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  Author Title (down) Year Publication Volume Times cited Additional Links Links
Van Aert, S.; van Dyck, D.; den Dekker, A.J. Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative 2006 Optics express 14 45 UA library record; WoS full record; WoS citing articles url doi
Guo, A.; Bai, H.; Liang, Q.; Feng, L.; Su, X.; Van Tendeloo, G.; Wu, J. Resistive switching in Ag₂Te semiconductor modulated by Ag+-ion diffusion and phase transition 2022 Advanced Electronic Materials UA library record; WoS full record; WoS citing articles pdf doi
Kalkert, C.; Krisponeit, J.-O.; Esseling, M.; Lebedev, O.I.; Moshnyaga, V.; Damaschke, B.; Van Tendeloo, G.; Samwer, K. Resistive switching at manganite/manganite interfaces 2011 Applied physics letters 99 10 UA library record; WoS full record; WoS citing articles pdf doi
Lebedev, N.; Huang, Y.; Rana, A.; Jannis, D.; Gauquelin, N.; Verbeeck, J.; Aarts, J. Resistance minimum in LaAlO3/Eu1-xLaxTiO3/SrTiO3 heterostructures 2022 Physical review materials 6 UA library record; WoS full record url doi
Samaeeaghmiyoni, V.; Cordier, P.; Demouchy, S.; Bollinger, C.; Gasc, J.; Mussi, A.; Schryvers, D.; Idrissi, H. Research data supporting for Stress-induced amorphization triggers deformation in the lithospheric mantle 2020 UA library record doi
Abakumov, A.M.; Erni, R.; Tsirlin, A.A. Reply to Comment on “Frustrated octahedral tilting distortion in the incommensurately modulated Li3xNd2/3-xTiO3 perovskites” 2014 Chemistry of materials 26 1 UA library record; WoS full record; WoS citing articles doi
Leus, K.; Folens, K.; Nicomel, N.R.; Perez, J.P.H.; Filippousi, M.; Meledina, M.; Dirtu, M.M.; Turner, S.; Van Tendeloo, G.; Garcia, Y.; Du Laing, G.; Van Der Voort, P. Removal of arsenic and mercury species from water by covalent triazine framework encapsulated \gamma-Fe2O3 nanoparticles 2018 Journal of hazardous materials 353 22 UA library record; WoS full record; WoS citing articles pdf url doi
Van Eyndhoven, G.; Batenburg, K.J.; van Oers, C.; Kurttepeli, M.; Bals, S.; Cool, P.; Sijbers, J. Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples 2014 UA library record
Hofer, C.; Pennycook, T.J. Reliable phase quantification in focused probe electron ptychography of thin materials 2023 Ultramicroscopy 254 UA library record; WoS full record; WoS citing articles pdf url doi
Das, P.P.; Guzzinati, G.; Coll, C.; Gomez Perez, A.; Nicolopoulos, S.; Estrade, S.; Peiro, F.; Verbeeck, J.; Zompra, A.A.; Galanis, A.S. Reliable Characterization of Organic & Pharmaceutical Compounds with High Resolution Monochromated EEL Spectroscopy 2020 Polymers 12 6 UA library record; WoS full record; WoS citing articles url doi
Tokei, Z.; Lanckmans, F.; van den Bosch, G.; Van Hove, M.; Maex, K.; Bender, H.; Hens, S.; van Landuyt, J. Reliability of copper dual damascene influenced by pre-clean 2002 Analysis Of Integrated Circuits 5 UA library record; WoS full record; WoS citing articles doi
Li, D.Y.; Zeng, Y.J.; Batuk, D.; Pereira, L.M.C.; Ye, Z.Z.; Fleischmann, C.; Menghini, M.; Nikitenko, S.; Hadermann, J.; Temst, K.; Vantomme, A.; Van Bael, M.J.; Locquet, J.P.; Van Haesendonck, C.; Relaxor ferroelectricity and magnetoelectric coupling in ZnOCo nanocomposite thin films : beyond multiferroic composites 2014 ACS applied materials and interfaces 6 21 UA library record; WoS full record; WoS citing articles doi
Dominiczak, M.; Ruyter, A.; Limelette, P.; Monot-Laffez, I.; Giovannelli, F.; Rossell, M.D.; Van Tendeloo, G. Relaxation phenomena at the metal-to-insulator transition in La0.8Sr0.2MnO3 single crystals 2008 Solid state communications 148 9 UA library record; WoS full record; WoS citing articles pdf doi
Leys, F.E.; March, N.H.; Lamoen, D. Relativistic virial relations for both homogeneous and spatially varying electron liquids 2004 Physics And Chemistry Of Liquids 42 UA library record; WoS full record; doi
