Nano Home

NANOlab Center of Excellence literature database

Home |  Show All |  Simple Search |  Advanced Search
Quick Search:
1–28 of 28 records found matching your query (RSS):
toggle visibility
Search within Results:
Display Options:
Select All    Deselect All << 1 >>
List View
 | 
Citations
 | 
Details
   print
  Author Title Year (down) Publication Volume Times cited Additional Links Links
Villarreal, R.; Lin, P.-C.; Faraji, F.; Hassani, N.; Bana, H.; Zarkua, Z.; Nair, M.N.; Tsai, H.-C.; Auge, M.; Junge, F.; Hofsaess, H.C.; De Gendt, S.; De Feyter, S.; Brems, S.; Ahlgren, E.H.; Neyts, E.C.; Covaci, L.; Peeters, F.M.; Neek-Amal, M.; Pereira, L.M.C. Breakdown of universal scaling for nanometer-sized bubbles in graphene 2021 Nano Letters 21 12 UA library record; WoS full record; WoS citing articles url doi
Marinov, D.; de Marneffe, J.-F.; Smets, Q.; Arutchelvan, G.; Bal, K.M.; Voronina, E.; Rakhimova, T.; Mankelevich, Y.; El Kazzi, S.; Nalin Mehta, A.; Wyndaele, P.-J.; Heyne, M.H.; Zhang, J.; With, P.C.; Banerjee, S.; Neyts, E.C.; Asselberghs, I.; Lin, D.; De Gendt, S. Reactive plasma cleaning and restoration of transition metal dichalcogenide monolayers 2021 npj 2D Materials and Applications 5 UA library record; WoS full record; WoS citing articles url doi
Heyne, M.H.; Marinov, D.; Braithwaite, N.; Goodyear, A.; de Marneffe, J.-F.; Cooke, M.; Radu, I.; Neyts, E.C.; De Gendt, S. A route towards the fabrication of 2D heterostructures using atomic layer etching combined with selective conversion 2019 2D materials 6 UA library record; WoS full record; WoS citing articles pdf doi
Heyne, M.H.; de Marneffe, J.-F.; Radu, I.; Neyts, E.C.; De Gendt, S. Thermal recrystallization of short-range ordered WS2 films 2018 Journal of vacuum science and technology: A: vacuum surfaces and films 36 2 UA library record; WoS full record; WoS citing articles pdf doi
Heyne, M.H.; de Marneffe, J.-F.; Nuytten, T.; Meersschaut, J.; Conard, T.; Caymax, M.; Radu, I.; Delabie, A.; Neyts, E.C.; De Gendt, S. The conversion mechanism of amorphous silicon to stoichiometric WS2 2018 Journal of materials chemistry C : materials for optical and electronic devices 6 4 UA library record; WoS full record; WoS citing articles pdf url doi
Heyne, M.H.; de Marneffe, J.-F.; Delabie, A.; Caymax, M.; Neyts, E.C.; Radu, I.; Huyghebaert, C.; De Gendt, S. Two-dimensional WS2 nanoribbon deposition by conversion of pre-patterned amorphous silicon 2017 Nanotechnology 28 13 UA library record; WoS full record; WoS citing articles pdf url doi
Heyne, M.H.; Chiappe, D.; Meersschaut, J.; Nuytten, T.; Conard, T.; Bender, H.; Huyghebaert, C.; Radu, I.P.; Caymax, M.; de Marneffe, J.F.; Neyts, E.C.; De Gendt, S.; Multilayer MoS2 growth by metal and metal oxide sulfurization 2016 Journal of materials chemistry C : materials for optical and electronic devices 4 UA library record; WoS full record; WoS citing articles doi
Xu, X.; Vereecke, G.; Chen, C.; Pourtois, G.; Armini, S.; Verellen, N.; Tsai, W.K.; Kim, D.W.; Lee, E.; Lin, C.Y.; Van Dorpe, P.; Struyf, H.; Holsteyns, F.; Moshchalkov, V.; Indekeu, J.; De Gendt, S.; Capturing wetting states in nanopatterned silicon 2014 ACS nano 8 39 UA library record; WoS full record; WoS citing articles doi
Clima, S.; Kaczer, B.; Govoreanu, B.; Popovici, M.; Swerts, J.; Verhulst, A.S.; Jurczak, M.; De Gendt, S.; Pourtois, G. Determination of ultimate leakage through rutile TiO2 and tetragonal ZrO2 from ab initio complex band calculations 2013 IEEE electron device letters 34 3 UA library record; WoS full record; WoS citing articles doi
Clima, S.; Chen, Y.Y.; Degraeve, R.; Mees, M.; Sankaran, K.; Govoreanu, B.; Jurczak, M.; De Gendt, S.; Pourtois, G. First-principles simulation of oxygen diffusion in HfOx : role in the resistive switching mechanism 2012 Applied physics letters 100 63 UA library record; WoS full record; WoS citing articles doi
Hardy, A.; Van Elshocht, S.; De Dobbelaere, C.; Hadermann, J.; Pourtois, G.; De Gendt, S.; Afanas'ev, V.V.; Van Bael, M.K. Properties and thermal stability of solution processed ultrathin, high-k bismuth titanate (Bi2Ti2O7) films 2012 Materials research bulletin 47 UA library record; WoS full record; WoS citing articles pdf doi
Nourbakhsh, A.; Cantoro, M.; Klekachev, A.V.; Pourtois, G.; Vosch, T.; Hofkens, J.; van der Veen, M.H.; Heyns, M.M.; de Gendt, S.; Sels, B.F. Single layer vs bilayer graphene : a comparative study of the effects of oxygen plasma treatment on their electronic and optical properties 2011 The journal of physical chemistry: C : nanomaterials and interfaces 115 46 UA library record; WoS full record; WoS citing articles doi
