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Author Cotte, M.; Gonzalez, V.; Vanmeert, F.; Monico, L.; Dejoie, C.; Burghammer, M.; Huder, L.; de Nolf, W.; Fisher, S.; Fazlic, I.; Chauffeton, C.; Wallez, G.; Jimenez, N.; Albert-Tortosa, F.; Salvado, N.; Possenti, E.; Colombo, C.; Ghirardello, M.; Comelli, D.; Avranovich Clerici, E.; Vivani, R.; Romani, A.; Costantino, C.; Janssens, K.; Taniguchi, Y.; McCarthy, J.; Reichert, H.; Susini, J.
Title The “Historical Materials BAG” : a new facilitated access to synchrotron X-ray diffraction analyses for cultural heritage materials at the European Synchrotron Radiation Facility Type A1 Journal article
Year 2022 Publication Molecules: a journal of synthetic chemistry and natural product chemistry Abbreviated Journal (down) Molecules
Volume 27 Issue 6 Pages 1997-21
Keywords A1 Journal article; Antwerp X-ray Imaging and Spectroscopy (AXIS)
Abstract The European Synchrotron Radiation Facility (ESRF) has recently commissioned the new Extremely Brilliant Source (EBS). The gain in brightness as well as the continuous development of beamline instruments boosts the beamline performances, in particular in terms of accelerated data acquisition. This has motivated the development of new access modes as an alternative to standard proposals for access to beamtime, in particular via the “block allocation group” (BAG) mode. Here, we present the recently implemented “historical materials BAG”: a community proposal giving to 10 European institutes the opportunity for guaranteed beamtime at two X-ray powder diffraction (XRPD) beamlines-ID13, for 2D high lateral resolution XRPD mapping, and ID22 for high angular resolution XRPD bulk analyses-with a particular focus on applications to cultural heritage. The capabilities offered by these instruments, the specific hardware and software developments to facilitate and speed-up data acquisition and data processing are detailed, and the first results from this new access are illustrated with recent applications to pigments, paintings, ceramics and wood.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000776369800001 Publication Date 2022-03-21
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1420-3049 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 4.6 Times cited Open Access OpenAccess
Notes Approved Most recent IF: 4.6
Call Number UA @ admin @ c:irua:188053 Serial 7218
Permanent link to this record
 
 
Author Martin, J.M.L.; El-Yazal, J.; François, J.P.; Gijbels, R.
Title The structure and energetics of B3N2, B2N3, and BN4: symmetry breaking effects in B3N2 Type A1 Journal article
Year 1995 Publication Molecular physics Abbreviated Journal (down) Mol Phys
Volume 85 Issue Pages 527-537
Keywords A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication London Editor
Language Wos A1995RM01600007 Publication Date 2006-04-28
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0026-8976;1362-3028; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.72 Times cited 19 Open Access
Notes Approved
Call Number UA @ lucian @ c:irua:12279 Serial 3276
Permanent link to this record
 
 
Author Martin, J.M.L.; Slanina, Z.; François, J.P.; Gijbels, R.
Title The structure, energetics, and harmonic vibrations of B3N and BN3 Type A1 Journal article
Year 1994 Publication Molecular physics Abbreviated Journal (down) Mol Phys
Volume 82 Issue Pages 155-164
Keywords A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication London Editor
Language Wos A1994NN66200010 Publication Date 2006-04-04
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0026-8976;1362-3028; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.72 Times cited 19 Open Access
Notes Approved PHYSICS, APPLIED 28/145 Q1 #
Call Number UA @ lucian @ c:irua:10254 Serial 3303
Permanent link to this record
 
