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  Author Title (up) Year Publication Volume Times cited Additional Links Links
Gijbels, R.; van Straaten, M.; Bogaerts, A. Mass spectrometric analysis of inorganic solids: GDMS and other methods 1995 Advances in mass spectrometry 13 12 UA library record; WoS full record; WoS citing articles
van der Snickt, G.; Miliani, C.; Janssens, K.; Brunetti, B.G.; Romani, A.; Rosi, F.; Walter, P.; Castaing, J.; de Nolf, W.; Klaassen, L.; Labarque, I.; Wittermann, R. Material analyses of “Christ with singing and music-making Angels”, a late 15th-C panel painting attributed to Hans Memling and assistants : part 1 : non-invasive in situ investigations 2011 Journal of analytical atomic spectrometry 26 32 UA library record; WoS full record; WoS citing articles doi
Delalieux, F.; Tsuji, K.; Wagatsuma, K.; Van Grieken, R. Material analysis methods applied to the study of ancient monuments, works of art and artefacts 2002 Materials transactions 43 UA library record; WoS full record; WoS citing articles doi
Clima, S.; Garbin, D.; Devulder, W.; Keukelier, J.; Opsomer, K.; Goux, L.; Kar, G.S.; Pourtois, G. Material relaxation in chalcogenide OTS SELECTOR materials 2019 Microelectronic engineering 215 1 UA library record; WoS full record; WoS citing articles pdf doi
Bogaerts, A.; Gijbels, R. Mathematical description of a direct current glow discharge in argon 1996 Fresenius' journal of analytical chemistry 355 12 UA library record; WoS full record; WoS citing articles
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. Matrix-enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films 2005 Rapid communications in mass spectrometry 19 24 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example 2005 Ultramicroscopy 104 37 UA library record; WoS full record; WoS citing articles pdf doi
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework 2005 Ultramicroscopy 104 70 UA library record; WoS full record; WoS citing articles pdf doi
Moura, V.N.; Chaves, A.; Peeters, F.M.; Milošević, M.V. McMillan-Ginzburg-Landau theory of singularities and discommensurations in charge density wave states of transition metal dichalcogenides 2024 Physical review B 109 UA library record; WoS full record url doi
Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy 2016 Ultramicroscopy 178 93 UA library record; WoS full record; WoS citing articles pdf url doi
Mahr, C.; Müller-Caspary, K.; Graf, M.; Lackmann, A.; Grieb, T.; Schowalter, M.; Krause, F.F.; Mehrtens, T.; Wittstock, A.; Weissmueller, J.; Rosenauer, A. Measurement of local crystal lattice strain variations in dealloyed nanoporous gold 2018 Materials research letters 6 4 UA library record; WoS full record; WoS citing articles doi
Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. Measurement of specimen thickness by phase change determination in TEM 2008 Ultramicroscopy 108 2 UA library record; WoS full record; WoS citing articles doi
Korneychuk, S.; Guzzinati, G.; Verbeeck, J. Measurement of the Indirect Band Gap of Diamond with EELS in STEM 2018 Physica status solidi : A : applications and materials science 215 6 UA library record; WoS full record; WoS citing articles pdf url doi
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. Measurement of the mean inner potential of ZnO nanorods by transmission electron holography 2005 Microscopy of Semiconducting Materials 107 UA library record; WoS full record; pdf
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R.; Waag, A. Measurement of the mean inner potential of ZnO nanorods by transmission electron holography 2005 Applied Physics Letters 86 5 UA library record; WoS full record; WoS citing articles doi
Hendrich, C.; Favre, L.; Ievlev, D.N.; Dobrynin, A.N.; Bras, W.; Hörmann, U.; Piscopiello, E.; Van Tendeloo, G.; Lievens, P.; Temst, K. Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering 2007 Applied physics A : materials science & processing 86 11 UA library record; WoS full record; WoS citing articles doi
Alföldy, B.; Lööv, J.B.; Lagler, F.; Bencs, L.; Horemans, B.; Van Grieken, R.; et al. Measurements of air pollution emission factors for marine transportation in SECA 2013 Atmospheric measurement techniques 6 UA library record; WoS full record; WoS citing articles url doi
Spiller, M. Measuring adaptive capacity of urban wastewater infrastructure : change impact and change propagation 2017 The science of the total environment 601-602 UA library record; WoS full record; WoS citing articles pdf doi
De wael, A.; De Backer, A.; Jones, L.; Varambhia, A.; Nellist, P.D.; Van Aert, S. Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy 2020 Physical Review Letters 124 UA library record; WoS full record; WoS citing articles pdf url doi
Van Passel, S.; Nevens, F.; Mathijs, E.; Van Huylenbroeck, G. Measuring farm sustainability and explaining differences in sustainable efficiency 2007 Ecological Economics 62 101 UA library record; WoS full record; WoS citing articles doi
Goris, B.; de Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, K.J.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Aert, S.; Bals, S.; Sijbers, J.; Van Tendeloo, G. Measuring lattice strain in three dimensions through electron microscopy 2015 Nano letters 15 87 UA library record; WoS full record; WoS citing articles pdf url doi
Felten, A.; Gillon, X.; Gulas, M.; Pireaux, J.-J.; Ke, X.; Van Tendeloo, G.; Bittencourt, C.; Najafi, E.; Hitchcock, A.P. Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy 2010 ACS nano 4 26 UA library record; WoS full record; WoS citing articles pdf doi
Biermans, E.; Molina, L.; Batenburg, K.J.; Bals, S.; Van Tendeloo, G. Measuring porosity at the nanoscale by quantitative electron tomography 2010 Nano letters 10 79 UA library record; WoS full record; WoS citing articles pdf doi
Schryvers, D.; Tirry, W.; Yang, Z.Q.; Measuring strain fields and concentration gradients around Ni4Ti3 precipitates 2006 Materials science and engineering A: structural materials properties microstructure and processing 438 35 UA library record; WoS full record; WoS citing articles pdf doi
Potapov, P.L.; Schryvers, D. Measuring the absolute position of EELS ionisation edges in a TEM 2004 Ultramicroscopy 99 29 UA library record; WoS full record; WoS citing articles doi
Kirilenko, D.A.; Dideykin, A.T.; Van Tendeloo, G. Measuring the corrugation amplitude of suspended and supported graphene 2011 Physical review : B : condensed matter and materials physics 84 31 UA library record; WoS full record; WoS citing articles url doi
Kirilenko, D.A.; Brunkov, P.N. Measuring the height-to-height correlation function of corrugation in suspended graphene 2016 Ultramicroscopy 165 3 pdf doi
Guzzinati, G.; Clark, L.; Béché, A.; Verbeeck, J. Measuring the orbital angular momentum of electron beams 2014 Physical review : A : atomic, molecular and optical physics 89 42 UA library record; WoS full record; WoS citing articles url doi
Hervieu, M.; Michel, C.; Martin, C.; Huvé, M.; Van Tendeloo, G.; Maignan, A.; Pelloquin, D.; Goutenoire, F.; Raveau, B. Mécanismes de la non-stoechiométrie dans les nouveaux supraconducteurs à haute Tc 1994 Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation 4 UA library record; WoS full record;
Çakir, D.; Peeters, F.M.; Sevik, C. Mechanical and thermal properties of h-MX2 (M = Cr, Mo, W; X = O, S, Se, Te) monolayers : a comparative study 2014 Applied physics letters 104 130 UA library record; WoS full record; WoS citing articles doi
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