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| Author | Wang, H.; Cuppens, J.; Biermans, E.; Bals, S.; Fernandez-Ballester, L.; Kvashnina, K.O.; Bras, W.; van Bael, M.J.; Temst, K.; Vantomme, A. | ||||
| Title | Tuning of the size and the lattice parameter of ion-beam synthesized Pb nanoparticles embedded in Si | Type | A1 Journal article | ||
| Year | 2012 | Publication | Journal of physics: D: applied physics | Abbreviated Journal | J Phys D Appl Phys |
| Volume | 45 | Issue | 3 | Pages | 035301-035301,7 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | The size and lattice constant evolution of Pb nanoparticles (NPs) synthesized by high fluence implantation in crystalline Si have been studied with a variety of experimental techniques. Results obtained from small-angle x-ray scattering showed that the Pb NPs grow with increasing implantation fluence and annealing duration. The theory of NP growth kinetics can be applied to qualitatively explain the size evolution of the Pb NPs during the implantation and annealing processes. Moreover, the lattice constant of the Pb NPs was evaluated by conventional x-ray diffraction. The lattice dilatation was observed to decrease with increasing size of the Pb NPs. Such lattice constant tuning can be attributed to the pseudomorphism caused by the lattice mismatch between the Pb NPs and the Si matrix. | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | London | Editor | ||
| Language | Wos | 000299308400008 | Publication Date | 2011-12-23 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0022-3727;1361-6463; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor  |
2.588 | Times cited | 5 | Open Access | |
| Notes | Fwo; Iap | Approved | Most recent IF: 2.588; 2012 IF: 2.528 | ||
| Call Number | UA @ lucian @ c:irua:94208 | Serial | 3754 | ||
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| Author | Monticelli, O.; Musina, Z.; Russo, S.; Bals, S. | ||||
| Title | On the use of TEM in the characterization of nanocomposites | Type | A1 Journal article | ||
| Year | 2007 | Publication | Materials letters | Abbreviated Journal | Mater Lett |
| Volume | 61 | Issue | 16 | Pages | 3446-3450 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | Both an organically modified commercial clay of montmorillonite type (MMT) and its nanocomposites, based either on polyamide 6 (PA6) or an epoxy resin, as matrix polymer, have been characterized by transmission electron microscopy (TEM). Sample micrographs, taken at increasing exposure times (t(e)), have shown the gradual disappearance of clay layers, because of an amorphisation of the MMT crystalline structures caused by prolonged sample exposure to electron beam. Indeed, the above phenomenon, which is mostly evident in the case of intercalated nanocomposites, makes the detection of the layered silicate dispersion in the polymer matrix rather difficult and compels to perform TEM measurements using very short exposure times. Moreover, the microscopy accelerating voltage has turned out to affect sample stability; namely, when decreasing the above parameter, the disappearance of clay structure occurs at lower exposure times. (C) 2006 Elsevier B.V. All rights reserved. | ||||
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| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000247146100034 | Publication Date | 2006-12-06 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0167-577X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
2.572 | Times cited | 28 | Open Access | |
| Notes | Approved | Most recent IF: 2.572; 2007 IF: 1.625 | |||
| Call Number | UA @ lucian @ c:irua:64757 | Serial | 2460 | ||
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| Author | Avila-Brande, D.; Otero-Díaz, L.C.; Landa-Cánovas, A.R.; Bals, S.; Van Tendeloo, G. | ||||
| Title | A new Bi4Mn1/3W2/3O8Cl Sillén-Aurivillius intergrowth: synthesis and structural characterisation by quantitative transmission electron microscopy | Type | A1 Journal article | ||
| Year | 2006 | Publication | European journal of inorganic chemistry | Abbreviated Journal | Eur J Inorg Chem |
| Volume | Issue | 9 | Pages | 1853-1858 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | The synthesis and structural characterisation of a new phase with nominal composition Bi4Mn1/3W2/3O8Cl is presented. Conventional and analytical transmission electron microscopy are used to determine the composition, unit-cell symmetry and space group of the compound, whereas a structural model is deducted by exit-wave reconstruction in the transmission electron microscope. This technique allows the microscope information limit of 1.1 angstrom to be reached and the (light) oxygen atoms in the presence of heavier atoms (Bi, W, Mn) to be imaged. The average structure is refined from Xray powder diffraction data using the Rietveld method yielding an orthorhombic unit cell with lattice parameters a 5.467(4) angstrom, b = 5.466(7) angstrom and c = 14.159(3) angstrom and space group Cm2m, which could be described as a Sillen-Aurivillius intergrowth. ((c) Wiley-VCH Verlag GmbH & Co. KGaA, 69451 Weinheim, Germany, 2006) | ||||
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| Publisher | Place of Publication | Weinheim | Editor | ||
| Language | Wos | 000237617800016 | Publication Date | 2006-03-13 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1434-1948;1099-0682; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
2.444 | Times cited | 12 | Open Access | |
| Notes | Approved | Most recent IF: 2.444; 2006 IF: 2.704 | |||
| Call Number | UA @ lucian @ c:irua:59436 | Serial | 2335 | ||
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| Author | Loreto, S.; Vanrompay, H.; Mertens, M.; Bals, S.; Meynen, V. | ||||
| Title | The influence of acids on tuning the pore size of mesoporous TiO2 templated by non-ionic block copolymers | Type | A1 Journal article | ||
| Year | 2018 | Publication | European journal of inorganic chemistry | Abbreviated Journal | Eur J Inorg Chem |
