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Author Title Year Publication Volume Times cited Additional Links
Sun, M.; Rousse, G.; Abakumov, A.M.; Saubanere, M.; Doublet, M.-L.; Rodriguez-Carvajal, J.; Van Tendeloo, G.; Tarascon, J.-M. Li2Cu2O(SO4)2: a possible electrode for sustainable Li-based batteries showing a 4.7 V redox activity vs Li+/Li0 2015 Chemistry of materials 27 20 UA library record; WoS full record; WoS citing articles
Batuk, M.; Batuk, D.; Tsirlin, A.A.; Filimonov, D.S.; Sheptyakov, D.V.; Frontzek, M.; Hadermann, J.; Abakumov, A.M. Layered oxychlorides [PbBiO2]An+1BnO3n-1Cl2(A = Pb/Bi, B = Fe/Ti) : intergrowth of the hematophanite and sillen phases 2015 Chemistry of materials 27 11 UA library record; WoS full record; WoS citing articles
Shevchenko, V.A.; Glazkova, I.S.; Novichkov, D.A.; Skvortsova, I.; V. Sobolev, A.; Abakumov, A.M.; Presniakov, I.A.; Drozhzhin, O.A.; V. Antipov, E. Competition between the Ni and Fe redox in the O3-NaNi1/3Fe1/3Mn1/3O2 cathode material for Na-ion batteries 2023 Chemistry of materials 35 UA library record; WoS full record; WoS citing articles
Hao, Y.; Velpula, G.; Kaltenegger, M.; Bodlos, W.R.; Vibert, F.; Mali, K.S.; De Feyter, S.; Resel, R.; Geerts, Y.H.; Van Aert, S.; Beljonne, D.; Lazzaroni, R. From 2D to 3D : bridging self-assembled monolayers to a substrate-induced polymorph in a molecular semiconductor 2022 Chemistry of materials 34 UA library record; WoS full record; WoS citing articles
Drijkoningen, S.; Pobedinskas, P.; Korneychuk, S.; Momot, A.; Balasubramaniam, Y.; Van Bael, M.K.; Turner, S.; Verbeeck, J.; Nesladekt, M.; Haenen, K. On the Origin of Diamond Plates Deposited at Low Temperature 2017 Crystal growth & design 17 23 UA library record; WoS full record; WoS citing articles
Monico, L.; Janssens, K.; Miliani, C.; Brunetti, B.G.; Vagnini, M.; Vanmeert, F.; Falkenberg, G.; Abakumov, A.; Lu, Y.; Tian, H.; Verbeeck, J.; Radepont, M.; Cotte, M.; Hendriks, E.; Geldof, M.; van der Loeff, L.; Salvant, J.; Menu, M.; Degradation process of lead chromate in paintings by Vincent van Gogh studied by means of spectromicroscopic methods : 3 : synthesis, characterization, and detection of different crystal forms of the chrome yellow pigment 2013 Analytical chemistry 85 79 UA library record; WoS full record; WoS citing articles
Monico, L.; van der Snickt, G.; Janssens, K.; de Nolf, W.; Miliani, C.; Verbeeck, J.; Tian, H.; Tan, H.; Dik, J.; Radepont, M.; Cotte, M. Degradation process of lead chromate in paintings by Vincent van Gogh studied by means of synchrotron X-ray spectromicroscopy and related methods : 1 : artificially aged model samples 2011 Analytical chemistry 83 113 UA library record; WoS full record; WoS citing articles
Neelisetty, K.K.; Kumar C.N., S.; Kashiwar, A.; Scherer, T.; Chakravadhanula, V.S.K.; Kuebel, C. Novel thin film lift-off process for in situ TEM tensile characterization 2021 Microscopy And Microanalysis 27 UA library record
Gjorgievska, E.; Van Tendeloo, G.; Nicholson, J.W.; Coleman, N.J.; Slipper, I.J.; Booth, S. The incorporation of nanoparticles into conventional glass-ionomer dental restorative cements 2015 Microscopy and microanalysis 21 15 UA library record; WoS full record; WoS citing articles
Grieten, E.; Caen, J.; Schryvers, D. Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM 2014 Microscopy and microanalysis 20 UA library record; WoS full record; WoS citing articles
Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM 2014 Microscopy and microanalysis 20 UA library record
Lu, J.; Roeffaers, M.B.J.; Bartholomeeusen, E.; Sels, B.F.; Schryvers, D. Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy 2014 Microscopy and microanalysis 20 7 UA library record; WoS full record; WoS citing articles
Leroux, F.; Bladt, E.; Timmermans, J.-P.; Van Tendeloo, G.; Bals, S. Annular dark-field transmission electron microscopy for low contrast materials 2013 Microscopy and microanalysis 19 5 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Van Aert, S.; van Dyck, D. Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency 2012 Microscopy and microanalysis 18 15 UA library record; WoS full record; WoS citing articles
