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  Author Title Year (down) Publication Volume Times cited Additional Links Links
de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on wafer surfaces 2000 Journal of the electrochemical society 147 14 UA library record; WoS full record; WoS citing articles doi
de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution 1999 UA library record; WoS full record;
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