 
Author Baelus, B.J.; Peeters, F.M.
Title Multiply connected mesoscopic superconductors Type A1 Journal article
Year 2003 Publication Modern physics letters B T2 – 3rd International Conference on Modern Problems in Superconductivity, SEP 09-14, 2002, YALTA, UKRAINE Abbreviated Journal (down) Mod Phys Lett B
Volume 17 Issue 10-12 Pages 527-536
Keywords A1 Journal article; Condensed Matter Theory (CMT)
Abstract Multiply connected mesoscopic: superconductors are considered within the framework of the nonlinear Ginzburg-Landau theory. The two coupled nonlinear equations are solved numerically and we investigated the properties of a superconducting ring, two concentric rings, and an asymmetric ring. We find that (i) for a mesoscopic superconducting ring the flux through the hole is not quantized, (ii) two concentric mesoscopic superconducting rings are magnetically coupled and the interaction energy increases with increasing sample thickness, and (iii) in asymmetric rings, a stationary phase slip state is predicted.
Address
Corporate Author Thesis
Publisher World scientific publ co pte ltd Place of Publication Singapore Editor
Language Wos 000184303900016 Publication Date 2003-07-23
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0217-9849;1793-6640; ISBN Additional Links UA library record; WoS full record
Impact Factor 0.617 Times cited Open Access
Notes Approved Most recent IF: 0.617; 2003 IF: 0.461
Call Number UA @ lucian @ c:irua:103810 Serial 2236
Permanent link to this record
 
 
Author Xu, Y.; Jia, D.J.; Chen, Z.Y.
Title Trial solution and critical frequency to the singly quantized vortex in big Bose-Einstein condensates Type A1 Journal article
Year 2006 Publication Modern physics letters B Abbreviated Journal (down) Mod Phys Lett B
Volume 20 Issue 16 Pages 995-1005
Keywords A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Singapore Editor
Language Wos 000239683400006 Publication Date 2006-07-21
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0217-9849;1793-6640; ISBN Additional Links UA library record; WoS full record
Impact Factor 0.617 Times cited Open Access
Notes Approved Most recent IF: 0.617; 2006 IF: 0.569
Call Number UA @ lucian @ c:irua:60587 Serial 3731
Permanent link to this record
 
 
Author Bismayer, U.; Mathes, D.; Bosbach, D.; Putnis, A.; Van Tendeloo, G.; Novak, J.; Salje, E.K.H.
Title Ferroelastic orientation states and domain walls in lead phosphate type crystals Type A1 Journal article
Year 2000 Publication Mineralogical magazine Abbreviated Journal (down) Mineral Mag
Volume 64 Issue 2 Pages 233-239
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication London Editor
Language Wos 000087015800007 Publication Date 2002-07-27
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1471-8022;0026-461X; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.285 Times cited 16 Open Access
Notes Approved Most recent IF: 1.285; 2000 IF: 1.570
Call Number UA @ lucian @ c:irua:54694 Serial 1178
Permanent link to this record
 
 
Author Bindi, L.; Rossell, M.D.; Van Tendeloo, G.; Spry, P.G.; Cipriani, C.
Title Inferred phase relations in part of the system Au-Ag-Te: an integrated analytical study of gold ore from the Golden Mile, Kalgoorlie, Australia Type A1 Journal article
Year 2005 Publication Mineralogy and petrology Abbreviated Journal (down) Miner Petrol
Volume 83 Issue 3/4 Pages 283-293
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Wien Editor
Language Wos 000227237500007 Publication Date 2004-12-02
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0930-0708;1438-1168; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.236 Times cited 15 Open Access
Notes Approved Most recent IF: 1.236; 2005 IF: 0.831
Call Number UA @ lucian @ c:irua:54878 Serial 1610
Permanent link to this record
 
 
Author Lebedev, O.I.; Van Tendeloo, G.; Suvorova, A.A.; Usov, I.O.; Suvorov, A.V.
Title HREM study of ion implantation in 6H-SiC at high temperatures Type A1 Journal article
Year 1997 Publication Journal of electron microscopy Abbreviated Journal (down) Microscopy-Jpn
Volume 46 Issue 4 Pages 271-279
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Tokyo Editor
Language Wos A1997XY94900002 Publication Date 0000-00-00
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0022-0744; 1477-9986 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 0.9 Times cited 7 Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:21444 Serial 1511
Permanent link to this record
 
