Records |
Author |
Verbeeck, J.; Bals, S.; Lamoen, D.; Luysberg, M.; Huijben, M.; Rijnders, G.; Brinkman, A.; Hilgenkamp, H.; Blank, D.H.A.; Van Tendeloo, G. |
Title |
Electronic reconstruction at n-type SrTiO3/LaAlO3 interfaces |
Type |
A1 Journal article |
Year |
2010 |
Publication |
Physical review : B : condensed matter and materials physics |
Abbreviated Journal |
Phys Rev B |
Volume |
81 |
Issue |
8 |
Pages |
085113,1-085113,6 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
Electron-energy-loss spectroscopy (EELS) is used to investigate single layers of LaAlO3 grown on SrTiO3 having an n-type interface as well as multilayers of LaAlO3 and SrTiO3 in which both n- and p-type interfaces occur. Only minor changes in Ti valence at the n-type interface are observed. This finding seems to contradict earlier experiments for other SrTiO3/LaAlO3 systems where large deviations in Ti valency were assumed to be responsible for the conductivity of these interfaces. Ab initio calculations have been carried out in order to interpret our EELS results. Using the concept of Bader charges, it is demonstrated that the so-called polar discontinuity is mainly resolved by lattice distortions and to a far lesser extent by changes in valency for both single layer and multilayer geometries. |
Address |
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Corporate Author |
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Thesis |
|
Publisher |
|
Place of Publication |
|
Editor |
|
Language |
|
Wos |
000275053300040 |
Publication Date |
2010-02-18 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1098-0121;1550-235X; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
3.836 |
Times cited |
25 |
Open Access |
|
Notes |
Esteem 026019; Fwo |
Approved |
Most recent IF: 3.836; 2010 IF: 3.774 |
Call Number |
UA @ lucian @ c:irua:81768UA @ admin @ c:irua:81768 |
Serial |
1005 |
Permanent link to this record |
|
|
|
Author |
Biermans, E.; Molina, L.; Batenburg, K.J.; Bals, S.; Van Tendeloo, G. |
Title |
Measuring porosity at the nanoscale by quantitative electron tomography |
Type |
A1 Journal article |
Year |
2010 |
Publication |
Nano letters |
Abbreviated Journal |
Nano Lett |
Volume |
10 |
Issue |
12 |
Pages |
5014-5019 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
Quantitative electron tomography is proposed to characterize porous materials at a nanoscale. To achieve reliable three-dimensional (3D) quantitative information, the influence of missing wedge artifacts and segmentation methods is investigated. We are presenting the Discrete Algebraic Reconstruction Algorithm as the most adequate tomography method to measure porosity at the nanoscale. It provides accurate 3D quantitative information, regardless the presence of a missing wedge. As an example, we applied our approach to nanovoids in La2Zr2O7 thin films. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Washington |
Editor |
|
Language |
|
Wos |
000284990900040 |
Publication Date |
2010-11-22 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1530-6984;1530-6992; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
12.712 |
Times cited |
79 |
Open Access |
|
Notes |
Esteem 026019 |
Approved |
Most recent IF: 12.712; 2010 IF: 12.219 |
Call Number |
UA @ lucian @ c:irua:87658 |
Serial |
1967 |
Permanent link to this record |
|
|
|
Author |
Ke, X.; Bals, S.; Cott, D.; Hantschel, T.; Bender, H.; Van Tendeloo, G. |
Title |
Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts |
Type |
A1 Journal article |
Year |
2010 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
Volume |
16 |
Issue |
2 |
Pages |
210-217 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
The three-dimensional (3D) distribution of carbon nanotubes (CNTs) grown inside semiconductor contact holes is studied by electron tomography. The use of a specialized tomography holder results in an angular tilt range of ±90°, which means that the so-called missing wedge is absent. The transmission electron microscopy (TEM) sample for this purpose consists of a micropillar that is prepared by a dedicated procedure using the focused ion beam (FIB) but keeping the CNTs intact. The 3D results are combined with energy dispersive X-ray spectroscopy (EDS) to study the relation between the CNTs and the catalyst particles used during their growth. The reconstruction, based on the full range of tilt angles, is compared with a reconstruction where a missing wedge is present. This clearly illustates that the missing wedge will lead to an unreliable interpretation and will limit quantitative studies |
Address |
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Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Cambridge, Mass. |
Editor |
|
Language |
|
Wos |
000276137200011 |
Publication Date |
2010-02-26 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1431-9276;1435-8115; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.891 |
Times cited |
42 |
Open Access |
|
Notes |
Esteem 026019; Fwo; Iap-Vi |
Approved |
Most recent IF: 1.891; 2010 IF: 3.259 |
Call Number |
UA @ lucian @ c:irua:82279 |
Serial |
3642 |
Permanent link to this record |
|
|
|
Author |
Leroux, F.; Gysemans, M.; Bals, S.; Batenburg, K.J.; Snauwaert, J.; Verbiest, T.; van Haesendonck, C.; Van Tendeloo, G. |
Title |