Semkina, A.S.; Abakumov, M.A.; Abakumov, A.M.; Nukolova, N.V.; Chekhonin, V.P. Relationship between the Size of Magnetic Nanoparticles and Efficiency of MRT Imaging of Cerebral Glioma in Rats 2016 Bulletin of experimental biology and medicine 161 5 UA library record; WoS full record; WoS citing articles doi
Schuddinck, W.; Van Tendeloo, G.; Barnabé, A.; Hervieu, M.; Raveau, B. Relation between structure, charge ordering and magnetotransport properties in Nd0.5Ca0.5Mn1-xCrxO3 manganites 2000 Journal of magnetism and magnetic materials T2 – Symposium G Material Physics Issues and Applications of Magnetic Oxides, at the E-MRS Spring Meeting, JUN 01-04, 1999, Strasbourg, France 211 16 UA library record; WoS full record; WoS citing articles pdf doi
van Daele, B.; Van Tendeloo, G.; Germain, M.; Leys, M.; Bougrioua, Z.; Moerman, I. Relation between microstructure and 2DEG properties of AlGaN/GaN structures 2002 Physica status solidi: B: basic research 234 1 UA library record; WoS full record; WoS citing articles doi
Poppe, R.; Roth, N.; Neder, R.B.; Palatinus, L.; Iversen, B.B.; Hadermann, J. Refining short-range order parameters from the three-dimensional diffuse scattering in single-crystal electron diffraction data 2024 IUCrJ 11 UA library record; WoS full record url doi
Poppe, R. Refining short-range order parameters from diffuse electron scattering 2023 UA library record url
Leinders, G.; Grendal, O.G.; Arts, I.; Bes, R.; Prozheev, I.; Orlat, S.; Fitch, A.; Kvashnina, K.; Verwerft, M. Refinement of the uranium dispersion corrections from anomalous diffraction 2024 Journal of Applied Crystallography 57 UA library record; WoS full record pdf url doi
Müller, K.; Schowalter, M.; Jansen, J.; Tsuda, K.; Titantah, J.; Lamoen, D.; Rosenauer, A. Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data 2009 Ultramicroscopy 109 8 UA library record; WoS full record; WoS citing articles pdf doi
Müller, K.; Schowalter, M.; Rosenauer, A.; Jansen, J.; Tsuda, K.; Titantah, J.T.; Lamoen, D. Refinement of chemically sensitive structure factors using parallel and convergent beam electron nanodiffraction 2010 Journal of physics : conference series 209 UA library record url doi
Zelaya, E.; Schryvers, D. Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite 2011 Microscopy research and technique 74 2 UA library record; WoS full record; WoS citing articles pdf doi
Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process 2022 Ultramicroscopy 4 UA library record; WoS full record; WoS citing articles url doi
Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings 2022 Ultramicroscopy 232 18 UA library record; WoS full record; WoS citing articles url doi
Van Tendeloo, G.; Bernaerts, D.; Amelinckx, S. Reduced dimensionality in different forms of carbon 1998 Fullerenes and carbon based materials UA library record; WoS full record;
Van Tendeloo, G.; Bernaerts, D.; Amelinckx, S. Reduced dimensionality in different forms of carbon 1998 Carbon 36 4 UA library record; WoS full record; WoS citing articles doi
Pahlke, P.; Lao, M.; Eisterer, M.; Meledin, A.; Van Tendeloo, G.; Hanisch, J.; Sieger, M.; Usoskin, A.; Stromer, J.; Holzapfel, B.; Schultz, L.; Huhne, R. Reduced Anisotropy and Enhanced In-Field Performance of Thick BaHfO3-Doped Films on ABAD-YSZ Templates 2016 IEEE transactions on applied superconductivity 26 14 UA library record; WoS full record; WoS citing articles pdf url doi
Montoya, E.; Bals, S.; Van Tendeloo, G. Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam 2008 Journal of microscopy 231 UA library record; WoS full record pdf doi
Samajdar, I.; Ratchev, P.; Verlinden, B.; Schryvers, D. Recrystallization and grain growth in a B2 iron aluminide alloy 1998 Intermetallics 6 17 UA library record; WoS full record; WoS citing articles doi
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