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	Author	Van Tendeloo, G.; Bernaerts, D.; Amelinckx, S.
	Title	Reduced dimensionality in different forms of carbon			Type	P1 Proceeding
	Year	1998	Publication	Fullerenes and carbon based materials	Abbreviated Journal
	Volume		Issue		Pages	487-493
	Keywords	P1 Proceeding; Electron microscopy for materials research (EMAT)
	Abstract	Several TEM techniques are used to characterise the local structure of low dimensional forms of carbon. HREM is particularly useful to describe the defect structure of thin films of diamond or fullerenes and C-60-C-70 nanoclusters. A columnar form of graphite is analysed, mainly by electron diffraction which allowed us to propose a growth mechanism. Diffraction contrast dark field microscopy, in combination with electron diffraction, allows a detailed characterisation of carbon nanotubes; e.g. the chirality distribution of tubes in ropes of single wall tubes is studied by selected area electron diffraction. (C) 1998 Elsevier Science Ltd. All rights reserved.
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	Corporate Author				Thesis
	Publisher		Place of Publication		Editor
	Language		Wos	000079731900002	Publication Date	0000-00-00
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume	68	Series Issue		Edition
	ISSN	0-444-20512-8	ISBN		Additional Links	UA library record; WoS full record;
	Impact Factor		Times cited		Open Access
	Notes				Approved	Most recent IF: NA
	Call Number	UA @ lucian @ c:irua:104348			Serial	2850
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