Three-dimensional characterization of helical silver nanochains mediated by protein assemblies |
Type |
A1 Journal article |
Year |
2010 |
Publication |
Advanced materials |
Abbreviated Journal |
Adv Mater |
Volume |
22 |
Issue |
19 |
Pages |
2193-2197 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
Characterization methods for the structural investigation of biotemplates for nanodevices remain widely unexplored, despite the fact that biotemplating methods for nanodevice fabrication are becoming more widespread. In this study several techniques are used to characterize the morphology and 3D distribution of silver nanoparticles deposited on insulin fibrils. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Weinheim |
Editor |
|
Language |
|
Wos |
000278601400016 |
Publication Date |
2010-03-11 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0935-9648;1521-4095; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
19.791 |
Times cited |
51 |
Open Access |
|
Notes |
Esteem 026019; Fwo |
Approved |
Most recent IF: 19.791; 2010 IF: NA |
Call Number |
UA @ lucian @ c:irua:83296 |
Serial |
3645 |
Permanent link to this record |
|
|
|
Author |
Batenburg, K.J.; Bals, S.; Sijbers, J.; Kübel, C.; Midgley, P.A.; Hernandez, J.C.; Kaiser, U.; Encina, E.R.; Coronado, E.A.; Van Tendeloo, G. |
Title |
3D imaging of nanomaterials by discrete tomography |
Type |
A1 Journal article |
Year |
2009 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
Volume |
109 |
Issue |
6 |
Pages |
730-740 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
The field of discrete tomography focuses on the reconstruction of samples that consist of only a few different materials. Ideally, a three-dimensional (3D) reconstruction of such a sample should contain only one grey level for each of the compositions in the sample. By exploiting this property in the reconstruction algorithm, either the quality of the reconstruction can be improved significantly, or the number of required projection images can be reduced. The discrete reconstruction typically contains fewer artifacts and does not have to be segmented, as it already contains one grey level for each composition. Recently, a new algorithm, called discrete algebraic reconstruction technique (DART), has been proposed that can be used effectively on experimental electron tomography datasets. In this paper, we propose discrete tomography as a general reconstruction method for electron tomography in materials science. We describe the basic principles of DART and show that it can be applied successfully to three different types of samples, consisting of embedded ErSi2 nanocrystals, a carbon nanotube grown from a catalyst particle and a single gold nanoparticle, respectively. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
Language |
|
Wos |
000265816400005 |
Publication Date |
2009-02-01 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.843 |
Times cited |
220 |
Open Access |
|
Notes |
Fwo; Esteem 026019 |
Approved |
Most recent IF: 2.843; 2009 IF: 2.067 |
Call Number |
UA @ lucian @ c:irua:74665 c:irua:74665 |
Serial |
12 |
Permanent link to this record |
|
|
|
Author |
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. |
Title |
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy |
Type |
A1 Journal article |
Year |
2009 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
Volume |
15 |
Issue |
S:2 |
Pages |
464-465 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Cambridge, Mass. |
Editor |
|
Language |
|
Wos |
000208119100230 |
Publication Date |
2009-07-27 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1431-9276;1435-8115; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.891 |
Times cited |
1 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.891; 2009 IF: 3.035 |
Call Number |
UA @ lucian @ c:irua:96555UA @ admin @ c:irua:96555 |
Serial |
178 |
Permanent link to this record |
|
|
|
Author |
Beyers, E.; Biermans, E.; Ribbens, S.; de Witte, K.; Mertens, M.; Meynen, V.; Bals, S.; Van Tendeloo, G.; Vansant, E.F.; Cool, P. |
Title |
Combined TiO2/SiO2 mesoporous photocatalysts with location and phase controllable TiO2 nanoparticles |
Type |
A1 Journal article |
Year |
2009 |
Publication |
Applied catalysis : B : environmental |
Abbreviated Journal |
Appl Catal B-Environ |
Volume |
88 |
Issue |
3/4 |
Pages |
515-524 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Laboratory of adsorption and catalysis (LADCA) |
Abstract |
Combined TiO2/SiO2 mesoporous materials were prepared by deposition of TiO2 nanoparticles synthesised via the acid-catalysed solgel method. In the first synthesis step a titania solution is prepared, by dissolving titaniumtetraisopropoxide in nitric acid. The influences of the initial titaniumtetraisopropoxide concentration and the temperature of dissolving on the final structural properties were investigated. In the second step of the synthesis, the titania nanoparticles were deposited on a silica support. Here, the influence of the temperature during deposition was studied. The depositions were carried out on two different mesoporous silica supports, SBA-15 and MCF, leading to substantial differences in the catalytic and structural properties. The samples were analysed with N2-sorption, X-ray diffraction (XRD), electron probe microanalysis (EPMA) and transmission electron microscopy (TEM) to obtain structural information, determining the amount of titania, the crystal phase and the location of the titania particles on the mesoporous material (inside or outside the mesoporous channels). The structural differences of the support strongly determine the location of the nanoparticles and the subsequent photocatalytic activity towards the degradation of rhodamine 6G in aqueous solution under UV irradiation. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