 
Author Lemmens, H.; Richard, O.; Van Tendeloo, G.; Bismayer, U.
Title Microstructure and phase transitions in Pb(Sc0.5Ta0.5)O3 Type A1 Journal article
Year 1999 Publication Journal of electron microscopy Abbreviated Journal (down) Microscopy-Jpn
Volume 48 Issue 6 Pages 843-847
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract The microstructure and phase transitions in the perovskite-based ferroelectric lead scandium tantalate, Pb(Sc0.5Ta0.5)O-3 have been investigated by transmission electron microscopy. The effects of ordering of Sc and Ta cations are apparent in reciprocal space as well as in direct space images. High-resolution observations allow direct structure imaging of the domain structure. The structure of the low temperature ferroelectric phase is studied by selected area electron diffraction (SAED) and electron microdiffraction. The relaxer behaviour of this paraelectric-ferroelectric transition is displayed by diffuse intensities in the SAED patterns at temperatures around the Curie point.
Address
Corporate Author Thesis
Publisher Place of Publication Tokyo Editor
Language Wos 000085129600023 Publication Date 2012-04-19
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0022-0744;1477-9986; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 0.9 Times cited 7 Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:95195 Serial 2057
Permanent link to this record
 
 
Author Richard, O.; Van Tendeloo, G.; Lemée, N.; le Lannic, J.; Guilloux-Viry, M.; Perrin, A.
Title Microstructure of CuXMo6S8 Chevrel phase thin films on R-plane sapphire Type A1 Journal article
Year 2000 Publication Journal of electron microscopy Abbreviated Journal (down) Microscopy-Jpn
Volume 49 Issue 3 Pages 493-501
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Tokyo Editor
Language Wos 000088308100015 Publication Date 2012-04-19
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0022-0744;1477-9986; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 0.9 Times cited Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:54722 Serial 2069
Permanent link to this record
 
 
Author Morimura, T.; Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Hasaka, M.; Hisatsune, K.
Title Microstructure of Mn-doped, spin-cast FeSi2 Type A1 Journal article
Year 1997 Publication Journal of electron microscopy Abbreviated Journal (down) Microscopy-Jpn
Volume 46 Issue 3 Pages 221-225
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Tokyo Editor
Language Wos A1997XP43400004 Publication Date 0000-00-00
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0022-0744; 1477-9986 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 0.9 Times cited 3 Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:21410 Serial 2070
Permanent link to this record
 
 
Author Chen, J.H.; Van Tendeloo, G.
Title Microstructure of tough polycrystalline natural diamond Type A1 Journal article
Year 1999 Publication Journal of electron microscopy Abbreviated Journal (down) Microscopy-Jpn
Volume 48 Issue Pages 121-129
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Tokyo Editor
Language Wos 000079814900005 Publication Date 2012-04-19
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0022-0744;1477-9986; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 0.9 Times cited 9 Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:29710 Serial 2077
Permanent link to this record
 
 
Author Sanchez-Munoz, L.; Nistor, L.; Van Tendeloo, G.; Sanz, J.
Title Modulated structures in KAISi3O8: a study by high resolution electron microscopy and 29Si MAS-NMR spectroscopy Type A1 Journal article
Year 1998 Publication Journal of electron microscopy Abbreviated Journal (down) Microscopy-Jpn
Volume 47 Issue 1 Pages 17-28
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Tokyo Editor
Language Wos 000073247300003 Publication Date 2012-04-19
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0022-0744;1477-9986; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 0.9 Times cited 10 Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:25661 Serial 2166
Permanent link to this record
 
 
Author Hervieu, M.; Van Tendeloo, G.; Schuddinck, W.; Richard, O.; Caignaert, V.; Millange, F.; Raveau, B.
Title Structural phase transition in the manganite Nd0.5Ca0.2Sr0.3MnO3-\delta Type A1 Journal article
Year 1997 Publication Journal of electron microscopy Abbreviated Journal (down) Microscopy-Jpn
Volume 46 Issue 4 Pages 263-269
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Tokyo Editor
Language Wos A1997XY94900001 Publication Date 0000-00-00
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0022-0744; 1477-9986 ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 0.9 Times cited 2 Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:21446 Serial 3249
Permanent link to this record
 
