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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Verbeeck, J.; Bals, S.; Lamoen, D.; Luysberg, M.; Huijben, M.; Rijnders, G.; Brinkman, A.; Hilgenkamp, H.; Blank, D.H.A.; Van Tendeloo, G. Electronic reconstruction at n-type SrTiO3/LaAlO3 interfaces 2010 Physical review : B : condensed matter and materials physics 81 25 UA library record; WoS full record; WoS citing articles url doi
Biermans, E.; Molina, L.; Batenburg, K.J.; Bals, S.; Van Tendeloo, G. Measuring porosity at the nanoscale by quantitative electron tomography 2010 Nano letters 10 79 UA library record; WoS full record; WoS citing articles pdf doi
Ke, X.; Bals, S.; Cott, D.; Hantschel, T.; Bender, H.; Van Tendeloo, G. Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts 2010 Microscopy and microanalysis 16 42 UA library record; WoS full record; WoS citing articles doi
Leroux, F.; Gysemans, M.; Bals, S.; Batenburg, K.J.; Snauwaert, J.; Verbiest, T.; van Haesendonck, C.; Van Tendeloo, G. Three-dimensional characterization of helical silver nanochains mediated by protein assemblies 2010 Advanced materials 22 51 UA library record; WoS full record; WoS citing articles pdf doi
Batenburg, K.J.; Bals, S.; Sijbers, J.; Kübel, C.; Midgley, P.A.; Hernandez, J.C.; Kaiser, U.; Encina, E.R.; Coronado, E.A.; Van Tendeloo, G. 3D imaging of nanomaterials by discrete tomography 2009 Ultramicroscopy 109 220 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy 2009 Microscopy and microanalysis 15 1 UA library record; WoS full record; WoS citing articles url doi
Beyers, E.; Biermans, E.; Ribbens, S.; de Witte, K.; Mertens, M.; Meynen, V.; Bals, S.; Van Tendeloo, G.; Vansant, E.F.; Cool, P. Combined TiO2/SiO2 mesoporous photocatalysts with location and phase controllable TiO2 nanoparticles 2009 Applied catalysis : B : environmental 88 69 UA library record; WoS full record; WoS citing articles pdf doi
di Vece, M.; Bals, S.; Lievens, P.; Van Tendeloo, G. Compositional changes of Pd-Au bimetallic nanoclusters upon hydrogenation 2009 Physical review : B : solid state 80 28 UA library record; WoS full record; WoS citing articles url doi
Van Aert, S.; Chang, L.Y.; Bals, S.; Kirkland, A.I.; Van Tendeloo, G. Effect of amorphous layers on the interpretation of restored exit waves 2009 Ultramicroscopy 109 10 UA library record; WoS full record; WoS citing articles pdf doi
Figuerola, A.; Franchini, I.R.; Fiore, A.; Mastria, R.; Falqui, A.; Bertoni, G.; Bals, S.; Van Tendeloo, G.; Kudera, S.; Cingolani, R.; Manna, L. End-to-end assembly of shape-controlled nanocrystals via a nanowelding approach mediated by gold domains 2009 Advanced materials 21 110 UA library record; WoS full record; WoS citing articles pdf doi
Bals, S.; Stes, A.; Celis, V. Klassieke toetsing in de praktijk 2009 UA library record
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy 2009 Ultramicroscopy 109 166 UA library record; WoS full record; WoS citing articles pdf doi
Bals, S.; Batenburg, K.J.; Liang, D.; Lebedev, O.; Van Tendeloo, G.; Aerts, A.; Martens, J.A.; Kirschhock, C.E. Quantitative three-dimensional modeling of zeotile through discrete electron tomography 2009 Journal of the American Chemical Society 131 58 UA library record; WoS full record; WoS citing articles pdf doi
Lisiecki, I.; Turner, S.; Bals, S.; Pileni, M.P.; Van Tendeloo, G. The remarkable and intriguing resistance to oxidation of 2D ordered hcp Co nanocrystals: a new intrinsic property 2009 Chemistry of materials 21 28 UA library record; WoS full record; WoS citing articles pdf doi
Ke, X.; Bals, S.; Romo Negreira, A.; Hantschel, T.; Bender, H.; Van Tendeloo, G. TEM sample preparation by FIB for carbon nanotube interconnects 2009 Ultramicroscopy 109 21 UA library record; WoS full record; WoS citing articles pdf doi
Werner, R.; Raisch, C.; Leca, V.; Ion, V.; Bals, S.; Van Tendeloo, G.; Chasse, T.; Kleiner, R.; Koelle, D. Transport, magnetic, and structural properties of La0.7Ce0.3MnO3 thin films: evidence for hole-doping 2009 Physical review : B : solid state 79 25 UA library record; WoS full record; WoS citing articles url doi
Batenburg, K.J.; Bals, S.; Sijbers, J.; Van Tendeloo, G. DART explained: how to carry out a discrete tomography reconstruction 2008 UA library record
Lisiecki, I.; Turner, S.; Bals, S.; Pileni, M.P.; Van Tendeloo, G. Enhanced stability against oxidation due to 2D self-organisation of hcp cobalt nanocrystals 2008 UA library record
Montoya, E.; Bals, S.; Van Tendeloo, G. Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam 2008 Journal of microscopy 231 UA library record; WoS full record pdf doi
Krsmanovic, R.; Bals, S.; Bertoni, G.; Van Tendeloo, G. Structural characterization of Er-doped Li2O-Al2O3-SiO2 glass ceramics 2008 Optical materials 30 12 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data 2008 UA library record doi
Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. Evaluation of top, angle, and side cleaned FIB samples for TEM analysis 2007 Microscopy research and technique 70 36 UA library record; WoS full record; WoS citing articles pdf doi
Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. High-quality sample preparation by low kV FIB thinning for analytical TEM measurements 2007 Microscopy and microanalysis 13 82 UA library record; WoS full record; WoS citing articles doi
Monticelli, O.; Musina, Z.; Russo, S.; Bals, S. On the use of TEM in the characterization of nanocomposites 2007 Materials letters 61 28 UA library record; WoS full record; WoS citing articles pdf doi
Bals, S.; Batenburg, J.; Verbeeck, J.; Sijbers, J.; Van Tendeloo, G. Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes 2007 Nano letters 7 78 UA library record; WoS full record; WoS citing articles pdf doi
Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy 2007 Microscopy and microanalysis 13 UA library record pdf doi
Abakumov, A.M.; Hadermann, J.; Bals, S.; Nikolaev, I.V.; Antipov, E.V.; Van Tendeloo, G. Crystallographic shear structures as a route to anion-deficient perovskites 2006 Angewandte Chemie: international edition in English 45 62 UA library record; WoS full record; WoS citing articles pdf doi
Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images 2006 Ultramicroscopy 106 18 UA library record; WoS full record; WoS citing articles pdf doi
Huijben, M.; Rijnders, G.; Blank, D.H.A.; Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Brinkman, A.; Hilgenkamp, H. Electronically coupled complementary interfaces between perovskite band insulators 2006 Nature materials 5 315 UA library record; WoS full record; WoS citing articles pdf doi
Lebedev, O.I.; Bals, S.; Van Tendeloo, G.; Snoeck, G.E.; Retoux, R.; Boudin, S.; Hervieu, M. Mixed (Sr1-xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques 2006 International journal of materials research 97 1 UA library record; WoS full record; WoS citing articles pdf doi
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