Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Gauquelin, N.; van den Bos, K.H.W.; Béché, A.; Krause, F.F.; Lobato, I.; Lazar, S.; Rosenauer, A.; Van Aert, S.; Verbeeck, J. |
Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques |
2017 |
Ultramicroscopy |
181 |
34 |
UA library record; WoS full record; WoS citing articles |
De wael, A.; De Backer, A.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Hybrid statistics-simulations based method for atom-counting from ADF STEM images |
2017 |
Ultramicroscopy |
177 |
8 |
UA library record; WoS full record; WoS citing articles |
Zhong, Z.; Aveyard, R.; Rieger, B.; Bals, S.; Palenstijn, W.J.; Batenburg, K.J. |
Automatic correction of nonlinear damping effects in HAADF-STEM tomography for nanomaterials of discrete compositions |
2018 |
Ultramicroscopy |
184 |
8 |
UA library record; WoS full record; WoS citing articles |
Schryvers, D.; Salje, E.K.H.; Nishida, M.; De Backer, A.; Idrissi, H.; Van Aert, S. |
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations |
2017 |
Ultramicroscopy |
176 |
1 |
UA library record; WoS full record; WoS citing articles |
Verbeeck, J.; Béché, A.; Müller-Caspary, K.; Guzzinati, G.; Luong, M.A.; Den Hertog, M. |
Demonstration of a 2 × 2 programmable phase plate for electrons |
2018 |
Ultramicroscopy |
190 |
73 |
UA library record; WoS full record; WoS citing articles |
van den Bos, K.H.W.; Janssens, L.; De Backer, A.; Nellist, P.D.; Van Aert, S. |
The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials |
2019 |
Ultramicroscopy |
203 |
4 |
UA library record; WoS full record; WoS citing articles |
Fatermans, J.; Van Aert, S.; den Dekker, A.J. |
The maximum a posteriori probability rule for atom column detection from HAADF STEM images |
2019 |
Ultramicroscopy |
201 |
1 |
UA library record; WoS full record; WoS citing articles |
Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. |
Evaluation of different rectangular scan strategies for STEM imaging |
2020 |
Ultramicroscopy |
|
13 |
UA library record; WoS full record; WoS citing articles |
Fatermans, J.; den Dekker, Aj.; Müller-Caspary, K.; Gauquelin, N.; Verbeeck, J.; Van Aert, S. |
Atom column detection from simultaneously acquired ABF and ADF STEM images |
2020 |
Ultramicroscopy |
219 |
9 |
UA library record; WoS full record; WoS citing articles |
Prabhakara, V.; Jannis, D.; Guzzinati, G.; Béché, A.; Bender, H.; Verbeeck, J. |
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale |
2020 |
Ultramicroscopy |
219 |
4 |
UA library record; WoS full record; WoS citing articles |
Vanrompay, H.; Skorikov, A.; Bladt, E.; Béché, A.; Freitag, B.; Verbeeck, J.; Bals, S. |
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges |
2021 |
Ultramicroscopy |
221 |
15 |
UA library record; WoS full record; WoS citing articles |
De wael, A.; De Backer, A.; Van Aert, S. |
Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations |
2020 |
Ultramicroscopy |
219 |
|
UA library record; WoS full record; WoS citing articles |
Li, C.; Tardajos, A.P.; Wang, D.; Choukroun, D.; Van Daele, K.; Breugelmans, T.; Bals, S. |
A simple method to clean ligand contamination on TEM grids |
2021 |
Ultramicroscopy |
221 |
10 |
UA library record; WoS full record; WoS citing articles |
De wael, A.; De Backer, A.; Lobato, I.; Van Aert, S. |
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt |
2021 |
Ultramicroscopy |
|
|
UA library record; WoS full record; WoS citing articles |
Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings |
2022 |
Ultramicroscopy |
232 |
18 |
UA library record; WoS full record; WoS citing articles |
Koo, J.; Dahl, A.B.; Bærentzen, J.A.; Chen, Q.; Bals, S.; Dahl, V.A. |
Shape from projections via differentiable forward projector for computed tomography |
2021 |
Ultramicroscopy |
224 |
3 |
UA library record; WoS full record; WoS citing articles |
Jannis, D.; Hofer, C.; Gao, C.; Xie, X.; Béché, A.; Pennycook, Tj.; Verbeeck, J. |
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications |
2022 |
Ultramicroscopy |
233 |
31 |
UA library record; WoS full record; WoS citing articles |
Hofer, C.; Pennycook, T.J. |
Reliable phase quantification in focused probe electron ptychography of thin materials |
2023 |
Ultramicroscopy |
254 |
|
UA library record; WoS full record; WoS citing articles |
Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. |
Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution |
2022 |
Ultramicroscopy |
233 |
|
UA library record; WoS full record; WoS citing articles |
Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process |
2022 |
Ultramicroscopy |
|
4 |
UA library record; WoS full record; WoS citing articles |
Hofer, C.; Gao, C.; Chennit, T.; Yuan, B.; Pennycook, T.J. |
Phase offset method of ptychographic contrast reversal correction |
2024 |
Ultramicroscopy |
|
|
UA library record; WoS full record |
Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S. |
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors |
2022 |
Ultramicroscopy |
242 |
|
UA library record; WoS full record; WoS citing articles |
Lobato, I.; De Backer, A.; Van Aert, S. |
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network |
2023 |
Ultramicroscopy |
251 |
|
UA library record; WoS full record |
Denisov, N.; Jannis, D.; Orekhov, A.; Müller-Caspary, K.; Verbeeck, J. |
Characterization of a Timepix detector for use in SEM acceleration voltage range |
2023 |
Ultramicroscopy |
253 |
|
UA library record; WoS full record |
Şentürk, DG.; Yu, CP.; De Backer, A.; Van Aert, S. |
Atom counting from a combination of two ADF STEM images |
2024 |
Ultramicroscopy |
255 |
|
UA library record; WoS full record; WoS citing articles |
Van den Broek, W.; Jannis, D.; Verbeeck, J. |
Convexity constraints on linear background models for electron energy-loss spectra |
2023 |
Ultramicroscopy |
254 |
|
UA library record |
Şentürk, D.G.; De Backer, A.; Van Aert, S. |
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination |
2024 |
Ultramicroscopy |
259 |
|
UA library record |
van Aarle, W.; Palenstijn, W.J.; De Beenhouwer, J.; Altantzis, T.; Bals, S.; Batenburg, K.J.; Sijbers, J. |
The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography |
2015 |
Ultramicroscopy |
157 |
562 |
UA library record; WoS full record; WoS citing articles |
Lobato, I.; Van Aert, S.; Verbeeck, J. |
Progress and new advances in simulating electron microscopy datasets using MULTEM |
2016 |
Ultramicroscopy |
168 |
43 |
UA library record; WoS full record; WoS citing articles |
Béché, A.; Juchtmans, R.; Verbeeck, J. |
Efficient creation of electron vortex beams for high resolution STEM imaging |
2017 |
Ultramicroscopy |
178 |
30 |
UA library record; WoS full record; WoS citing articles |