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Author |
Title |
Year |
Publication  |
Volume |
Times cited |
Additional Links |
Links |
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Rauwel, E.; Dubourdieu, C.; Holländer, B.; Rochat, N.; Ducroquet, F.; Rossell, M.D.; Van Tendeloo, G.; Pelissier, B. |
Stabilization of the cubic phase of HfO2 by Y addition in films grown by metal organic chemical vapor deposition |
2006 |
Applied physics letters |
89 |
78 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Dyck, D.; Croitoru, M.D. |
Statistical method for thickness measurement of amorphous objects |
2007 |
Applied physics letters |
90 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Santiso, J.; Pardo, J.A.; Solis, C.; Garcia, G.; Figueras, A.; Rossell, M.D.; Van Tendeloo, G. |
Strain relaxation and oxygen superstructure modulation in epitaxial Sr4Fe6O13\pm\delta films |
2005 |
Applied physics letters |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
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Leca, V.; Blank, D.H.A.; Rijnders, G.; Bals, S.; Van Tendeloo, G. |
Superconducting single-phase Sr1-xLaxCuO2 thin films with improved crystallinity grown by pulsed laser deposition |
2006 |
Applied physics letters |
89 |
32 |
UA library record; WoS full record; WoS citing articles |
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Chen, L.; Kirilenko, D.; Stesmans, A.; Nguyen, X.S.; Binnemans, K.; Goderis, B.; Vanacken, J.; Lebedev, O.; Van Tendeloo, G.; Moshchalkov, V.V. |
Symmetry and electronic states of Mn2+ in ZnS nanowires with mixed hexagonal and cubic stacking |
2010 |
Applied physics letters |
97 |
5 |
UA library record; WoS full record; WoS citing articles |
|
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|
Paul, M.; Kufer, D.; Müller, A.; Brück, S.; Goering, E.; Kamp, M.; Verbeeck, J.; Tian, H.; Van Tendeloo, G.; Ingle, N.J.C.; Sing, M.; Claessen, R. |
Fe3O4/ZnO : a high-quality magnetic oxide-semiconductor heterostructure by reactive deposition |
2011 |
Applied physics letters |
98 |
27 |
UA library record; WoS full record; WoS citing articles |
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Verbist, K.; Vasiliev, A.L.; Van Tendeloo, G. |
Y2O3 inclusions in YBa2Cu3O7-\delta thin films |
1995 |
Applied physics letters |
66 |
28 |
UA library record; WoS full record; WoS citing articles |
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Gontard, L.C.; Jinschek, J.R.; Ou, H.; Verbeeck, J.; Dunin-Borkowski, R.E. |
Three-dimensional fabrication and characterisation of core-shell nano-columns using electron beam patterning of Ge-doped SiO2 |
2012 |
Applied physics letters |
100 |
11 |
UA library record; WoS full record; WoS citing articles |
|
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Du, G.H.; Yuan, Z.Y.; Van Tendeloo, G. |
Transmission electron microscopy and electron energy-loss spectroscopy analysis of manganese oxide nanowires |
2005 |
Applied physics letters |
86 |
46 |
UA library record; WoS full record; WoS citing articles |
|
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Bals, S.; Van Tendeloo, G.; Salluzzo, M.; Maggio-Aprile, I. |
Why are sputter deposited Nd1+xBa2-xCu3O7-\delta thin films flatter than NdBa2Cu3O7-\delta films? |
2001 |
Applied physics letters |
79 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
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Béché, A.; Goris, B.; Freitag, B.; Verbeeck, J. |
Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy |
2016 |
Applied physics letters |
108 |
40 |
UA library record; WoS full record; WoS citing articles |
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Balasubramaniam, Y.; Pobedinskas, P.; Janssens, S.D.; Sakr, G.; Jomard, F.; Turner, S.; Lu, Y.G.; Dexters, W.; Soltani, A.; Verbeeck, J.; Barjon, J.; Nesládek, M.; Haenen, K.; |
Thick homoepitaxial (110)-oriented phosphorus-doped n-type diamond |
2016 |
Applied physics letters |
109 |
20 |
UA library record; WoS full record; WoS citing articles |
|
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M. K. Kinyanjui, N. Gauquelin, E. Benckiser, H. –U. Habermeier, B. Keimer, U. Kaiser and G.A. Botton |
Local lattice distortion and anisotropic modulation in Epitaxially Strained LaNiO3/LaAlO3 hetero-structures |
2014 |
Applied Physics Letters |
104 |
22 |
|
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|
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H. Zhang, N. Gauquelin, G.A. Botton and J.Y.T. Wei |
Attenuation of superconductivity in manganite/cuprate heterostructures by epitaxially induced CuO intergrowths |
2013 |
Applied Physics Letters |
103 |
12 |
|
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Jones, E.; Cooper, D.; Rouvière, J.-L.; Béché, A.; Azize, M.; Palacios, T.; Gradecak, S. |
Towards rapid nanoscale measurement of strain in III-nitride heterostructures |
