; WoS full record; WoS citing articles pdf url doi
de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting 2015 Ultramicroscopy 151 29 UA library record; WoS full record; WoS citing articles pdf url doi
De Backer, A.; De Wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits? 2015 Journal of physics : conference series 644 UA library record; WoS full record pdf url doi
de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits? 2015 Journal of physics : conference series 644 UA library record url doi
Jannis, D.; Müller-Caspary, K.; Béché, A.; Verbeeck, J. Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope 2021 Applied Sciences-Basel 11 9 UA library record; WoS full record; WoS citing articles pdf url doi
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. Locating light and heavy atomic column positions with picometer precision using ISTEM 2016 Ultramicroscopy 172 8 UA library record; WoS full record; WoS citing articles url doi
Denneulin, T.; Rouvière, J.L.; Béché, A.; Py, M.; Barnes, J.P.; Rochat, N.; Hartmann, J.M.; Cooper, D. The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography 2011 Semiconductor science and technology 26 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Béché, A.; van den Broek, W. A holographic method to measure the source size broadening in STEM 2012 Ultramicroscopy 120 29 UA library record; WoS full record; WoS citing articles pdf doi
Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. Evaluation of different rectangular scan strategies for STEM imaging 2020 Ultramicroscopy 13 UA library record; WoS full record; WoS citing articles url doi
Cooper, D.; Denneulin, T.; Barnes, J.-P.; Hartmann, J.-M.; Hutin, L.; Le Royer, C.; Béché, A.; Rouvière, J.-L. Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy 2012 Applied Physics Letters 112 14 UA library record; WoS full record; WoS citing articles doi
Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping 2019 Applied physics letters 114 17 UA library record; WoS full record; WoS citing articles url doi
Li, K.; Béché, A.; Song, M.; Sha, G.; Lu, X.; Zhang, K.; Du, Y.; Ringer, S.P.; Schryvers, D. Atomistic structure of Cu-containing \beta" precipitates in an Al-Mg-Si-Cu alloy 2014 Scripta materialia 75 22 UA library record; WoS full record; WoS citing articles doi
Béché, A.; Goris, B.; Freitag, B.; Verbeeck, J. Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy 2016 Applied physics letters 108 40 UA library record; WoS full record; WoS citing articles pdf url doi
Jalabert, D.; Pelloux-Gervais, D.; Béché, A.; Hartmann, J.M.; Gergaud, P.; Rouvière, J.L.; Canut, B. Depth strain profile with sub-nm resolution in a thin silicon film using medium energy ion scattering 2012 Physica Status Solidi A-Applications And Materials Science 209 3 UA library record; WoS full record; WoS citing articles doi
Béché, A.; Van Boxem, R.; Van Tendeloo, G.; Verbeeck, J. Magnetic monopole field exposed by electrons 2014 Nature physics 10 131 UA library record; WoS full record; WoS citing articles url doi
Idrissi, H.; Ghidelli, M.; Béché, A.; Turner, S.; Gravier, S.; Blandin, J.-J.; Raskin, J.-P.; Schryvers, D.; Pardoen, T. Atomic-scale viscoplasticity mechanisms revealed in high ductility metallic glass films 2019 Scientific reports 9 UA library record; WoS full record; WoS citing articles url doi
Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings 2022 Ultramicroscopy 232 18 UA library record; WoS full record; WoS citing articles url doi
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