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  Author Title Year Publication Volume Times cited Additional Links Links
Li, K.; Béché, A.; Song, M.; Sha, G.; Lu, X.; Zhang, K.; Du, Y.; Ringer, S.P.; Schryvers, D. Atomistic structure of Cu-containing \beta" precipitates in an Al-Mg-Si-Cu alloy 2014 Scripta materialia 75 22 UA library record; WoS full record; WoS citing articles doi
van Huis, M.A.; Figuerola, A.; Fang, C.; Béché, A.; Zandbergen, H.W.; Manna, L. Letter Chemical transformation of Au-tipped CdS nanorods into AuS/Cd core/shell particles by electron beam irradiation 2011 Nano letters 11 25 UA library record; WoS full record; WoS citing articles doi
Béché, A.; Van Boxem, R.; Van Tendeloo, G.; Verbeeck, J. Magnetic monopole field exposed by electrons 2014 Nature physics 10 131 UA library record; WoS full record; WoS citing articles url doi
Verbeeck, J.; Guzzinati, G.; Clark, L.; Juchtmans, R.; Van Boxem, R.; Tian, H.; Béché, A.; Lubk, A.; Van Tendeloo, G. Shaping electron beams for the generation of innovative measurements in the (S)TEM 2014 Comptes rendus : physique 15 22 UA library record; WoS full record; WoS citing articles pdf url doi
Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography 2013 Ultramicroscopy 131 73 UA library record; WoS full record; WoS citing articles doi
Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L. Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope 2016 Micron 80 50 UA library record; WoS full record; WoS citing articles url doi
Béché, A.; Rouvière, J.L.; Barnes, J.P.; Cooper, D. Dark field electron holography for strain measurement 2011 Ultramicroscopy 111 31 UA library record; WoS full record; WoS citing articles doi
Jalabert, D.; Pelloux-Gervais, D.; Béché, A.; Hartmann, J.M.; Gergaud, P.; Rouvière, J.L.; Canut, B. Depth strain profile with sub-nm resolution in a thin silicon film using medium energy ion scattering 2012 Physica Status Solidi A-Applications And Materials Science 209 3 UA library record; WoS full record; WoS citing articles doi
Cooper, D.; de la Peña, F.; Béché, A.; Rouvière, J.-L.; Servanton, G.; Pantel, R.; Morin, P. Field mapping with nanometer-scale resolution for the next generation of electronic devices 2011 Nano letters 11 12 UA library record; WoS full record; WoS citing articles doi
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM 2014 Microscopy and microanalysis 20 UA library record doi
de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits? 2015 Journal of physics : conference series 644 UA library record url doi
Denneulin, T.; Rouvière, J.L.; Béché, A.; Py, M.; Barnes, J.P.; Rochat, N.; Hartmann, J.M.; Cooper, D. The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography 2011 Semiconductor science and technology 26 UA library record; WoS full record; WoS citing articles pdf doi
Bhat, S.G.; Gauquelin, N.; Sebastian, N.K.; Sil, A.; Béché, A.; Verbeeck, J.; Samal, D.; Kumar, P.S.A. Orthorhombic vs. hexagonal epitaxial SrIrO3 thin films : structural stability and related electrical transport properties 2018 Europhysics letters 122 4 UA library record; WoS full record; WoS citing articles pdf doi
Becker, M.; Guzzinati, G.; Béché, A.; Verbeeck, J.; Batelaan, H. Asymmetry and non-dispersivity in the Aharonov-Bohm effect 2019 Nature communications 10 12 UA library record; WoS full record; WoS citing articles url doi
Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose 2019 Ultramicroscopy 203 25 UA library record; WoS full record; WoS citing articles pdf url doi
Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer 2019 UA library record doi
Guzzinati, G.; Béché, A.; McGrouther, D.; Verbeeck, J. Rotation of electron beams in the presence of localised, longitudinal magnetic fields 2019 UA library record doi
Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. Spectrocopic coincidence experiment in transmission electron microscopy 2019 UA library record doi
Idrissi, H.; Béché, A.; Gauquelin, N.; Ul-Haq, I.; Bollinger, C.; Demouchy, S.; Verbeeck, J.; Pardoen, T.; Schryvers, D.; Cordier, P. On the formation mechanisms of intragranular shear bands in olivine by stress-induced amorphization 2022 Acta materialia 239 5 UA library record; WoS full record; WoS citing articles url doi
Mueller, K.; Krause, F.F.; Béché, A.; Schowalter, M.; Galioit, V.; Loeffler, S.; Verbeeck, J.; Zweck, J.; Schattschneider, P.; Rosenauer, A. Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction 2014 Nature communications 5 197 UA library record; WoS full record; WoS citing articles pdf url doi
de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting 2015 Ultramicroscopy 151 29 UA library record; WoS full record; WoS citing articles pdf url doi
Clark, L.; Béché, A.; Guzzinati, G.; Lubk, A.; Mazilu, M.; Van Boxem, R.; Verbeeck, J. Exploiting lens aberrations to create electron-vortex beams 2013 Physical review letters 111 66 UA library record; WoS full record; WoS citing articles url doi
Béché, A.; Winkler, R.; Plank, H.; Hofer, F.; Verbeeck, J. Focused electron beam induced deposition as a tool to create electron vortices 2015 Micron 80 21 UA library record; WoS full record; WoS citing articles pdf url doi
Verbeeck, J.; Béché, A.; van den Broek, W. A holographic method to measure the source size broadening in STEM 2012 Ultramicroscopy 120 29 UA library record; WoS full record; WoS citing articles pdf doi
Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures 2013 Physical review : B : condensed matter and materials physics 88 15 UA library record; WoS full record; WoS citing articles url doi
Guzzinati, G.; Clark, L.; Béché, A.; Verbeeck, J. Measuring the orbital angular momentum of electron beams 2014 Physical review : A : atomic, molecular and optical physics 89 42 UA library record; WoS full record; WoS citing articles url doi
Verbeeck, J.; Tian, H.; Béché, A. A new way of producing electron vortex probes for STEM 2012 Ultramicroscopy 113 62 UA library record; WoS full record; WoS citing articles pdf doi
Egoavil, R.; Huehn, S.; Jungbauer, M.; Gauquelin, N.; Béché, A.; Van Tendeloo, G.; Verbeeck; Moshnyaga, V. Phase problem in the B-site ordering of La2CoMnO6 : impact on structure and magnetism 2015 Nanoscale 7 37 UA library record; WoS full record; WoS citing articles pdf url doi
Guzzinati, G.; Clark, L.; Béché, A.; Juchtmans, R.; Van Boxem, R.; Mazilu, M.; Verbeeck, J. Prospects for versatile phase manipulation in the TEM : beyond aberration correction 2015 Ultramicroscopy 151 19 UA library record; WoS full record; WoS citing articles pdf url doi
Clark, L.; Béché, A.; Guzzinati, G.; Verbeeck, J. Quantitative measurement of orbital angular momentum in electron microscopy 2014 Physical review : A : atomic, molecular and optical physics 89 23 UA library record; WoS full record; WoS citing articles url doi
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