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  Author Title Year Publication Volume Times cited Additional Links Links (up)
Bruynseels, F.J.; Van Grieken, R.E. Laser microprobe mass spectrometric identification of sulfur species in single micrometer-size particles 1984 Analytical chemistry 56 UA library record; WoS full record; WoS citing articles doi
Denoyer, E.; Van Grieken, R.; Adams, F.; Ntausch, D.F.S. Laser microprobe mass spectrometry : 1 : basic principles and performance characteristics 1982 Analytical chemistry 54 UA library record doi
Markowicz, A.A.; Van Grieken, R.E. X-ray spectrometry 1990 Analytical chemistry 62 UA library record doi
Wouters, L.C.; Van Grieken, R.E.; Linton, R.W.; Bauer, C.F. Discrimination between coprecipitated and adsorbed lead on individual calcite particles using laser microprobe mass analysis 1988 Analytical chemistry 60 UA library record; WoS full record; WoS citing articles doi
Markowicz, A.A.; Van Grieken, R.E. X-ray spectrometry 1988 Analytical chemistry 60 UA library record doi
Van Dyck, P.M.; Török, S.B.; Van Grieken, R.E. Enhancement effect in X-ray fluorescence analysis of environmental samples of medium thickness 1986 Analytical chemistry 58 UA library record; WoS full record; WoS citing articles doi
de Gendt, S.; Van Grieken, R.E.; Ohorodnik, S.K.; Harrison, W.W. Parameter evaluation for the analysis of oxide-based samples with radio ferquency glow discharge mass spectrometry 1995 Analytical chemistry 67 UA library record; WoS full record; WoS citing articles doi
Vertes, A.; Irinyi, G.; Gijbels, R. Hydrodynamic model of matrix-assisted laser desorption mass spectrometry 1993 Analytical chemistry 65 100 UA library record; WoS full record; WoS citing articles doi
van Straaten, M.; Gijbels, R.; Vertes, A. Influence of axial and radial diffusion processes on the analytical performance of a glow discharge cell 1992 Analytical chemistry 64 43 UA library record; WoS full record; WoS citing articles doi
Szalóki, I.; Török, S.B.; Ro, C.-U.; Injuk, J.; Van Grieken, R.E. X-ray spectrometry 2000 Analytical chemistry 72 UA library record; WoS full record; WoS citing articles doi
Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. Novel thin film lift-off process for in situ TEM tensile characterization 2021 Microscopy And Microanalysis 27 UA library record doi
Gjorgievska, E.; Van Tendeloo, G.; Nicholson, J.W.; Coleman, N.J.; Slipper, I.J.; Booth, S. The incorporation of nanoparticles into conventional glass-ionomer dental restorative cements 2015 Microscopy and microanalysis 21 15 UA library record; WoS full record; WoS citing articles pdf doi
Grieten, E.; Caen, J.; Schryvers, D. Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM 2014 Microscopy and microanalysis 20 UA library record; WoS full record; WoS citing articles pdf doi
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM 2014 Microscopy and microanalysis 20 UA library record doi
Lu, J.; Roeffaers, M.B.J.; Bartholomeeusen, E.; Sels, B.F.; Schryvers, D. Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy 2014 Microscopy and microanalysis 20 7 UA library record; WoS full record; WoS citing articles doi
Leroux, F.; Bladt, E.; Timmermans, J.-P.; Van Tendeloo, G.; Bals, S. Annular dark-field transmission electron microscopy for low contrast materials 2013 Microscopy and microanalysis 19 5 UA library record; WoS full record; WoS citing articles doi
van den Broek, W.; Van Aert, S.; van Dyck, D. Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency 2012 Microscopy and microanalysis 18 15 UA library record; WoS full record; WoS citing articles doi
Idrissi, H.; Turner, S.; Mitsuhara, M.; Wang, B.; Hata, S.; Coulombier, M.; Raskin, J.-P.; Pardoen, T.; Van Tendeloo, G.; Schryvers, D. Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study 2011 Microscopy and microanalysis 17 25 UA library record; WoS full record; WoS citing articles doi
van der Linden, V.; Meesdom, E.; Devos, A.; van Dooren, R.; Nieuwdorp, H.; Janssen, E.; Balace, S.; Vekemans, B.; Vincze, L.; Janssens, K. PXRF, \mu-XRF, vacuum \mu-XRF, and EPMA analysis of Email Champlevé objects present in Belgian museums 2011 Microscopy and microanalysis 17 9 UA library record; WoS full record; WoS citing articles doi
Ke, X.; Bals, S.; Cott, D.; Hantschel, T.; Bender, H.; Van Tendeloo, G. Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts 2010 Microscopy and microanalysis 16 42 UA library record; WoS full record; WoS citing articles doi
Bach, D.; Schneider, R.; Gerthsen, D.; Verbeeck, J.; Sigle, W. EELS of niobium and stoichiometric niobium-oxide phases: part 1: plasmon and Near-edges fine structure 2009 Microscopy and microanalysis 15 55 UA library record; WoS full record; WoS citing articles doi
Denecke, M.A.; Somogyi, A.; Janssens, K.; Simon, R.; Dardenne, K.; Noseck, U. Microanalysis (micro-XRF, micro-XANES, and micro-XRD) of a tertiary sediment using microfocused synchrotron radiation 2007 Microscopy and microanalysis 13 31 UA library record; WoS full record; WoS citing articles doi
Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. High-quality sample preparation by low kV FIB thinning for analytical TEM measurements 2007 Microscopy and microanalysis 13 82 UA library record; WoS full record; WoS citing articles doi
Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Verbeeck, J. EELS investigations of different niobium oxide phases 2006 Microscopy and microanalysis 12 50 UA library record; WoS full record; WoS citing articles doi
Jinschek, J.R.; Bals, S.; Gopal, V.; Xus, X.; Kisielowski, C. Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs 2004 Microscopy and microanalysis 10 UA library record doi
Bals, S.; Radmilovic, V.; Kisielowski, C. TEM annular objective apertures fabricated by FIB 2004 Microscopy and microanalysis 10 UA library record doi
van Dyck, D.; Van Aert, S.; den Dekker, A.J. Physical limits on atomic resolution 2004 Microscopy and microanalysis 10 14 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Gijbels, R.; Geuens, I. Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS 2002 Microscopy and microanalysis 8 1 UA library record; WoS full record; WoS citing articles doi
Janssens de Bisthoven, L.; Rochette, A.-J.; Verheyen, E.; Akpona, T.J.-D.; Verbist, B.; Vanderhaegen, K.; Naturinda, Z.; Van Passel, S.; Berihun, D.; Munishi, L.; Hugé, J. Conserving African biosphere reserves : a workshop on the valuation of ecosystem services in Man and the Biosphere Reserves 2019 Oryx 53 UA library record pdf doi
Hendriks, E.; Geldof, M.; van den Berg, K.J.; Monico, L.; Miliani, C.; Moretti, P.; Iwanicka, M.; Targowski, P.; Megens, L.; de Groot, S.; van Keulen, H.; Janssens, K.; Vanmeert, F.; van der Snickt, G. Conservation of the Amsterdam sunflowers : from past to future 2019 UA library record doi
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