 
Author Van Tendeloo, G.; Lebedev, O.I.; Shpanchenko, R.V.; Antipov, E.V.
Title Structure determination of YBCO fluorinated phases by HREM Type A1 Journal article
Year 1997 Publication Journal of electron microscopy Abbreviated Journal (down) Microscopy-Jpn
Volume 1 Issue Pages 23-31
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Tokyo Editor
Language Wos Publication Date 0000-00-00
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0022-0744; 1477-9986 ISBN Additional Links UA library record
Impact Factor 0.9 Times cited Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:21418 Serial 3301
Permanent link to this record
 
 
Author Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A.; Xu, Y.-E.; Wang, S.-E.; Park, I.-Y.; Kang, T.-S.
Title Combined characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques Type A1 Journal article
Year 1998 Publication Microscopy research and technique Abbreviated Journal (down) Microsc Res Techniq
Volume 42 Issue 2 Pages 108-122
Keywords A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication New York, N.Y. Editor
Language Wos 000075521300005 Publication Date 2002-09-10
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1059-910X;1097-0029; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.147 Times cited 4 Open Access
Notes Approved Most recent IF: 1.147; 1998 IF: 0.765
Call Number UA @ lucian @ c:irua:24907 Serial 398
Permanent link to this record
 
 
Author Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G.
Title Evaluation of top, angle, and side cleaned FIB samples for TEM analysis Type A1 Journal article
Year 2007 Publication Microscopy research and technique Abbreviated Journal (down) Microsc Res Techniq
Volume 70 Issue 12 Pages 1060-1071
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract ITEM specimens of a LaAlO3/SrTiO3 multilayer are prepared by FIB with internal lift out. Using a Ga+1 beam of 5 kV, a final cleaning step yielding top, top-angle, side, and bottom-angle cleaning is performed. Different cleaning procedures, which can be easily implemented in a dual beam FIB system, are described and compared; all cleaning types produce thin lamellae, useful for HRTEM and HAADF-STEM work up to atomic resolution. However, the top cleaned lamellae are strongly affected by the curtain effect. Top-angle cleaned specimens show an amorphous layer of around 5 nm at the specimen surfaces, due to damage and redeposition. Furthermore, it is observed that the LaAlO3 layers are preferentially destroyed and transformed into amorphous material, during the thinning process.
Address
Corporate Author Thesis
Publisher Place of Publication New York, N.Y. Editor
Language Wos 000251868200008 Publication Date 2007-08-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1059-910X;1097-0029; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.147 Times cited 36 Open Access
Notes Aip; Fwo Approved Most recent IF: 1.147; 2007 IF: 1.644
Call Number UA @ lucian @ c:irua:67282 Serial 1090
Permanent link to this record
 
 
Author Bertoni, G.; Verbeeck, J.; Brosens, F.
Title Fitting the momentum dependent loss function in EELS Type A1 Journal article
Year 2011 Publication Microscopy research and technique Abbreviated Journal (down) Microsc Res Techniq
Volume 74 Issue 3 Pages 212-218
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Theory of quantum systems and complex systems
Abstract Momentum dependent inelastic plasmon scattering can be measured by electron energy loss in a transmission electron microscope. From energy filtered diffraction, the characteristic angle of scattering and the cutoff angle are measured, using a thin film of aluminum as a model test. Rather than deconvolving the data (as done in previous works), a fitting technique is used to extract the loss function from angular resolved spectra, starting from a simple model simulation.
Address
Corporate Author Thesis
Publisher Place of Publication New York, N.Y. Editor
Language Wos 000288095200002 Publication Date 2010-07-06
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1059-910X; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.147 Times cited 6 Open Access
Notes Fwo; Esteem; Iap; Goa Approved Most recent IF: 1.147; 2011 IF: 1.792
Call Number UA @ lucian @ c:irua:88782UA @ admin @ c:irua:88782 Serial 1222
Permanent link to this record
 