Idrissi, H.; Turner, S.; Mitsuhara, M.; Wang, B.; Hata, S.; Coulombier, M.; Raskin, J.-P.; Pardoen, T.; Van Tendeloo, G.; Schryvers, D. Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study 2011 Microscopy and microanalysis 17 25 UA library record; WoS full record; WoS citing articles
Ke, X.; Bals, S.; Cott, D.; Hantschel, T.; Bender, H.; Van Tendeloo, G. Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts 2010 Microscopy and microanalysis 16 42 UA library record; WoS full record; WoS citing articles
Bach, D.; Schneider, R.; Gerthsen, D.; Verbeeck, J.; Sigle, W. EELS of niobium and stoichiometric niobium-oxide phases: part 1: plasmon and Near-edges fine structure 2009 Microscopy and microanalysis 15 55 UA library record; WoS full record; WoS citing articles
Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. High-quality sample preparation by low kV FIB thinning for analytical TEM measurements 2007 Microscopy and microanalysis 13 82 UA library record; WoS full record; WoS citing articles
Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Verbeeck, J. EELS investigations of different niobium oxide phases 2006 Microscopy and microanalysis 12 50 UA library record; WoS full record; WoS citing articles
Jinschek, J.R.; Bals, S.; Gopal, V.; Xus, X.; Kisielowski, C. Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs 2004 Microscopy and microanalysis 10 UA library record
Bals, S.; Radmilovic, V.; Kisielowski, C. TEM annular objective apertures fabricated by FIB 2004 Microscopy and microanalysis 10 UA library record
van Dyck, D.; Van Aert, S.; den Dekker, A.J. Physical limits on atomic resolution 2004 Microscopy and microanalysis 10 14 UA library record; WoS full record; WoS citing articles
Savchenko, D.V.; Serdan, A.A.; Morozov, V.A.; Van Tendeloo, G.; Ionov, S.G. Improvement of the oxidation stability and the mechanical properties of flexible graphite foil by boron oxide impregnation 2012 New carbon materials 27 5 UA library record; WoS full record; WoS citing articles
Afanasov, I.M.; Lebedev, O.I.; Kolozhvary, B.A.; Smirnov, A.V.,; Van Tendeloo, G. Nickel/carbon composite materials based on expanded graphite 2011 New carbon materials 26 7 UA library record; WoS full record; WoS citing articles
Afanasov, I.M.; Van Tendeloo, G.; Mateev, A.T. Production and structure of exfoliated graphite/coke composites modified by ZrO2 nanoparticles 2010 New carbon materials 25 UA library record; WoS full record; WoS citing articles
Antipov, E.V.; Khasanova, N.R.; Pshirkov, J.S.; Putilin, S.N.; Bougerol, C.; Lebedev, O.I.; Van Tendeloo, G.; Baranov, A.N.; Park, Y.W. The superconducting bismuth-based mixed oxides 2002 Current applied physics T2 – QTSM and QFS 02 Symposium, MAY 08-10, 2002, SEOUL, SOUTH KOREA 2 2 UA library record; WoS full record; WoS citing articles
Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S. Misfit accommodation of epitaxial La1-xAxMnO3 (A=Ca, Sr) thin films 2001 International journal of inorganic materials 3 2 UA library record; WoS full record; WoS citing articles
Hadermann, J.; Van Tendeloo, G.; Abakumov, A.M.; Pavlyuk, B.P.; Rozova, M.G.; Antipov, E.V. Structural transformation in fluorinated LaACuGaO5 (A=Ca, Sr) brownmillerites 2000 International journal of inorganic materials 2 13 UA library record; WoS full record; WoS citing articles
Blin, J.L.; Becue, A.; Pauwels, B.; Van Tendeloo, G.; Su, B.L. Non-ionic surfactant (C13EOm, m=6, 12 and 18) for large pore mesoporous molecular sieves preparation 2001 Microporous and mesoporous materials 44/45 27 UA library record; WoS full record; WoS citing articles
Hens, S.; van Landuyt, J.; Bender, H.; Boullart, W.; Vanhaelemeersch, S. Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy 2001 Materials science in semiconductor processing 4 UA library record; WoS full record