Cantoro, M.; Klekachev, A.V.; Nourbakhsh, A.; Sorée, B.; Heyns, M.M.; de Gendt, S. Long-wavelength, confined optical phonons in InAs nanowires probed by Raman spectroscopy 2011 European physical journal : B : condensed matter and complex systems 79 10 UA library record; WoS full record; WoS citing articles doi
Nourbakhsh, A.; Cantoro, M.; Klekachev, A.; Clemente, F.; Sorée, B.; van der Veen, M.H.; Vosch, T.; Stesmans, A.; Sels, B.; de Gendt, S. Tuning the Fermi level of SiO2-supported single-layer graphene by thermal annealing 2010 Journal Of Physical Chemistry C 114 54 UA library record; WoS full record; WoS citing articles doi
Sorée, B.; Magnus, W.; Szepieniec, M.; Vandenbreghe, W.; Verhulst, A.; Pourtois, G.; Groeseneken, G.; de Gendt, S.; Heyns, M. Novel device concepts for nanotechnology : the nanowire pinch-off FET and graphene tunnelFET 2010 ECS transactions 28 UA library record; WoS full record; WoS citing articles
Lujan, G.S.; Magnus, W.; Soree, B.; Pourghaderi, M.A.; Veloso, A.; van Dal, M.J.H.; Lauwers, A.; Kubicek, S.; De Gendt, S.; Heyns, M.; De Meyer, K.; A new method to calculate leakage current and its applications for sub-45nm MOSFETs 2005 Solid-State Device Research (ESSDERC), European Conference T2 – ESSDERC 2005 : proceedings of 35th European Solid-State Device Research Conference, September 12-16, 2005, Grenoble, France UA library record; WoS full record doi
Pourtois, G.; Lauwers, A.; Kittl, J.; Pantisano, L.; Sorée, B.; De Gendt, S.; Magnus, W.; Heyns, A.; Maex, K. First-principle calculations on gate/dielectric interfaces : on the origin of work function shifts 2005 Microelectronic engineering 80 31 UA library record; WoS full record; WoS citing articles pdf doi
Lujan, G.S.; Magnus, W.; Sorée, B.; Ragnarsson, L.A.; Trojman, L.; Kubicek, S.; De Gendt, S.; Heyns, A.; De Meyer, K. Barrier permeation effects on the inversion layer subband structure and its applications to the electron mobility 2005 Microelectronic engineering 80 1 UA library record; WoS full record; WoS citing articles pdf doi
de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on wafer surfaces 2000 Journal of the electrochemical society 147 14 UA library record; WoS full record; WoS citing articles doi
Kuczumow, A.; Claes, M.; Schmeling, M.; Van Grieken, R.; de Gendt, S. Quantification problems in light element determination by grazing emission X-ray fluorescence 2000 Journal of analytical atomic spectrometry 15 UA library record; WoS full record; WoS citing articles doi
de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution 1999 UA library record; WoS full record;
Schelles, W.; de Gendt, S.; Van Grieken, R.E. Optimization of secondary cathode thickness for direct current glow discharge mass spectrometric analysis of glass 1996 Journal of analytical atomic spectrometry 11 UA library record; WoS full record; WoS citing articles doi
Schelles, W.; de Gendt, S.; Maes, K.; Van Grieken, R. The use of a secondary cathode to analyse solid non-conducting samples with direct current glow discharge mass spectrometry: potential and restrictions 1996 Fresenius' journal of analytical chemistry 355 UA library record; WoS full record; WoS citing articles doi
de Gendt, S.; Kenis, K.; Mertens, P.W.; Heyns, M.M.; Claes, M.; Van Grieken, R.E.; Bailleul, A.; Knotter, M.; de Bokx, P.K. Use of grazing emission XRF spectrometry for silicon wafer surface contamination measurements 1996 UA library record
Schelles, W.; de Gendt, S.; Müller, V.; Van Grieken, R. Evaluation of secondary cathodes for glow discharge mass spectrometry analysis of different nonconducting sample types 1995 Applied spectroscopy 49 UA library record; WoS full record; WoS citing articles doi
de Gendt, S.; Van Grieken, R.E.; Ohorodnik, S.K.; Harrison, W.W. Parameter evaluation for the analysis of oxide-based samples with radio ferquency glow discharge mass spectrometry 1995 Analytical chemistry 67 UA library record; WoS full record; WoS citing articles doi
de Gendt, S.; Van Grieken, R.; Hang, W.; Harrison, W.W. Comparison between direct current and radiofrequency glow discharge mass spectrometry for the analysis of oxide-based samples 1995 Journal of analytical atomic spectrometry 10 UA library record; WoS full record; WoS citing articles doi
de Gendt, S.; Schelles, W.; Van Grieken, R.; Müller, V. Quantitative analysis of iron-rich and other oxide-based samples by means of glow discharge mass spectrometry 1995 Journal of analytical atomic spectrometry 10 UA library record; WoS full record; WoS citing articles doi
Select All    Deselect All << 1 >>
List View
 | 
Citations
 | 
Details
   print
toggle visibility
Save Citations:
Export Records:
Home CQL Search  |  Library Search  |  Show Record  |  Extract Citations Help