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Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Heidari, H.; van den Broek, W.; Bals, S. |
Quantitative electron tomography : the effect of the three-dimensional point spread function |
2013 |
Ultramicroscopy |
135 |
6 |
UA library record; WoS full record; WoS citing articles |
|
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Heidari Mezerji, H. |
Quantitative electron tomography of nanoparticles |
2012 |
|
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UA library record |
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Terzano, R.; Spagnuolo, M.; Ruggiero, P.; Vekemans, B.; Scoonjans, T.; Vincze, L.; Janssens, K.; Tomasi, N.; Cesco, S.; Falkenberg, G. |
Quantitative Fe determination inside tomato roots by confocal μ-XRF |
2008 |
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UA library record |
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Cao, S.; Zeng, C.Y.; Li, Y.Y.; Yao, X.; Ma, X.; Samaee, V.; Schryvers, D.; Zhang, X.P. |
Quantitative FIB/SEM three-dimensional characterization of a unique Ni₄Ti₃ network in a porous Ni50.8Ti49.2 alloy undergoing a two-step martensitic transformation |
2020 |
Materials Characterization |
169 |
|
UA library record; WoS full record; WoS citing articles |
|
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Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. |
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation |
2018 |
Ultramicroscopy |
184 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Samaeeaghmiyoni, V.; Idrissi, H.; Groten, J.; Schwaiger, R.; Schryvers, D. |
Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach |
2017 |
Micron |
94 |
11 |
UA library record; WoS full record; WoS citing articles |
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Salje, E.K.H.; Zhang, H.; Schryvers, D.; Bartova, B. |
Quantitative Landau potentials for the martensitic transformation in Ni-Al |
2007 |
Applied physics letters |
90 |
9 |
UA library record; WoS full record; WoS citing articles |
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Li, K.; Idrissi, H.; Sha, G.; Song, M.; Lu, J.; Shi, H.; Wang, W.; Ringer, S.P.; Du, Y.; Schryvers, D. |
Quantitative measurement for the microstructural parameters of nano-precipitates in Al-Mg-Si-Cu alloys |
2016 |
Materials characterization |
118 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
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Clark, L.; Béché, A.; Guzzinati, G.; Verbeeck, J. |
Quantitative measurement of orbital angular momentum in electron microscopy |
2014 |
Physical review : A : atomic, molecular and optical physics |
89 |
23 |
UA library record; WoS full record; WoS citing articles |
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Martínez Alanis, G.T. |
Quantitative model-based high angle annular dark field scanning transmission electron microscopy |
2015 |
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UA library record |
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Bercx, M.; Partoens, B.; Lamoen, D. |
Quantitative modeling of secondary electron emission from slow-ion bombardment on semiconductors |
2019 |
Physical review B |
99 |
5 |
UA library record; WoS full record; WoS citing articles |
|
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Payne, L.M.; Masia, F.; Zilli, A.; Albrecht, W.; Borri, P.; Langbein, W. |
Quantitative morphometric analysis of single gold nanoparticles by optical extinction microscopy: Material permittivity and surface damping effects |
2021 |
Journal Of Chemical Physics |
154 |
|
UA library record; WoS full record; WoS citing articles |
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Vincze, L.; Janssens, K.; Adams, F.; Jones, K. |
Quantitative mu-XRF analysis of heterogeneous samples |
1995 |
Microbeam Analysis 1995: Proceedings Of The 29th Annual Conference Of The Microbeam Analysis Society |
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UA library record; WoS full record |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals |
1999 |
Journal of the American Society for Mass Spectrometry |
10 |
4 |
UA library record; WoS full record; WoS citing articles |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
1998 |
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UA library record |
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Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. |
