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	Author	Biermans, E.; Molina, L.; Batenburg, K.J.; Bals, S.; Van Tendeloo, G.
	Title	Measuring porosity at the nanoscale by quantitative electron tomography			Type	A1 Journal article
	Year	2010	Publication	Nano letters	Abbreviated Journal	Nano Lett
	Volume	10	Issue	12	Pages	5014-5019
	Keywords	A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
	Abstract	Quantitative electron tomography is proposed to characterize porous materials at a nanoscale. To achieve reliable three-dimensional (3D) quantitative information, the influence of missing wedge artifacts and segmentation methods is investigated. We are presenting the Discrete Algebraic Reconstruction Algorithm as the most adequate tomography method to measure porosity at the nanoscale. It provides accurate 3D quantitative information, regardless the presence of a missing wedge. As an example, we applied our approach to nanovoids in La2Zr2O7 thin films.
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	Corporate Author				Thesis
	Publisher		Place of Publication	Washington	Editor
	Language		Wos	000284990900040	Publication Date	2010-11-22
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	1530-6984;1530-6992;	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor	12.712	Times cited	79	Open Access
	Notes	Esteem 026019			Approved	Most recent IF: 12.712; 2010 IF: 12.219
	Call Number	UA @ lucian @ c:irua:87658			Serial	1967
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