| |
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Lobato, I.; De Backer, A.; Van Aert, S. |
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network |
2023 |
Ultramicroscopy |
251 |
|
UA library record; WoS full record |
|
|
|
Şentürk, DG.; Yu, CP.; De Backer, A.; Van Aert, S. |
Atom counting from a combination of two ADF STEM images |
2024 |
Ultramicroscopy |
255 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
De Backer, A.; Bals, S.; Van Aert, S. |
A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection |
2023 |
Ultramicroscopy |
|
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Schattschneider, P.; Stöger-Pollach, M.; Löffler, S.; Steiger-Thirsfeld, A.; Hell, J.; Verbeeck, J. |
Sub-nanometer free electrons with topological charge |
2012 |
Ultramicroscopy |
115 |
24 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vanrompay, H.; Skorikov, A.; Bladt, E.; Béché, A.; Freitag, B.; Verbeeck, J.; Bals, S. |
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges |
2021 |
Ultramicroscopy |
221 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. |
Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution |
2022 |
Ultramicroscopy |
233 |
|
UA library record; WoS full record; WoS citing articles |
|
