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Author Title Year Publication Volume Times cited Additional Links
Heidari Mezerji, H.; van den Broek, W.; Bals, S. A practical method to determine the effective resolution in incoherent experimental electron tomography 2011 Ultramicroscopy 111 26 UA library record; WoS full record; WoS citing articles
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis 2003 Institute of physics conference series UA library record; WoS full record;
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy 2009 Ultramicroscopy 109 166 UA library record; WoS full record; WoS citing articles
Bals, S.; Batenburg, K.J.; Liang, D.; Lebedev, O.; Van Tendeloo, G.; Aerts, A.; Martens, J.A.; Kirschhock, C.E. Quantitative three-dimensional modeling of zeotile through discrete electron tomography 2009 Journal of the American Chemical Society 131 58 UA library record; WoS full record; WoS citing articles
Bals, S.; Batenburg, J.; Verbeeck, J.; Sijbers, J.; Van Tendeloo, G. Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes 2007 Nano letters 7 78 UA library record; WoS full record; WoS citing articles
Malladi, S.K.; Xu, Q.; van Huis, M.A.; Tichelaar, F.D.; Batenburg, K.J.; Yucelen, E.; Dubiel, B.; Czyrska-Filemonowicz, A.; Zandbergen, H.W. Real-time atomic scale imaging of nanostructural evolution in aluminum alloys 2014 Nano Letters 14 12 UA library record; WoS full record; WoS citing articles
Van Aert, S.; van Dyck, D.; den Dekker, A.J. Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative 2006 Optics express 14 45 UA library record; WoS full record; WoS citing articles
Bals, S.; Casavola, M.; van Huis, M.A.; Van Aert, S.; Batenburg, K.J.; Van Tendeloo, G.; Vanmaekelbergh, D. Three-dimensional atomic imaging of colloidal core-shell nanocrystals 2011 Nano letters 11 121 UA library record; WoS full record; WoS citing articles
Van Aert, S.; Batenburg, K.J.; Rossell, M.D.; Erni, R.; Van Tendeloo, G. Three-dimensional atomic imaging of crystalline nanoparticles 2011 Nature 470 341 UA library record; WoS full record; WoS citing articles
Leroux, F.; Gysemans, M.; Bals, S.; Batenburg, K.J.; Snauwaert, J.; Verbiest, T.; van Haesendonck, C.; Van Tendeloo, G. Three-dimensional characterization of helical silver nanochains mediated by protein assemblies 2010 Advanced materials 22 51 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Verbeeck, J.; Schryvers, D.; de Backer, S.; Scheunders, P. Tomographic spectroscopic imaging; an experimental proof of concept 2009 Ultramicroscopy 109 1 UA library record; WoS full record; WoS citing articles
Van Tendeloo, G.; op de Beeck, M.; De Meulenaere, P.; van Dyck, D. Towards quantitative high resolution electron microscopy? 1995 Institute of physics conference series 147 UA library record; WoS full record;
Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. Ultra-high resolution electron tomography for materials science : a roadmap 2011 Microscopy and microanalysis 17 UA library record
Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S. Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp 1994 MRS bulletin UA library record; WoS full record;
van Aarle, W.; Palenstijn, W.J.; De Beenhouwer, J.; Altantzis, T.; Bals, S.; Batenburg, K.J.; Sijbers, J. The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography 2015 Ultramicroscopy 157 562 UA library record; WoS full record; WoS citing articles
Tsai, C.-Y.; Chang, Y.-C.; Lobato, I.; Van Dyck, D.; Chen, F.-R. Hollow Cone Electron Imaging for Single Particle 3D Reconstruction of Proteins 2016 Scientific reports 6 UA library record; WoS full record; WoS citing articles
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design 2016 Ultramicroscopy 170 6 UA library record; WoS full record; WoS citing articles
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images 2016 Ultramicroscopy 171 43 UA library record; WoS full record; WoS citing articles
Lobato, I.; Van Dyck, D. MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA 2015 Ultramicroscopy 156 32 UA library record; WoS full record; WoS citing articles
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question 2016 Ultramicroscopy 174 2 UA library record; WoS full record; WoS citing articles
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? 2017 Ultramicroscopy 181 3 UA library record; WoS full record; WoS citing articles
Pourbabak, S.; Wang, X.; Van Dyck, D.; Verlinden, B.; Schryvers, D. Ni cluster formation in low temperature annealed Ni50.6Ti49.4 2017 Functional materials letters 10 4 UA library record; WoS full record; WoS citing articles
Fatermans, J.; den Dekker, A. J.; Müller-Caspary, K.; Lobato, I.; O’Leary, C. M.; Nellist, P. D.; Van Aert, S. Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images 2018 Physical review letters 121 6 UA library record; WoS full record; WoS citing articles
Fatermans, J.; Van Aert, S.; den Dekker, A.J. The maximum a posteriori probability rule for atom column detection from HAADF STEM images 2019 Ultramicroscopy 201 1 UA library record; WoS full record; WoS citing articles
Fatermans, J.; den Dekker, Aj.; Müller-Caspary, K.; Gauquelin, N.; Verbeeck, J.; Van Aert, S. Atom column detection from simultaneously acquired ABF and ADF STEM images 2020 Ultramicroscopy 219 9 UA library record; WoS full record; WoS citing articles
Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution 2022 Ultramicroscopy 233 UA library record; WoS full record; WoS citing articles
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. Advanced electron crystallography through model-based imaging 2016 IUCrJ 3 30 UA library record; WoS full record; WoS citing articles
Van Eyndhoven, G.; Kurttepeli, M.; van Oers, C.J.; Cool, P.; Bals, S.; Batenburg, K.J.; Sijbers, J. Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials 2015 Ultramicroscopy 148 7 UA library record; WoS full record; WoS citing articles
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. Measurement of the mean inner potential of ZnO nanorods by transmission electron holography 2005 Microscopy of Semiconducting Materials 107 UA library record; WoS full record;
Macke, S.; Radi, A.; Hamann-Borrero, J.E.; Verna, A.; Bluschke, M.; Brück, S.; Goering, E.; Sutarto, R.; He, F.; Cristiani, G.; Wu, M.; Benckiser, E.; Habermeier, H.-U.; Logvenov, G.; Gauquelin, N.; Botton, G.A; Kajdos, A.P.; Stemmer, S.; Sawatzky,G.A.; Haverkort, M.W.; Keimer, B.; Hinkov, V. Element Specific Monolayer Depth Profiling 2014 Advanced Materials 26 34