2013 |
Applied Physics Letters |
103 |
6 |
UA library record; WoS full record; WoS citing articles |
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Cooper, D.; Rouvière, J.-L.; Béché, A.; Kadkhodazadeh, S.; Semenova, E.S.; Dunin-Borkowsk, R. |
Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography |
2011 |
Applied physics letters |
99 |
26 |
UA library record; WoS full record; WoS citing articles |
|
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Cooper, D.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy |
2012 |
Applied Physics Letters |
100 |
|
UA library record; WoS full record; WoS citing articles |
|
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Cooper, D.; Denneulin, T.; Barnes, J.-P.; Hartmann, J.-M.; Hutin, L.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy |
2012 |
Applied Physics Letters |
112 |
14 |
UA library record; WoS full record; WoS citing articles |
|
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Rouvière, J.-L.; Béché, A.; Martin, Y.; Denneulin, T.; Cooper, D. |
Improved strain precision with high spatial resolution using nanobeam precession electron diffraction |
2013 |
Applied physics letters |
103 |
53 |
UA library record; WoS full record; WoS citing articles |
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Zhou, Y.; Ramaneti, R.; Anaya, J.; Korneychuk, S.; Derluyn, J.; Sun, H.; Pomeroy, J.; Verbeeck, J.; Haenen, K.; Kuball, M. |
Thermal characterization of polycrystalline diamond thin film heat spreaders grown on GaN HEMTs |
2017 |
Applied physics letters |
111 |
78 |
UA library record; WoS full record; WoS citing articles |
|
|
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Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. |
Spectroscopic coincidence experiments in transmission electron microscopy |
2019 |
Applied physics letters |
114 |
18 |
UA library record; WoS full record; WoS citing articles |
|
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Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. |
Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping |
2019 |
Applied physics letters |
114 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
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Wang, J.; Gauquelin, N.; Huijben, M.; Verbeeck, J.; Rijnders, G.; Koster, G. |
Metal-insulator transition of SrVO 3 ultrathin films embedded in SrVO 3 / SrTiO 3 superlattices |
2020 |
Applied Physics Letters |
117 |
8 |
UA library record; WoS full record; WoS citing articles |
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Gao, C.; Hofer, C.; Jannis, D.; Béché, A.; Verbeeck, J.; Pennycook, T.J. |
Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science |
2022 |
Applied physics letters |
121 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
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Jannis, D.; Müller-Caspary, K.; Béché, A.; Verbeeck, J. |
Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope |
2021 |
Applied Sciences-Basel |
11 |
9 |
UA library record; WoS full record; WoS citing articles |
|
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Muret, P.; Nguyen, T.T.A.; Frangis, N.; Van Tendeloo, G.; van Landuyt, J. |
Photoelectric and electrical responses of several erbium silicide/silicon interfaces |
1996 |
Applied surface science
T2 – International Symposium on Si Heterostructures – From Physics to Devices, SEP 11-14, 1995, IRAKLION, GREECE |
102 |
3 |
UA library record; WoS full record; WoS citing articles |
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Vanhellemont, J.; Maes, H.E.; Schaekers, M.; Armigliato, A.; Cerva, H.; Cullis, A.; de Sande, J.; Dinges, H.; Hallais, J.; Nayar, V.; Pickering, C.; Stehlé, J.L.; Van Landuyt, J.; Walker, C.; Werner, H.; Salieri, P.; |
Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry |
1993 |
Applied surface science
T2 – SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE |
63 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
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Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. |
Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate |
1996 |
Applied surface science |
102 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G.; Frangis, N.; van Landuyt, J. |
High crystalline quality erbium silicide films on (100) silicon grown in high vacuum |
1996 |
Applied surface science |
102 |
14 |
UA library record; WoS full record; WoS citing articles |
|
|
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Vasiliev, A.L.; Stepantsov, E.A.; Ivanov, Z.G.; Verbist, K.; Van Tendeloo, G.; Olsson, E. |
The microstructure and interfaces of intermediate layers in sapphire bicrystals |
1997 |
Applied surface science |
119 |
2 |
UA library record; WoS full record; WoS citing articles |
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