Language |
|
Wos |
000266513400032 |
Publication Date |
2008-10-29 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0926-3373; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
9.446 |
Times cited |
69 |
Open Access |
|
Notes |
Goa-Bof; Fwo |
Approved |
Most recent IF: 9.446; 2009 IF: 5.252 |
Call Number |
UA @ lucian @ c:irua:77150 |
Serial |
403 |
Permanent link to this record |
|
|
|
Author |
di Vece, M.; Bals, S.; Lievens, P.; Van Tendeloo, G. |
Title |
Compositional changes of Pd-Au bimetallic nanoclusters upon hydrogenation |
Type |
A1 Journal article |
Year |
2009 |
Publication |
Physical review : B : solid state |
Abbreviated Journal |
Phys Rev B |
Volume |
80 |
Issue |
12 |
Pages |
125420,1-125420,4 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
Changes in the size distribution and composition of bimetallic Pd-Au nanoclusters have been observed after hydrogen exposure. This effect is caused by hydrogen-induced Ostwald ripening whereby the hydrogen reduces the binding energy of the cluster atoms leading to their detachment from the cluster. The composition changes due to a difference in mobility of the detached palladium and gold atoms on the surface. Fast palladium atoms contribute to the formation of larger nanoclusters, while the slower gold atoms are confined to the smaller nanoclusters. These transformations in the Pd-Au nanocluster size and composition set a limit for chemical reactions in which such nanoclusters are involved together with hydrogen. |
Address |
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Corporate Author |
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Thesis |
|
Publisher |
|
Place of Publication |
Lancaster, Pa |
Editor |
|
Language |
|
Wos |
000270383300121 |
Publication Date |
2009-09-23 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1098-0121;1550-235X; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
3.836 |
Times cited |
28 |
Open Access |
|
Notes |
Fwo; Goa; Iap-Vi; Esteem 026019 |
Approved |
Most recent IF: 3.836; 2009 IF: 3.475 |
Call Number |
UA @ lucian @ c:irua:79232 |
Serial |
445 |
Permanent link to this record |
|
|
|
Author |
Van Aert, S.; Chang, L.Y.; Bals, S.; Kirkland, A.I.; Van Tendeloo, G. |
Title |
Effect of amorphous layers on the interpretation of restored exit waves |
Type |
A1 Journal article |
Year |
2009 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
Volume |
109 |
Issue |
3 |
Pages |
237-246 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of SrTiO3 with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, the error in the position measurements is still in the picometer range. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
Language |
|
Wos |
000264280200005 |
Publication Date |
2008-11-15 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.843 |
Times cited |
10 |
Open Access |
|
Notes |
Fwo; Esteem 026019 |
Approved |
Most recent IF: 2.843; 2009 IF: 2.067 |
Call Number |
UA @ lucian @ c:irua:76421 |
Serial |
796 |
Permanent link to this record |
|
|
|
Author |
Figuerola, A.; Franchini, I.R.; Fiore, A.; Mastria, R.; Falqui, A.; Bertoni, G.; Bals, S.; Van Tendeloo, G.; Kudera, S.; Cingolani, R.; Manna, L. |
Title |
End-to-end assembly of shape-controlled nanocrystals via a nanowelding approach mediated by gold domains |
Type |
A1 Journal article |
Year |
2009 |
Publication |
Advanced materials |
Abbreviated Journal |
Adv Mater |
Volume |
21 |
Issue |
5 |
Pages |
550-554 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
Welding nanocrystals for assembly: The welding of Au domains grown on the tips of shape-controlled cadmium chalcogenide colloidal nanocrystals is used as a strategy for their assembly. Iodine-induced coagulation of selectively grown Au domains leads to assemblies such as flowerlike structures based on bullet-shaped nanocrystals, linear and cross-linked chains of nanorods, and globular networks with tetrapods as building blocks. |
Address |
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Corporate Author |
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Thesis |
|
Publisher |
|
Place of Publication |
Weinheim |
Editor |
|
Language |
|
Wos |
000263371800005 |
Publication Date |
2008-11-14 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0935-9648; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
19.791 |
Times cited |
110 |
Open Access |
|
Notes |
Esteem 026019; Fwo |
Approved |
Most recent IF: 19.791; 2009 IF: 8.379 |
Call Number |
UA @ lucian @ c:irua:75960 |
Serial |
1037 |
Permanent link to this record |
|
|
|
Author |
Bals, S.; Stes, A.; Celis, V. |
Title |
Klassieke toetsing in de praktijk |
Type |
H2 Book chapter |
Year |
2009 |
Publication |
|
Abbreviated Journal |
|
Volume |
|
Issue |
|
Pages |
211-225 |
Keywords |
H2 Book chapter; Educational sciences; EduBROn; Electron microscopy for materials research (EMAT) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