 
Author Schryvers, D.; Goessens, C.; Safran, G.; Toth, L.
Title Internal calibration technique for HREM studies of nanoscale particles Type A1 Journal article
Year 1993 Publication Microscopy research and technique T2 – JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM Abbreviated Journal (down) Microsc Res Techniq
Volume 25 Issue 2 Pages 185-186
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication New York, N.Y. Editor
Language Wos A1993LB60700015 Publication Date 2005-02-23
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1059-910X;1097-0029; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.154 Times cited 1 Open Access
Notes Approved no
Call Number UA @ lucian @ c:irua:104488 Serial 1700
Permanent link to this record
 
 
Author Zelaya, E.; Schryvers, D.
Title Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite Type A1 Journal article
Year 2011 Publication Microscopy research and technique Abbreviated Journal (down) Microsc Res Techniq
Volume 74 Issue 1 Pages 84-91
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract The irradiation effects of thinning a sample of a Cu-Zn-Al shape memory alloy to electron transparency by a Ga+ focused ion beam were investigated. This thinning method was compared with conventional electropolishing and Ar+ ion milling. No implanted Ga was detected but surface FCC precipitation was found as a result of the focused ion beam sample preparation. Decreasing the irradiation dose by lowering the energy and current of the Ga+ ions did not lead to a complete disappearance of the FCC structure. The latter could only be removed after gentle Ar+ ion milling of the sample. It was further concluded that the precipitation of the FCC is independent of the crystallographic orientation of the surface.
Address
Corporate Author Thesis
Publisher Place of Publication New York, N.Y. Editor
Language Wos 000285976000012 Publication Date 2010-05-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1059-910X; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.147 Times cited 2 Open Access
Notes Approved Most recent IF: 1.147; 2011 IF: 1.792
Call Number UA @ lucian @ c:irua:85994 Serial 2852
Permanent link to this record
 
 
Author Van Tendeloo, G.; Krekels, T.; Amelinckx, S.; Babu, T.G.N.; Greaves, C.; Hervieu, M.; Michel, C.; Raveau, B.
Title Structural investigations of recently discovered high Tc superconductors Type A1 Journal article
Year 1995 Publication Microscopy research and technique Abbreviated Journal (down) Microsc Res Techniq
Volume 30 Issue Pages 102-122
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication New York, N.Y. Editor
Language Wos A1995QH52800002 Publication Date 2005-02-23
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1059-910X;1097-0029; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.154 Times cited 4 Open Access
Notes Approved MATERIALS SCIENCE, MULTIDISCIPLINARY 135/271 Q2 # PHYSICS, APPLIED 70/145 Q2 # PHYSICS, CONDENSED MATTER 40/67 Q3 #
Call Number UA @ lucian @ c:irua:13307 Serial 3241
Permanent link to this record
 
 
Author De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.
Title The study of partially ordered 11/20 alloys by HREM Type A1 Journal article
Year 1993 Publication Microscopy research and technique Abbreviated Journal (down) Microsc Res Techniq
Volume 25 Issue Pages 169-170
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication New York, N.Y. Editor
Language Wos A1993LB60700007 Publication Date 2005-02-23
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1059-910X;1097-0029; ISBN Additional Links UA library record; WoS full record
Impact Factor 1.154 Times cited Open Access
Notes Approved PHYSICS, APPLIED 28/145 Q1 #
Call Number UA @ lucian @ c:irua:6785 Serial 3331
Permanent link to this record
 
 
Author Goessens, C.; Schryvers, D.; van Landuyt, J.
Title Transmission electron microscopy studies of (111) twinned silver halide microcrystals Type A1 Journal article
Year 1998 Publication Microscopy research and technique Abbreviated Journal (down) Microsc Res Techniq
Volume 42 Issue Pages 85-99
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication New York, N.Y. Editor
Language Wos 000075521300003 Publication Date 2002-08-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1059-910X;1097-0029; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.147 Times cited 8 Open Access
Notes Approved Most recent IF: 1.147; 1998 IF: 0.765
Call Number UA @ lucian @ c:irua:29676 Serial 3713
Permanent link to this record
 
