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  Author Title Year Publication Volume Times cited Additional Links Links (down)
Van Aert, S.; van Dyck, D.; den Dekker, A.J. Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative 2006 Optics express 14 45 UA library record; WoS full record; WoS citing articles url doi
Pourbabak, S.; Wang, X.; Van Dyck, D.; Verlinden, B.; Schryvers, D. Ni cluster formation in low temperature annealed Ni50.6Ti49.4 2017 Functional materials letters 10 4 UA library record; WoS full record; WoS citing articles pdf url doi
Lobato Hoyos, I.P.; van Dyck, D. An accurate parameterization for scattering factors, electron densities and electrostatic potentials for neutral atoms that obey all physical constraints 2014 Acta crystallographica: section A: foundations of crystallography 70 19 UA library record; WoS full record; WoS citing articles url doi
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. Advanced electron crystallography through model-based imaging 2016 IUCrJ 3 30 UA library record; WoS full record; WoS citing articles pdf url doi
van Dyck, D.; Croitoru, M.D. Statistical method for thickness measurement of amorphous objects 2007 Applied physics letters 90 4 UA library record; WoS full record; WoS citing articles pdf url doi
Tsai, C.-Y.; Chang, Y.-C.; Lobato, I.; Van Dyck, D.; Chen, F.-R. Hollow Cone Electron Imaging for Single Particle 3D Reconstruction of Proteins 2016 Scientific reports 6 UA library record; WoS full record; WoS citing articles url doi
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy 2009 Microscopy and microanalysis 15 1 UA library record; WoS full record; WoS citing articles url doi
Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution 2022 Ultramicroscopy 233 UA library record; WoS full record; WoS citing articles url doi
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? 2017 Ultramicroscopy 181 3 UA library record; WoS full record; WoS citing articles pdf url doi
Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM 2014 Ultramicroscopy 141 6 UA library record; WoS full record; WoS citing articles pdf url doi
Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. An alternative approach to determine attainable resolution directly from HREM images 2013 Ultramicroscopy 133 UA library record; WoS full record pdf url doi
de Backer, A.; Van Aert, S.; van Dyck, D. High precision measurements of atom column positions using model-based exit wave reconstruction 2011 Ultramicroscopy 111 8 UA library record; WoS full record; WoS citing articles pdf url doi
Sentosun, K.; Lobato, I.; Bladt, E.; Zhang, Y.; Palenstijn, W.J.; Batenburg, K.J.; Van Dyck, D.; Bals, S. Artifact Reduction Based on Sinogram Interpolation for the 3D Reconstruction of Nanoparticles Using Electron Tomography 2017 Particle and particle systems characterization 34 2 UA library record; WoS full record; WoS citing articles pdf url doi
Van Tendeloo, G.; Bals, S.; Van Aert, S.; Verbeeck, J.; van Dyck, D. Advanced electron microscopy for advanced materials 2012 Advanced materials 24 107 UA library record; WoS full record; WoS citing articles pdf url doi
Lobato, I.; Van Dyck, D. MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA 2015 Ultramicroscopy 156 32 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. Correction of non-linear thickness effects in HAADF STEM electron tomography 2012 Ultramicroscopy 116 67 UA library record; WoS full record; WoS citing articles pdf doi
Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D. Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction 2005 Microscopy and microanalysis 11 UA library record pdf
van Dyck, D.; Van Aert, S.; Croitoru, M. Atomic resolution electron tomography: a dream? 2006 International journal of materials research 97 6 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. High-resolution electron microscopy : from imaging toward measuring 2002 IEEE transactions on instrumentation and measurement 51 13 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. High resolution electron microscopy from imaging towards measuring 2001 ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 UA library record doi
Van Aert, S.; van Dyck, D. Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? 2001 Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties 81 11 UA library record; WoS full record; WoS citing articles pdf doi
Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M. Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays 1999 Applied physics letters 75 481 UA library record; WoS full record; WoS citing articles pdf doi
Zhang, X.B.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D.; Briers, J.; Bao, Y.; Geise, H.J. An electron microscopic study of highly oriented undoped and FeCl3-doped poly (p-phenylenevinylene) 1996 Macromolecules 29 10 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Van Aert, S.; van Dyck, D. Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency 2012 Microscopy and microanalysis 18 15 UA library record; WoS full record; WoS citing articles doi
van Dyck, D.; Van Aert, S.; den Dekker, A.J. Physical limits on atomic resolution 2004 Microscopy and microanalysis 10 14 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. Statistical experimental design for quantitative atomic resolution transmission electron microscopy 2004 13 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. High-resolution electron microscopy and electron tomography: resolution versus precision 2002 Journal of structural biology 138 33 UA library record; WoS full record; WoS citing articles doi
Ferroni, M.; Carotta, M.C.; Guidi, V.; Martinelli, G.; Ronconi, F.; Richard, O.; van Dyck, D.; van Landuyt, J. Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application 2000 Sensors and actuators : B : chemical 68 51 UA library record; WoS full record; WoS citing articles doi
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? 2003 Ultramicroscopy 98 26 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. Optimal experimental design of STEM measurement of atom column positions 2002 Ultramicroscopy 90 35 UA library record; WoS full record; WoS citing articles doi
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