|
Publisher |
LannooCampus |
Place of Publication |
Leuven |
Editor |
|
Language |
|
Wos |
|
Publication Date |
0000-00-00 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
978 90 209 8819 2 |
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:79658 |
Serial |
1762 |
Permanent link to this record |
|
|
|
Author |
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. |
Title |
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy |
Type |
A1 Journal article |
Year |
2009 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
Volume |
109 |
Issue |
10 |
Pages |
1236-1244 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
A model-based method is proposed to relatively quantify the chemical composition of atomic columns using high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) images. The method is based on a quantification of the total intensity of the scattered electrons for the individual atomic columns using statistical parameter estimation theory. In order to apply this theory, a model is required describing the image contrast of the HAADF STEM images. Therefore, a simple, effective incoherent model has been assumed which takes the probe intensity profile into account. The scattered intensities can then be estimated by fitting this model to an experimental HAADF STEM image. These estimates are used as a performance measure to distinguish between different atomic column types and to identify the nature of unknown columns with good accuracy and precision using statistical hypothesis testing. The reliability of the method is supported by means of simulated HAADF STEM images as well as a combination of experimental images and electron energy-loss spectra. It is experimentally shown that statistically meaningful information on the composition of individual columns can be obtained even if the difference in averaged atomic number Z is only 3. Using this method, quantitative mapping at atomic resolution using HAADF STEM images only has become possible without the need of simultaneously recorded electron energy loss spectra. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
Language |
|
Wos |
000270015200004 |
Publication Date |
2009-05-28 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.843 |
Times cited |
166 |
Open Access |
|
Notes |
Fwo; Esteem 026019 |
Approved |
Most recent IF: 2.843; 2009 IF: 2.067 |
Call Number |
UA @ lucian @ c:irua:78585UA @ admin @ c:irua:78585 |
Serial |
2748 |
Permanent link to this record |
|
|
|
Author |
Bals, S.; Batenburg, K.J.; Liang, D.; Lebedev, O.; Van Tendeloo, G.; Aerts, A.; Martens, J.A.; Kirschhock, C.E. |
Title |
Quantitative three-dimensional modeling of zeotile through discrete electron tomography |
Type |
A1 Journal article |
Year |
2009 |
Publication |
Journal of the American Chemical Society |
Abbreviated Journal |
J Am Chem Soc |
Volume |
131 |
Issue |
13 |
Pages |
4769-4773 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
Discrete electron tomography is a new approach for three-dimensional reconstruction of nanoscale objects. The technique exploits prior knowledge of the object to be reconstructed, which results in an improvement of the quality of the reconstructions. Through the combination of conventional transmission electron microscopy and discrete electron tomography with a model-based approach, quantitative structure determination becomes possible. In the present work, this approach is used to unravel the building scheme of Zeotile-4, a silica material with two levels of structural order. The layer sequence of slab-shaped building units could be identified. Successive layers were found to be related by a rotation of 120°, resulting in a hexagonal space group. The Zeotile-4 material is a demonstration of the concept of successive structuring of silica at two levels. At the first level, the colloid chemical properties of Silicalite-1 precursors are exploited to create building units with a slablike geometry. At the second level, the slablike units are tiled using a triblock copolymer to serve as a mesoscale structuring agent. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Washington, D.C. |
Editor |
|
Language |
|
Wos |
000264806300050 |
Publication Date |
2009-03-16 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0002-7863;1520-5126; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
13.858 |
Times cited |
58 |
Open Access |
|
Notes |
Fwo; Iap; Esteem 026019 |
Approved |
Most recent IF: 13.858; 2009 IF: 8.580 |
Call Number |
UA @ lucian @ c:irua:76393 |
Serial |
2767 |
Permanent link to this record |
|
|
|
Author |
Lisiecki, I.; Turner, S.; Bals, S.; Pileni, M.P.; Van Tendeloo, G. |
Title |
The remarkable and intriguing resistance to oxidation of 2D ordered hcp Co nanocrystals: a new intrinsic property |
Type |
A1 Journal article |
Year |
2009 |
Publication |
Chemistry of materials |
Abbreviated Journal |
Chem Mater |
Volume |
21 |
Issue |
12 |
Pages |
2335-2338 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Washington, D.C. |
Editor |
|
Language |
|
Wos |
000267049200001 |
Publication Date |
2009-05-14 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0897-4756;1520-5002; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
9.466 |
Times cited |
28 |
Open Access |
|
Notes |
Iap-Vi; Esteem 026019 |
Approved |