 
Author Pourbabak, S.; Orekhov, A.; Schryvers, D.
Title Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires Type A1 Journal article
Year 2020 Publication Microscopy Research And Technique Abbreviated Journal (down) Microsc Res Techniq
Volume Issue Pages 1-7
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract A method to prepare TEM specimens from metallic microwires and based on conventional twin-jet electropolishing is introduced. The wire is embedded in an opaque epoxy resin medium and the hardened resin is mechanically polished to reveal the wire on both sides. The resin containing wire is then cut into discs of the appropriate size. The obtained embedded wire is electropolished in a conventional twin-jet electropolishing machine until electron transparency in large areas without radiation damage is achieved.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000567944200001 Publication Date 2020-09-28
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1059-910x ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.5 Times cited Open Access OpenAccess
Notes ; Fonds Wetenschappelijk Onderzoek, Grant/Award Number: G.0366.15N ; Approved Most recent IF: 2.5; 2020 IF: 1.147
Call Number UA @ admin @ c:irua:171969 Serial 6642
Permanent link to this record
 
 
Author Leroux, F.; Bladt, E.; Timmermans, J.-P.; Van Tendeloo, G.; Bals, S.
Title Annular dark-field transmission electron microscopy for low contrast materials Type A1 Journal article
Year 2013 Publication Microscopy and microanalysis Abbreviated Journal (down) Microsc Microanal
Volume 19 Issue 3 Pages 629-634
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Imaging soft matter by transmission electron microscopy (TEM) is anything but straightforward. Recently, interest has grown in developing alternative imaging modes that generate contrast without additional staining. Here, we present a dark-field TEM technique based on the use of an annular objective aperture. Our experiments demonstrate an increase in both contrast and signal-to-noise ratio in comparison to conventional bright-field TEM. The proposed technique is easy to implement and offers an alternative imaging mode to investigate soft matter.
Address
Corporate Author Thesis
Publisher Place of Publication Cambridge, Mass. Editor
Language Wos 000319126300014 Publication Date 2013-04-04
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1431-9276;1435-8115; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.891 Times cited 5 Open Access
Notes 262348 Esmi; Fwo G002410n G018008 Approved Most recent IF: 1.891; 2013 IF: 2.161
Call Number UA @ lucian @ c:irua:108712 Serial 133
Permanent link to this record
 
