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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. |
Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer |
2019 |
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UA library record |
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Guzzinati, G.; Béché, A.; McGrouther, D.; Verbeeck, J. |
Rotation of electron beams in the presence of localised, longitudinal magnetic fields |
2019 |
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UA library record |
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Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. |
Spectrocopic coincidence experiment in transmission electron microscopy |
2019 |
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UA library record |
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De Backer, A.; De Wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits? |
2015 |
Journal of physics : conference series |
644 |
|
UA library record; WoS full record |
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de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits? |
2015 |
Journal of physics : conference series |
644 |
|
UA library record |
|
|
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Jannis, D.; Müller-Caspary, K.; Béché, A.; Verbeeck, J. |
Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope |
2021 |
Applied Sciences-Basel |
11 |
9 |
UA library record; WoS full record; WoS citing articles |
|
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Guzzinati, G.; Béché, A.; McGrouther, D.; Verbeeck, J. |
Prospects for out-of-plane magnetic field measurements through interference of electron vortex modes in the TEM |
2019 |
Journal of optics |
21 |
3 |
UA library record; WoS full record; WoS citing articles |
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Jalabert, D.; Pelloux-Gervais, D.; Béché, A.; Hartmann, J.M.; Gergaud, P.; Rouvière, J.L.; Canut, B. |
Depth strain profile with sub-nm resolution in a thin silicon film using medium energy ion scattering |
2012 |
Physica Status Solidi A-Applications And Materials Science |
209 |
3 |
UA library record; WoS full record; WoS citing articles |
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Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. |
Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record |
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MacArthur, K.E.; Yankovich, A.B.; Béché, A.; Luysberg, M.; Brown, H.G.; Findlay, S.D.; Heggen, M.; Allen, L.J. |
Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale |
2021 |
Microscopy And Microanalysis |
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UA library record; WoS full record; WoS citing articles |
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Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. |
Fast electron low dose tomography for beam sensitive materials |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
|
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Bhat, S.G.; Gauquelin, N.; Sebastian, N.K.; Sil, A.; Béché, A.; Verbeeck, J.; Samal, D.; Kumar, P.S.A. |
Orthorhombic vs. hexagonal epitaxial SrIrO3 thin films : structural stability and related electrical transport properties |
2018 |
Europhysics letters |
122 |
4 |
UA library record; WoS full record; WoS citing articles |
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Béché, A.; Winkler, R.; Plank, H.; Hofer, F.; Verbeeck, J. |
Focused electron beam induced deposition as a tool to create electron vortices |
2015 |
Micron |
80 |
21 |
UA library record; WoS full record; WoS citing articles |
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Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L. |
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope |
2016 |
Micron |
80 |
50 |
UA library record; WoS full record; WoS citing articles |
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Verbeeck, J.; Guzzinati, G.; Clark, L.; Juchtmans, R.; Van Boxem, R.; Tian, H.; Béché, A.; Lubk, A.; Van Tendeloo, G. |
Shaping electron beams for the generation of innovative measurements in the (S)TEM |
2014 |
Comptes rendus : physique |
15 |
22 |
UA library record; WoS full record; WoS citing articles |
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Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. |
Evaluation of different rectangular scan strategies for STEM imaging |
2020 |
Ultramicroscopy |
|
13 |
UA library record; WoS full record; WoS citing articles |
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Prabhakara, V.; Jannis, D.; Guzzinati, G.; Béché, A.; Bender, H.; Verbeeck, J. |
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale |
2020 |
Ultramicroscopy |
219 |
4 |
UA library record; WoS full record; WoS citing articles |
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Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings |
2022 |
Ultramicroscopy |
232 |
18 |
UA library record; WoS full record; WoS citing articles |
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Jannis, D.; Hofer, C.; Gao, C.; Xie, X.; Béché, A.; Pennycook, Tj.; Verbeeck, J. |
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications |
2022 |
Ultramicroscopy |
233 |
31 |
UA library record; WoS full record; WoS citing articles |
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Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process |
2022 |
Ultramicroscopy |
|
4 |
UA library record; WoS full record; WoS citing articles |
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Denneulin, T.; Rouvière, J.L.; Béché, A.; Py, M.; Barnes, J.P.; Rochat, N.; Hartmann, J.M.; Cooper, D. |
The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography |
2011 |
Semiconductor science and technology |
26 |
|
UA library record; WoS full record; WoS citing articles |
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Prabhakara, V.; Jannis, D.; Béché, A.; Bender, H.; Verbeeck, J. |
Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique |
2019 |
Semiconductor science and technology |
|
8 |
UA library record; WoS full record; WoS citing articles |
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Vega Ibañez, F.; Béché, A.; Verbeeck, J. |
Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? |
2022 |
Microscopy and microanalysis |
|
3 |
UA library record; WoS full record; WoS citing articles |
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de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. |
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting |
2015 |
Ultramicroscopy |
151 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
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Verbeeck, J.; Béché, A.; van den Broek, W. |
A holographic method to measure the source size broadening in STEM |
2012 |
Ultramicroscopy |
120 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
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Verbeeck, J.; Tian, H.; Béché, A. |
A new way of producing electron vortex probes for STEM |
2012 |
Ultramicroscopy |
113 |
62 |
UA library record; WoS full record; WoS citing articles |
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Guzzinati, G.; Clark, L.; Béché, A.; Juchtmans, R.; Van Boxem, R.; Mazilu, M.; Verbeeck, J. |
Prospects for versatile phase manipulation in the TEM : beyond aberration correction |
2015 |
Ultramicroscopy |
151 |
19 |
UA library record; WoS full record; WoS citing articles |
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Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. |
Quantitative STEM normalisation : the importance of the electron flux |
2015 |
Ultramicroscopy |
159 |
27 |
UA library record; WoS full record; WoS citing articles |
|
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Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. |
Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography |
2013 |
Ultramicroscopy |
131 |
73 |
UA library record; WoS full record; WoS citing articles |
|
|
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Béché, A.; Juchtmans, R.; Verbeeck, J. |
Efficient creation of electron vortex beams for high resolution STEM imaging |
2017 |
Ultramicroscopy |
178 |
30 |
UA library record; WoS full record; WoS citing articles |
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