Most recent IF: 9.466; 2009 IF: 5.368 |
Call Number |
UA @ lucian @ c:irua:77887 |
Serial |
2867 |
Permanent link to this record |
|
|
|
Author |
Ke, X.; Bals, S.; Romo Negreira, A.; Hantschel, T.; Bender, H.; Van Tendeloo, G. |
Title |
TEM sample preparation by FIB for carbon nanotube interconnects |
Type |
A1 Journal article |
Year |
2009 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
Volume |
109 |
Issue |
11 |
Pages |
1353-1359 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
A powerful method to study carbon nanotubes (CNTs) grown in patterned substrates for potential interconnects applications is transmission electron microscopy (TEM). However, high-quality TEM samples are necessary for such a study. Here, TEM specimen preparation by focused ion beam (FIB) has been used to obtain lamellae of patterned samples containing CNTs grown inside contact holes. A dual-cap Pt protection layer and an extensive 5 kV cleaning procedure are applied in order to preserve the CNTs and avoid deterioration during milling. TEM results show that the inner shell structure of the carbon nanotubes has been preserved, which proves that focused ion beam is a useful technique to prepare TEM samples of CNT interconnects. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
Language |
|
Wos |
000270765800006 |
Publication Date |
2009-07-11 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.843 |
Times cited |
21 |
Open Access |
|
Notes |
Esteem 026019; Iap |
Approved |
Most recent IF: 2.843; 2009 IF: 2.067 |
Call Number |
UA @ lucian @ c:irua:79074 |
Serial |
3485 |
Permanent link to this record |
|
|
|
Author |
Werner, R.; Raisch, C.; Leca, V.; Ion, V.; Bals, S.; Van Tendeloo, G.; Chasse, T.; Kleiner, R.; Koelle, D. |
Title |
Transport, magnetic, and structural properties of La0.7Ce0.3MnO3 thin films: evidence for hole-doping |
Type |
A1 Journal article |
Year |
2009 |
Publication |
Physical review : B : solid state |
Abbreviated Journal |
Phys Rev B |
Volume |
79 |
Issue |
5 |
Pages |
054416,1-054416,8 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
Cerium-doped manganite thin films were grown epitaxially by pulsed laser deposition at 720 °C and oxygen pressure pO2=125 Pa and were subjected to different annealing steps. According to x-ray diffraction (XRD) data, the formation of CeO2 as a secondary phase could be avoided for pO28 Pa. However, transmission electron microscopy shows the presence of CeO2 nanoclusters even in those films which appear to be single phase in XRD. With O2 annealing, the metal-to-insulator transition temperature increases, while the saturation magnetization decreases and stays well below the theoretical value for electron-doped La0.7Ce0.3MnO3 with mixed Mn3+/Mn2+ valences. The same trend is observed with decreasing film thickness from 100 to 20 nm, indicating a higher oxygen content for thinner films. Hall measurements on a film which shows a metal-to-insulator transition clearly reveal holes as dominating charge carriers. Combining data from x-ray photoemission spectroscopy, for determination of the oxygen content, and x-ray absorption spectroscopy (XAS), for determination of the hole concentration and cation valences, we find that with increasing oxygen content the hole concentration increases and Mn valences are shifted from 2+ to 4+. The dominating Mn valences in the films are Mn3+ and Mn4+, and only a small amount of Mn2+ ions can be observed by XAS. Mn2+ and Ce4+ XAS signals obtained in surface-sensitive total electron yield mode are strongly reduced in the bulk-sensitive fluorescence mode, which indicates hole-doping in the bulk for those films which do show a metal-to-insulator transition. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Lancaster, Pa |
Editor |
|
Language |
|
Wos |
000263815400057 |
Publication Date |
2009-02-13 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1098-0121;1550-235X; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
3.836 |
Times cited |
25 |
Open Access |
|
Notes |
Esteem 026019; Fwo |
Approved |
Most recent IF: 3.836; 2009 IF: 3.475 |
Call Number |
UA @ lucian @ c:irua:76221 |
Serial |
3725 |
Permanent link to this record |
|
|
|
Author |
Batenburg, K.J.; Bals, S.; Sijbers, J.; Van Tendeloo, G. |
Title |
DART explained: how to carry out a discrete tomography reconstruction |
Type |
P1 Proceeding |
Year |
2008 |
Publication |
|
Abbreviated Journal |
|
Volume |
|
Issue |
|
Pages |
295-296 |
Keywords |
P1 Proceeding; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
|
Language |
|
Wos |
|
Publication Date |
0000-00-00 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
978-3-540-85154-7 |
ISBN |
|
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:77914 |
Serial |
606 |
Permanent link to this record |
|
|
|
Author |
Lisiecki, I.; Turner, S.; Bals, S.; Pileni, M.P.; Van Tendeloo, G. |
Title |
Enhanced stability against oxidation due to 2D self-organisation of hcp cobalt nanocrystals |
Type |
H1 Book chapter |
Year |
2008 |
Publication |
|
Abbreviated Journal |
|
Volume |
|
Issue |
|
Pages |
273-274 |
Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
|
Language |
|
Wos |
|
Publication Date |
0000-00-00 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
978-3-540-85226-1 |
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:87610 |
Serial |
1055 |
