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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Bladt, E.; Pelt, D.M.; Bals, S.; Batenburg, K.J. |
Electron tomography based on highly limited data using a neural network reconstruction technique |
2015 |
Ultramicroscopy |
158 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Aarle, W.; Palenstijn, W.J.; De Beenhouwer, J.; Altantzis, T.; Bals, S.; Batenburg, K.J.; Sijbers, J. |
The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography |
2015 |
Ultramicroscopy |
157 |
562 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Lobato, I.; Van Dyck, D. |
MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA |
2015 |
Ultramicroscopy |
156 |
32 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Krause, F.F.; Ahl, J.P.; Tytko, D.; Choi, P.P.; Egoavil, R.; Schowalter, M.; Mehrtens, T.; Müller-Caspary, K.; Verbeeck, J.; Raabe, D.; Hertkorn, J.; Engl, K.; Rosenauer, A. |
Homogeneity and composition of AlInGaN : a multiprobe nanostructure study |
2015 |
Ultramicroscopy |
156 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. |
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting |
2015 |
Ultramicroscopy |
151 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
|
de Backer, A.; De wael, A.; Gonnissen, J.; Van Aert, S. |
Optimal experimental design for nano-particle atom-counting from high-resolution STEM images |
2015 |
Ultramicroscopy |
151 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Guzzinati, G.; Clark, L.; Béché, A.; Juchtmans, R.; Van Boxem, R.; Mazilu, M.; Verbeeck, J. |
Prospects for versatile phase manipulation in the TEM : beyond aberration correction |
2015 |
Ultramicroscopy |
151 |
19 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Eyndhoven, G.; Kurttepeli, M.; van Oers, C.J.; Cool, P.; Bals, S.; Batenburg, K.J.; Sijbers, J. |
Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials |
2015 |
Ultramicroscopy |
148 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
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Chen, D.; Goris, B.; Bleichrodt, F.; Heidari Mezerji, H.; Bals, S.; Batenburg, K.J.; de With, G.; Friedrich, H. |
The properties of SIRT, TVM, and DART for 3D imaging of tubular domains in nanocomposite thin-films and sections |
2014 |
Ultramicroscopy |
147 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Javon, E.; Lubk; Cours, R.; Reboh, S.; Cherkashin, N.; Houdellier, F.; Gatel, C.; Hytch, M.J. |
Dynamical effects in strain measurements by dark-field electron holography |
2014 |
Ultramicroscopy |
147 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Egoavil, R.; Gauquelin, N.; Martinez, G.T.; Van Aert, S.; Van Tendeloo, G.; Verbeeck, J. |
Atomic resolution mapping of phonon excitations in STEM-EELS experiments |
2014 |
Ultramicroscopy |
147 |
22 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. |
A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM |
2014 |
Ultramicroscopy |
141 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. |
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy |
2014 |
Ultramicroscopy |
137 |
74 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Niermann, T.; Verbeeck, J.; Lehmann, M. |
Creating arrays of electron vortices |
2014 |
Ultramicroscopy |
136 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Lubk, A.; Javon, E.; Cherkashin, N.; Reboh, S.; Gatel, C.; Hytch, M. |
Dynamic scattering theory for dark-field electron holography of 3D strain fields |
2014 |
Ultramicroscopy |
136 |
18 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Schattschneider, P.; Löffler, S.; Stöger-Pollach, M.; Verbeeck, J. |
Is magnetic chiral dichroism feasible with electron vortices? |
2014 |
Ultramicroscopy |
136 |
64 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Dunin-Borkowski, R.E.; Lichte, H.; Tillmann, K.; Van Aert, S.; Van Tendeloo, G. |
Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays |
2013 |
Ultramicroscopy |
134 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Heidari, H.; van den Broek, W.; Bals, S. |
Quantitative electron tomography : the effect of the three-dimensional point spread function |
2013 |
Ultramicroscopy |
135 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
den Dekker, A.J.; Gonnissen, J.; de Backer, A.; Sijbers, J.; Van Aert, S. |
Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits? |
2013 |
Ultramicroscopy |
134 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. |
An alternative approach to determine attainable resolution directly from HREM images |
2013 |
Ultramicroscopy |
133 |
|
UA library record; WoS full record |
|
|
|
de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. |
Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations |
2013 |
Ultramicroscopy |
134 |
48 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. |
Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography |
2013 |
Ultramicroscopy |
131 |
73 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Lichtert, S.; Verbeeck, J. |
Statistical consequences of applying a PCA noise filter on EELS spectrum images |
2013 |
Ultramicroscopy |
125 |
54 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Goris, B.; Roelandts, T.; Batenburg, K.J.; Heidari Mezerji, H.; Bals, S. |
Advanced reconstruction algorithms for electron tomography : from comparison to combination |
2013 |
Ultramicroscopy |
127 |
63 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Béché, A.; van den Broek, W. |
A holographic method to measure the source size broadening in STEM |
2012 |
Ultramicroscopy |
120 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
Direct structure inversion from exit waves : part 2 : a practical example |
2012 |
Ultramicroscopy |
116 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Tan, H.; Verbeeck, J.; Abakumov, A.; Van Tendeloo, G. |
Oxidation state and chemical shift investigation in transition metal oxides by EELS |
2012 |
Ultramicroscopy |
116 |
413 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. |
Correction of non-linear thickness effects in HAADF STEM electron tomography |
2012 |
Ultramicroscopy |
116 |
67 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Schattschneider, P.; Stöger-Pollach, M.; Löffler, S.; Steiger-Thirsfeld, A.; Hell, J.; Verbeeck, J. |
Sub-nanometer free electrons with topological charge |
2012 |
Ultramicroscopy |
115 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Lobato, I.; van Dyck, D. |
Improved multislice calculations for including higher-order Laue zones effects |
2012 |
Ultramicroscopy |
119 |
6 |
UA library record; WoS full record; WoS citing articles |
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