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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Savchenko, T.M.; Buzzi, M.; Howald, L.; Ruta, S.; Vijayakumar, J.; Timm, M.; Bracher, D.; Saha, S.; Derlet, P.M.; Béché, A.; Verbeeck, J.; Chantrell, R.W.; Vaz, C.A.F.; Nolting, F.; Kleibert, A. |
Single femtosecond laser pulse excitation of individual cobalt nanoparticles |
2020 |
Physical Review B |
102 |
1 |
UA library record; WoS full record |
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|
|
Béché, A.; Goris, B.; Freitag, B.; Verbeeck, J. |
Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy |
2016 |
Applied physics letters |
108 |
40 |
UA library record; WoS full record; WoS citing articles |
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|
|
Jones, E.; Cooper, D.; Rouvière, J.-L.; Béché, A.; Azize, M.; Palacios, T.; Gradecak, S. |
Towards rapid nanoscale measurement of strain in III-nitride heterostructures |
2013 |
Applied Physics Letters |
103 |
6 |
UA library record; WoS full record; WoS citing articles |
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|
Cooper, D.; Rouvière, J.-L.; Béché, A.; Kadkhodazadeh, S.; Semenova, E.S.; Dunin-Borkowsk, R. |
Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography |
2011 |
Applied physics letters |
99 |
26 |
UA library record; WoS full record; WoS citing articles |
|
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|
Cooper, D.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy |
2012 |
Applied Physics Letters |
100 |
|
UA library record; WoS full record; WoS citing articles |
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Cooper, D.; Denneulin, T.; Barnes, J.-P.; Hartmann, J.-M.; Hutin, L.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy |
2012 |
Applied Physics Letters |
112 |
14 |
UA library record; WoS full record; WoS citing articles |
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Rouvière, J.-L.; Béché, A.; Martin, Y.; Denneulin, T.; Cooper, D. |
Improved strain precision with high spatial resolution using nanobeam precession electron diffraction |
2013 |
Applied physics letters |
103 |
53 |
UA library record; WoS full record; WoS citing articles |
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Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. |
Spectroscopic coincidence experiments in transmission electron microscopy |
2019 |
Applied physics letters |
114 |
18 |
UA library record; WoS full record; WoS citing articles |
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Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. |
Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping |
2019 |
Applied physics letters |
114 |
17 |
UA library record; WoS full record; WoS citing articles |
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|
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Guzzinati, G.; Clark, L.; Béché, A.; Verbeeck, J. |
Measuring the orbital angular momentum of electron beams |
2014 |
Physical review : A : atomic, molecular and optical physics |
89 |
42 |
UA library record; WoS full record; WoS citing articles |
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Clark, L.; Béché, A.; Guzzinati, G.; Verbeeck, J. |
Quantitative measurement of orbital angular momentum in electron microscopy |
2014 |
Physical review : A : atomic, molecular and optical physics |
89 |
23 |
UA library record; WoS full record; WoS citing articles |
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Clark, L.; Guzzinati, G.; Béché, A.; Lubk, A.; Verbeeck, J. |
Symmetry-constrained electron vortex propagation |
2016 |
Physical review A |
93 |
7 |
UA library record; WoS full record; WoS citing articles |
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de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. |
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting |
2015 |
Ultramicroscopy |
151 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
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Verbeeck, J.; Béché, A.; van den Broek, W. |
A holographic method to measure the source size broadening in STEM |
2012 |
Ultramicroscopy |
120 |
29 |
UA library record; WoS full record; WoS citing articles |
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Verbeeck, J.; Tian, H.; Béché, A. |
A new way of producing electron vortex probes for STEM |
2012 |
Ultramicroscopy |
113 |
62 |
UA library record; WoS full record; WoS citing articles |
|
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Guzzinati, G.; Clark, L.; Béché, A.; Juchtmans, R.; Van Boxem, R.; Mazilu, M.; Verbeeck, J. |
Prospects for versatile phase manipulation in the TEM : beyond aberration correction |
2015 |
Ultramicroscopy |
151 |
19 |
UA library record; WoS full record; WoS citing articles |
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Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. |
Quantitative STEM normalisation : the importance of the electron flux |
2015 |
Ultramicroscopy |
159 |
27 |
UA library record; WoS full record; WoS citing articles |
|
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Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. |
Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography |
2013 |
Ultramicroscopy |
131 |
73 |
UA library record; WoS full record; WoS citing articles |
|
|
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Béché, A.; Juchtmans, R.; Verbeeck, J. |
Efficient creation of electron vortex beams for high resolution STEM imaging |
2017 |
Ultramicroscopy |
178 |
30 |
UA library record; WoS full record; WoS citing articles |
|
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Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. |
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy |
2016 |
Ultramicroscopy |
178 |
93 |
UA library record; WoS full record; WoS citing articles |
|
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van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. |
Locating light and heavy atomic column positions with picometer precision using ISTEM |
2016 |
Ultramicroscopy |
172 |
8 |
UA library record; WoS full record; WoS citing articles |
|
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Béché, A.; Rouvière, J.L.; Barnes, J.P.; Cooper, D. |
Dark field electron holography for strain measurement |
2011 |
Ultramicroscopy |
111 |
31 |
UA library record; WoS full record; WoS citing articles |
|
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Gauquelin, N.; van den Bos, K.H.W.; Béché, A.; Krause, F.F.; Lobato, I.; Lazar, S.; Rosenauer, A.; Van Aert, S.; Verbeeck, J. |
Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques |
2017 |
Ultramicroscopy |
181 |
34 |
UA library record; WoS full record; WoS citing articles |
|
|
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Verbeeck, J.; Béché, A.; Müller-Caspary, K.; Guzzinati, G.; Luong, M.A.; Den Hertog, M. |
Demonstration of a 2 × 2 programmable phase plate for electrons |
2018 |
Ultramicroscopy |
190 |
73 |
UA library record; WoS full record; WoS citing articles |
|
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Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. |
Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose |
2019 |
Ultramicroscopy |
203 |
25 |
UA library record; WoS full record; WoS citing articles |
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Vanrompay, H.; Skorikov, A.; Bladt, E.; Béché, A.; Freitag, B.; Verbeeck, J.; Bals, S. |
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges |
2021 |
Ultramicroscopy |
221 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
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Vega Ibañez, F.; Béché, A.; Verbeeck, J. |
Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? |
2022 |
Microscopy and microanalysis |
|
3 |
UA library record; WoS full record; WoS citing articles |
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Denneulin, T.; Rouvière, J.L.; Béché, A.; Py, M.; Barnes, J.P.; Rochat, N.; Hartmann, J.M.; Cooper, D. |
The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography |
2011 |
Semiconductor science and technology |
26 |
|
UA library record; WoS full record; WoS citing articles |
|
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Prabhakara, V.; Jannis, D.; Béché, A.; Bender, H.; Verbeeck, J. |
Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique |
2019 |
Semiconductor science and technology |
|
8 |
UA library record; WoS full record; WoS citing articles |
|
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Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. |
Evaluation of different rectangular scan strategies for STEM imaging |
2020 |
Ultramicroscopy |
|
13 |
UA library record; WoS full record; WoS citing articles |
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