Permanent link to this record |
|
|
|
Author |
Montoya, E.; Bals, S.; Van Tendeloo, G. |
Title |
Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam |
Type |
A1 Journal article |
Year |
2008 |
Publication |
Journal of microscopy |
Abbreviated Journal |
J Microsc-Oxford |
Volume |
231 |
Issue |
3 |
Pages |
359-363 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Oxford |
Editor |
|
Language |
|
Wos |
000259611000001 |
Publication Date |
2008-08-28 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0022-2720;1365-2818; |
ISBN |
|
Additional Links |
UA library record; WoS full record |
Impact Factor |
1.692 |
Times cited |
|
Open Access |
|
Notes |
The authors are grateful to M. Huijben and G. Rijnders of the MESA+ group at the University of Twente (NI) for the growth of the multilayers. This work has been performed under the Interuniversity Attraction Poles programme – Belgian State Belgian Science Policy. The authors acknowledge financial support from the European Union under the framework 6 program under a contract for an Integrated Infrastructure initiative. Part of this work was performed with financial support from the European Union under the framework 6 programme, under a contract for an Integrated Infrastructure Initiative (Reference No. 02601.9 ESTEEM). |
Approved |
Most recent IF: 1.692; 2008 IF: 1.409 |
Call Number |
UA @ lucian @ c:irua:76522 |
Serial |
2849 |
Permanent link to this record |
|
|
|
Author |
Krsmanovic, R.; Bals, S.; Bertoni, G.; Van Tendeloo, G. |
Title |
Structural characterization of Er-doped Li2O-Al2O3-SiO2 glass ceramics |
Type |
A1 Journal article |
Year |
2008 |
Publication |
Optical materials |
Abbreviated Journal |
Opt Mater |
Volume |
30 |
Issue |
7 |
Pages |
1183-1188 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
Particularly favourable properties of glass ceramics are developed on the basis of two key advantages of these materials: the variation of chemical composition and of microstructure. Therefore, detailed structural and chemical information are necessary to get insight in novel glass ceramic materials. We present here two examples of Er-doped Li2O-Al2O3-SiO2, with different quantities of ZrO2, both obtained with sol-gel synthesis. Different transmission electron microscopy techniques: conventional TEM, HRTEM, and EELS are used and the results are compared with those previously obtained with XRD and Rietveld analysis. We also demonstrate the 3D reconstruction, obtained from HAADF-STEM imaging, to determine the morphology of nanosize precipitates in these composites. (c) 2007 Elsevier B.V. All rights reserved. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
Language |
|
Wos |
000254419100035 |
Publication Date |
2007-07-11 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0925-3467; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.238 |
Times cited |
12 |
Open Access |
|
Notes |
Iap-V1; Esteem |
Approved |
Most recent IF: 2.238; 2008 IF: 1.714 |
Call Number |
UA @ lucian @ c:irua:70004 |
Serial |
3219 |
Permanent link to this record |
|
|
|
Author |
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. |
Title |
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data |
Type |
H1 Book chapter |
Year |
2008 |
Publication |
|
Abbreviated Journal |
|
Volume |
|
Issue |
|
Pages |
97-98 |
Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
|
Language |
|
Wos |
|
Publication Date |
2009-03-17 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
|
ISBN |
978-3-540-85154-7 |
Additional Links |
UA library record |
Impact Factor |
|
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:136865 |
Serial |
4493 |
Permanent link to this record |
|
|
|
Author |
Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. |
Title |
Evaluation of top, angle, and side cleaned FIB samples for TEM analysis |
Type |
A1 Journal article |
Year |
2007 |
Publication |
Microscopy research and technique |
Abbreviated Journal |
Microsc Res Techniq |
Volume |
70 |
Issue |
12 |
Pages |
1060-1071 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
ITEM specimens of a LaAlO3/SrTiO3 multilayer are prepared by FIB with internal lift out. Using a Ga+1 beam of 5 kV, a final cleaning step yielding top, top-angle, side, and bottom-angle cleaning is performed. Different cleaning procedures, which can be easily implemented in a dual beam FIB system, are described and compared; all cleaning types produce thin lamellae, useful for HRTEM and HAADF-STEM work up to atomic resolution. However, the top cleaned lamellae are strongly affected by the curtain effect. Top-angle cleaned specimens show an amorphous layer of around 5 nm at the specimen surfaces, due to damage and redeposition. Furthermore, it is observed that the LaAlO3 layers are preferentially destroyed and transformed into amorphous material, during the thinning process. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
New York, N.Y. |
Editor |
|
Language |
|
Wos |
000251868200008 |
Publication Date |
2007-08-25 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1059-910X;1097-0029; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.147 |
Times cited |
36 |
Open Access |
|
Notes |
Aip; Fwo |
Approved |
Most recent IF: 1.147; 2007 IF: 1.644 |
Call Number |
UA @ lucian @ c:irua:67282 |
Serial |
1090 |
Permanent link to this record |
|
|
|
Author |
Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. |
Title |
High-quality sample preparation by low kV FIB thinning for analytical TEM measurements |
Type |
A1 Journal article |
Year |
2007 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
Volume |
13 |
Issue |
2 |
Pages |
80-86 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
Focused ion beam specimen preparation has been used for NiTi samples and SrTiO(3)/SrRuO(3) multilayers with prevention of surface amorphization and Ga implantation by a 2-kV cleaning procedure. Transmission electron microscopy techniques show that the samples are of high quality with a controlled thickness over large scales. Furthermore, preferential thinning effects in multicompounds are avoided, which is important when analytical transmission electron microscopy measurements need to be interpreted in a quantitative manner. The results are compared to similar measurements acquired for samples obtained using conventional preparation techniques such as electropolishing for alloys and ion milling for oxides. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Cambridge, Mass. |
Editor |
|
Language |
|
Wos |
000245662200002 |
Publication Date |
2007-03-19 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1431-9276;1435-8115; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.891 |
Times cited |
82 |
Open Access |
|
Notes |
Fwo; Goa |
Approved |
Most recent IF: 1.891; 2007 IF: 1.941 |
Call Number |
UA @ lucian @ c:irua:65850 |
Serial |
1441 |
Permanent link to this record |
|
|
|
Author |
Monticelli, O.; Musina, Z.; Russo, S.; Bals, S. |
Title |
On the use of TEM in the characterization of nanocomposites |
Type |
A1 Journal article |
Year |
2007 |
Publication |
Materials letters |
Abbreviated Journal |
Mater Lett |
Volume |
61 |
Issue |
16 |
Pages |
3446-3450 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
Both an organically modified commercial clay of montmorillonite type (MMT) and its nanocomposites, based either on polyamide 6 (PA6) or an epoxy resin, as matrix polymer, have been characterized by transmission electron microscopy (TEM). Sample micrographs, taken at increasing exposure times (t(e)), have shown the gradual disappearance of clay layers, because of an amorphisation of the MMT crystalline structures caused by prolonged sample exposure to electron beam. Indeed, the above phenomenon, which is mostly evident in the case of intercalated nanocomposites, makes the detection of the layered silicate dispersion in the polymer matrix rather difficult and compels to perform TEM measurements using very short exposure times. Moreover, the microscopy accelerating voltage has turned out to affect sample stability; namely, when decreasing the above parameter, the disappearance of clay structure occurs at lower exposure times. (C) 2006 Elsevier B.V. All rights reserved. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
Language |
|
Wos |
000247146100034 |
Publication Date |
2006-12-06 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0167-577X; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.572 |
Times cited |
28 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 2.572; 2007 IF: 1.625 |
Call Number |
UA @ lucian @ c:irua:64757 |
Serial |
2460 |
Permanent link to this record |
|
|
|
Author |
Bals, S.; Batenburg, J.; Verbeeck, J.; Sijbers, J.; Van Tendeloo, G. |
Title |
Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes |
Type |
A1 Journal article |
Year |
2007 |
Publication |
Nano letters |
Abbreviated Journal |
Nano Lett |
Volume |
7 |
Issue |
12 |
Pages |
3669-3674 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
Abstract |
The three-dimensional (3D) structure and chemical composition of bamboo-like carbon nanotubes including the catalyst particles that are. used during their growth are studied by discrete electron tomography in combination with energy-filtered transmission electron microscopy. It is found that cavities are present in the catalyst particles. Furthermore, only a small percentage of the catalyst particles consist of pure Cu, since a large volume fraction of the particles is oxidized to CU(2)0. These volume fractions are determined quantitatively from 3D reconstructions obtained by discrete tomography. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Washington |
Editor |
|
Language |
|
Wos |
000251581600022 |
Publication Date |
2007-11-14 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1530-6984;1530-6992; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
12.712 |
Times cited |
78 |
Open Access |
|
Notes |
Fwo; Esteem |
Approved |
Most recent IF: 12.712; 2007 IF: 9.627 |
Call Number |
UA @ lucian @ c:irua:66762UA @ admin @ c:irua:66762 |
Serial |
2768 |
Permanent link to this record |
|
|
|
Author |
Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. |
Title |
Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy |
Type |
A1 Journal article |
Year |
2007 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
Volume |
13 |
Issue |
S:3 |
Pages |
332-333 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Cambridge, Mass. |
Editor |
|
Language |
|
Wos |
|
Publication Date |
2008-02-13 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1431-9276;1435-8115; |
ISBN |
|
Additional Links |
UA library record |
Impact Factor |
1.891 |
Times cited |
|
