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	Author	Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H.
	Title	Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example			Type	A1 Journal article
	Year	2005	Publication	Ultramicroscopy	Abbreviated Journal	Ultramicroscopy
	Volume	104	Issue	2	Pages	107-125
	Keywords	A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
	Abstract
	Address
	Corporate Author				Thesis
	Publisher		Place of Publication	Amsterdam	Editor
	Language		Wos	000230526400002	Publication Date	2005-04-08
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	0304-3991;	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor	2.843	Times cited	37	Open Access
	Notes				Approved	Most recent IF: 2.843; 2005 IF: 2.490
	Call Number	UA @ lucian @ c:irua:57131			Serial	1960
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