 
Author Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G.
Title Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy Type A1 Journal article
Year 2009 Publication Microscopy and microanalysis Abbreviated Journal (down) Microsc Microanal
Volume 15 Issue S:2 Pages 464-465
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Cambridge, Mass. Editor
Language Wos 000208119100230 Publication Date 2009-07-27
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1431-9276;1435-8115; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.891 Times cited 1 Open Access
Notes Approved Most recent IF: 1.891; 2009 IF: 3.035
Call Number UA @ lucian @ c:irua:96555UA @ admin @ c:irua:96555 Serial 178
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Author Verlinden, G.; Gijbels, R.; Geuens, I.
Title Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS Type A1 Journal article
Year 2002 Publication Microscopy and microanalysis Abbreviated Journal (down) Microsc Microanal
Volume 8 Issue 3 Pages 216-226
Keywords A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Abstract The technique of imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) and dual beam depth,profiling has been used to study the composition of the surface of tabular silver halide microcrystals. Analysis of individual microcrystals with a size well below 1 mum from a given emulsion is possible. The method is successfully applied for the characterization of silver halide microcrystals with subpercent global iodide concentrations confined in surface layers with a thickness below 5 nm. The developed TOF-SIMS analytical procedure is explicitly demonstrated for the molecular imaging of adsorbed thiocyanate layers (SCN) at crystal surfaces of individual crystals and for the differentiation of iodide conversion layers synthesized with KI and with AgI micrates (nanocrystals with a size between 10 and 50 nm). It can be concluded that TOF-SIMS as a microanalytical, surface-sensitive technique has some unique properties over other analytical techniques for the study of complex structured surface layers of silver halide microcrystals. This offers valuable information to support the synthesis of future photographic emulsions.
Address
Corporate Author Thesis
Publisher Place of Publication Cambridge, Mass. Editor
Language Wos 000179055900007 Publication Date 2002-11-13
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1431-9276; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.891 Times cited 1 Open Access
Notes Approved Most recent IF: 1.891; 2002 IF: 1.733
Call Number UA @ lucian @ c:irua:103876 Serial 349
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Author Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A.
Title Computational aspects in quantitative EELS Type A1 Journal article
Year 2010 Publication Microscopy and microanalysis Abbreviated Journal (down) Microsc Microanal
Volume 16 Issue S:2 Pages 240-241
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Cambridge, Mass. Editor
Language Wos Publication Date 2010-08-26
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1431-9276;1435-8115; ISBN Additional Links UA library record
Impact Factor 1.891 Times cited Open Access
Notes Approved Most recent IF: 1.891; 2010 IF: 3.259
Call Number UA @ lucian @ c:irua:96556UA @ admin @ c:irua:96556 Serial 454
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Author Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Verbeeck, J.
Title EELS investigations of different niobium oxide phases Type A1 Journal article
Year 2006 Publication Microscopy and microanalysis Abbreviated Journal (down) Microsc Microanal
Volume 12 Issue 5 Pages 416-423
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Electron energy loss spectra in conjunction with near-edge fine structures of purely stoichiometric niobium monoxide (NbO) and niobium pentoxide (Nb2O5) reference materials were recorded. The structures of the niobium oxide reference materials were checked by selected area electron diffraction to ensure a proper assignment of the fine structures. NbO and Nb2O5 show clearly different energy loss near-edge fine structures of the Nb-M-4,M-5 and -M-2,M-3 edges and of the O-K edge, reflecting the specific local environments of the ionized atoms. To distinguish the two oxides in a quantitative manner, the intensities under the Nb-M-4,M-5 as well as Nb-M-2,M-3 edges and the O-K edge were measured and their ratios calculated. k-factors were also derived from these measurements.
Address
Corporate Author Thesis
Publisher Place of Publication Cambridge, Mass. Editor
Language Wos 000241181400007 Publication Date 2006-09-19
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1431-9276;1435-8115; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.891 Times cited 50 Open Access
Notes Approved Most recent IF: 1.891; 2006 IF: 2.108
Call Number UA @ lucian @ c:irua:60979UA @ admin @ c:irua:60979 Serial 789
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Author Bach, D.; Schneider, R.; Gerthsen, D.; Verbeeck, J.; Sigle, W.
Title EELS of niobium and stoichiometric niobium-oxide phases: part 1: plasmon and Near-edges fine structure Type A1 Journal article
Year 2009 Publication Microscopy and microanalysis Abbreviated Journal (down) Microsc Microanal
Volume 15 Issue 6 Pages 505-523
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract A comprehensive electron energy-loss spectroscopy study of niobium (Nb) and stable Nb-oxide phases (NbO, NbO2, Nb2O5) was carried out. In this work (Part I), the plasmons and energy-loss near-edge structures (ELNES) of all relevant Nb edges (Nb-N2,3, Nb-M4,5, Nb-M2,3, Nb-M1, and Nb-L2,3) up to energy losses of about 2600 eV and the O-K edge are analyzed with respect to achieving characteristic fingerprints of Nb in different formal oxidation states (0 for metallic Nb, +2 for NbO, +4 for NbO2, and +5 for Nb2O5). Chemical shifts of the Nb-N2,3, Nb-M4,5, Nb-M2,3, and Nb-L2,3 edges are extracted from the spectra that amount to about 4 eV as the oxidation state increases from 0 for Nb to +5 for Nb2O5. Four different microscopes, including a 200 keV ZEISS Libra with monochromator, were used. The corresponding wide range of experimental parameters with respect to the primary electron energy, convergence, and collection semi-angles as well as energy resolution allows an assessment of the influence of the experimental setup on the ELNES of the different edges. Finally, the intensity of the Nb-L2,3 white-line edges is correlated with niobium 4d-state occupancy in the different reference materials.
Address
Corporate Author Thesis
Publisher Place of Publication Cambridge, Mass. Editor
Language Wos 000272433200005 Publication Date 2009-10-27
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1431-9276;1435-8115; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.891 Times cited 55 Open Access
Notes Approved Most recent IF: 1.891; 2009 IF: 3.035
Call Number UA @ lucian @ c:irua:80320UA @ admin @ c:irua:80320 Serial 790
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