Open Access |
|
Notes |
|
Approved |
Most recent IF: 1.891; 2007 IF: 1.941 |
Call Number |
UA @ lucian @ c:irua:96553 |
Serial |
3224 |
Permanent link to this record |
|
|
|
Author |
Abakumov, A.M.; Hadermann, J.; Bals, S.; Nikolaev, I.V.; Antipov, E.V.; Van Tendeloo, G. |
Title |
Crystallographic shear structures as a route to anion-deficient perovskites |
Type |
A1 Journal article |
Year |
2006 |
Publication |
Angewandte Chemie: international edition in English |
Abbreviated Journal |
Angew Chem Int Edit |
Volume |
45 |
Issue |
40 |
Pages |
6697-6700 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
|
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Weinheim |
Editor |
|
Language |
|
Wos |
000241474500022 |
Publication Date |
2006-09-13 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1433-7851;1521-3773; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
11.994 |
Times cited |
62 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 11.994; 2006 IF: 10.232 |
Call Number |
UA @ lucian @ c:irua:61689 |
Serial |
589 |
Permanent link to this record |
|
|
|
Author |
Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. |
Title |
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images |
Type |
A1 Journal article |
Year |
2006 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
Volume |
106 |
Issue |
10 |
Pages |
933-940 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab |
Abstract |
We propose an improved image simulation procedure for atomic-resolution annular dark-field scanning transmission electron microscopy (STEM) based on the multislice formulation, which takes thermal diffuse scattering fully into account. The improvement with regard to the classical frozen phonon approach is realized by separating the lattice configuration statistics from the dynamical scattering so as to avoid repetitive calculations. As an example, the influence of phonon scattering on the image contrast is calculated and investigated. STEM image simulation of crystals can be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells. |
Address |
|
Corporate Author |
|
Thesis |
|
Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
Language |
|
Wos |
000240397200006 |
Publication Date |
2006-05-10 |
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
2.843 |
Times cited |
18 |
Open Access |
|
Notes |
Fwo; Fwo-V |
Approved |
Most recent IF: 2.843; 2006 IF: 1.706 |
Call Number |
UA @ lucian @ c:irua:87604UA @ admin @ c:irua:87604 |
Serial |
876 |
Permanent link to this record |
|
|
|
Author |
Huijben, M.; Rijnders, G.; Blank, D.H.A.; Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Brinkman, A.; Hilgenkamp, H. |
Title |
Electronically coupled complementary interfaces between perovskite band insulators |
Type |
A1 Journal article |
Year |
2006 |
Publication |
Nature materials |
Abbreviated Journal |
Nat Mater |
Volume |
5 |
Issue |
|
Pages |
556-560 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
London |
Editor |
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Language |
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Wos |
000238708900021 |
Publication Date |
2006-06-18 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
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Edition |
|
ISSN |
1476-1122;1476-4660; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
39.737 |
Times cited |
315 |
Open Access |
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Notes |
Fwo |
Approved |
Most recent IF: 39.737; 2006 IF: 19.194 |
Call Number |
UA @ lucian @ c:irua:59713UA @ admin @ c:irua:59713 |
Serial |
1019 |
Permanent link to this record |
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|
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Author |
Lebedev, O.I.; Bals, S.; Van Tendeloo, G.; Snoeck, G.E.; Retoux, R.; Boudin, S.; Hervieu, M. |
Title |
Mixed (Sr1-xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques |
Type |
A1 Journal article |
Year |
2006 |
Publication |
International journal of materials research |
Abbreviated Journal |
Int J Mater Res |
Volume |
97 |
Issue |
7 |
Pages |
978-984 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
(Sr1-xCax)(33)Bi-24,partial derivative Al48O141+3 partial derivative/2 fullerenoid solid solutions have been synthesized and the effect of partial substitution of Sr by Ca has been characterized by (scanning) transmission electron microscopy, applying different imaging methods. Most of the defects commonly observed in face centered cubic compounds, have also been observed in (Sr1-xCax)(33)Bi24-partial derivative Al48O141+3 partial derivative/2. Based on purely geometrical and topological models, structural presentations for the coherent twin boundaries and stacking faults have been constructed on the basis of complex spherical “Al84O210” units. The results are compared to defects observed in the crystallite fullerite C-60. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000239916700017 |
Publication Date |
2013-12-09 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
|
Series Issue |
|
Edition |
|
ISSN |
1862-5282;2195-8556; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
0.681 |
Times cited |
1 |
Open Access |
|
Notes |
|
Approved |
Most recent IF: 0.681; 2006 IF: NA |
Call Number |
UA @ lucian @ c:irua:60966 |
Serial |
2091 |
Permanent link to this record |