Quantitative STEM normalisation : the importance of the electron flux |
2015 |
Ultramicroscopy |
159 |
27 |
UA library record; WoS full record; WoS citing articles |
|
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Cooper, D.; Rouvière, J.-L.; Béché, A.; Kadkhodazadeh, S.; Semenova, E.S.; Dunin-Borkowsk, R. |
Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography |
2011 |
Applied physics letters |
99 |
26 |
UA library record; WoS full record; WoS citing articles |
|
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Altantzis, T.; Goris, B.; Sánchez-Iglesias, A.; Grzelczak, M.; Liz-Marzán, L.M.; Bals, S. |
Quantitative structure determination of large three-dimensional nanoparticle assemblies |
2013 |
Particle and particle systems characterization |
30 |
23 |
UA library record; WoS full record; WoS citing articles |
|
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Tang, Y.; Chen, Z.; Borbely, A.; Ji, G.; Zhong, S.Y.; Schryvers, D.; Ji, V.; Wang, H.W. |
Quantitative study of particle size distribution in an in-situ grown Al-TiB2 composite by synchrotron X-ray diffraction and electron microscopy |
2015 |
Materials characterization |
102 |
41 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
1996 |
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UA library record |
|
|
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Cao, S.; Nishida, M.; Schryvers, D. |
Quantitative three-dimensional analysis of Ni4Ti3 precipitate morphology and distribution in polycrystalline Ni-Ti |
2011 |
Acta materialia |
59 |
34 |
UA library record; WoS full record; WoS citing articles |
|
|
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Bals, S.; Batenburg, K.J.; Liang, D.; Lebedev, O.; Van Tendeloo, G.; Aerts, A.; Martens, J.A.; Kirschhock, C.E. |
Quantitative three-dimensional modeling of zeotile through discrete electron tomography |
2009 |
Journal of the American Chemical Society |
131 |
58 |
UA library record; WoS full record; WoS citing articles |
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Bals, S.; Batenburg, J.; Verbeeck, J.; Sijbers, J.; Van Tendeloo, G. |
Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes |
2007 |
Nano letters |
7 |
78 |
UA library record; WoS full record; WoS citing articles |
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Pfannmöller, M.; Heidari, H.; Nanson, L.; Lozman, O.R.; Chrapa, M.; Offermans, T.; Nisato, G.; Bals, S. |
Quantitative Tomography of Organic Photovoltaic Blends at the Nanoscale |
2015 |
Nano letters |
15 |
26 |
UA library record; WoS full record; WoS citing articles |
|
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Vincze, L.; Somogyi, A.; Osán, J.; Vekemans, B.; Török, S.; Janssens, K.; Adams, F. |
Quantitative trace element analysis of individual fly ash particles by means of X-ray microfluorescence |
2002 |
Analytical chemistry |
74 |
44 |
UA library record; WoS full record; WoS citing articles |
|
|
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Vekemans, B.; Vincze, L.; Somogyi, A.; Drakopoulos, M.; Kempenaers, L.; Simionovici, A.S.; Adams, F. |
Quantitative X-ray fluorescence analysis at the ESRF ID18F microprobe |
2003 |
Nuclear instruments and methods: B |
199 |
|
UA library record; WoS full record; WoS citing articles |
|
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Wang, Y.; Sztranyovszky, Z.; Zilli, A.; Albrecht, W.; Bals, S.; Borri, P.; Langbein, W. |
Quantitatively linking morphology and optical response of individual silver nanohedra |
2022 |
Nanoscale |
14 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Sorée, B.; Magnus, W. |
Quantized conductance without reservoirs : method of the nonequilibrium statistical operator |
2007 |
Journal of computational electronics |
6 |
|
UA library record; WoS full record |
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Dong, H.M.; Xu, W.; Zeng, Z.; Lu, T.C.; Peeters, F.M. |
Quantum and transport conductivities in monolayer graphene |
2008 |
Physical review : B : condensed matter and materials physics |
77 |
31 |
UA library record; WoS full record; WoS citing articles |
|
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Yuan, H.F.; Xu, W.; Zhao, X.N.; Song, D.; Zhang, G.R.; Xiao, Y.M.; Ding, L.; Peeters, F.M. |
Quantum and transport mobilities of a Na3Bi-based three-dimensional Dirac system |
2019 |
Physical review B |
99 |
1 |
UA library record; WoS full record; WoS citing articles |
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