| Volume | 2018 | Issue | 2018 | Pages | 62-65 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Laboratory of adsorption and catalysis (LADCA) | ||||
| Abstract | <script type='text/javascript'>document.write(unpmarked('We show the possibility to tune the pore size of mesoporous TiO2 templated by non-ionic block copolymers by adding different inorganic acids at well-chosen concentration. The effect of the inorganic anions on both the TiO2 cluster formation and the non-ionic block copolymers micelles is investigated to explain the experimental results.')); | ||||
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| Publisher | Place of Publication | Weinheim | Editor | ||
| Language | Wos | 000419706000008 | Publication Date | 2017-12-19 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1434-1948 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
2.444 | Times cited | 6 | Open Access | OpenAccess |
| Notes | ; This work was supported by the Research Foundation-Flanders (FWO) (grant G.0687.13) and the University of Antwerp (BOF project). Hans Vanrompay gratefully acknowledges financial support by the Flemish Fund for Scientific Research (FWO grant 1S32617N). Sara Bals acknowledges financial support from European Research Council (ERC Starting Grant #335078-COLOURATOMS). ; ecas_Sara | Approved | Most recent IF: 2.444 | ||
| Call Number | UA @ lucian @ c:irua:147897UA @ admin @ c:irua:147897 | Serial | 4881 | ||
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| Author | Jain, N.; Hao, Y.; Parekh, U.; Kaltenegger, M.; Pedrazo-Tardajos, A.; Lazzaroni, R.; Resel, R.; Geerts, Y.H.; Bals, S.; Van Aert, S. | ||||
| Title | Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals | Type | A1 Journal article | ||
| Year | 2023 | Publication | Micron | Abbreviated Journal | |
| Volume | 169 | Issue | Pages | 103444 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | High-resolution transmission electron microscopy (TEM) of organic crystals, such as Lead Phthalocyanine (PbPc), is very challenging since these materials are prone to electron beam damage leading to the breakdown of the crystal structure during investigation. Quantification of the damage is imperative to enable high-resolution imaging of PbPc crystals with minimum structural changes. In this work, we performed a detailed electron diffraction study to quantitatively measure degradation of PbPc crystals upon electron beam irradiation. Our study is based on the quantification of the fading intensity of the spots in the electron diffraction patterns. At various incident dose rates (e/Å2/s) and acceleration voltages, we experimentally extracted the decay rate (1/s), which directly correlates with the rate of beam damage. In this manner, a value for the critical dose (e/Å2) could be determined, which can be used as a measure to quantify beam damage. Using the same methodology, we explored the influence of cryogenic temperatures, graphene TEM substrates, and graphene encapsulation in prolonging the lifetime of the PbPc crystal structure during TEM investigation. The knowledge obtained by diffraction experiments is then translated to real space high-resolution TEM imaging of PbPc. | ||||
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| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000965998800001 | Publication Date | 2023-03-21 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0968-4328 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
2.4 | Times cited | 1 | Open Access | OpenAccess |
| Notes | This work is supported by FWO and FNRS within the 2Dto3D network of the EOS (Excellence of Science) program (grant number 30489208) and ERC-CoGREALNANO-815128 (to Prof. Dr. Sara Bals). N.J. would like to thank Dr. Kunal S. Mali and Dr. Da Wang for useful and interesting discussions on sample preparation procedures. | Approved | Most recent IF: 2.4; 2023 IF: 1.98 | ||
| Call Number | EMAT @ emat @c:irua:196069 | Serial | 7379 | ||
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| Author | Krsmanovic, R.; Bals, S.; Bertoni, G.; Van Tendeloo, G. | ||||
| Title | Structural characterization of Er-doped Li2O-Al2O3-SiO2 glass ceramics | Type | A1 Journal article | ||
| Year | 2008 | Publication | Optical materials | Abbreviated Journal | Opt Mater |
| Volume | 30 | Issue | 7 | Pages | 1183-1188 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | Particularly favourable properties of glass ceramics are developed on the basis of two key advantages of these materials: the variation of chemical composition and of microstructure. Therefore, detailed structural and chemical information are necessary to get insight in novel glass ceramic materials. We present here two examples of Er-doped Li2O-Al2O3-SiO2, with different quantities of ZrO2, both obtained with sol-gel synthesis. Different transmission electron microscopy techniques: conventional TEM, HRTEM, and EELS are used and the results are compared with those previously obtained with XRD and Rietveld analysis. We also demonstrate the 3D reconstruction, obtained from HAADF-STEM imaging, to determine the morphology of nanosize precipitates in these composites. (c) 2007 Elsevier B.V. All rights reserved. | ||||
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| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000254419100035 | Publication Date | 2007-07-11 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0925-3467; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
2.238 | Times cited | 12 | Open Access | |
| Notes | Iap-V1; Esteem | Approved | Most recent IF: 2.238; 2008 IF: 1.714 | ||
| Call Number | UA @ lucian @ c:irua:70004 | Serial | 3219 | ||
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| Author | De Backer, A.; Bals, S.; Van Aert, S. | ||||
| Title | A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection | Type | A1 Journal article | ||
| Year | 2023 | Publication | Ultramicroscopy | Abbreviated Journal | |
| Volume | Issue | Pages | 113702 | ||
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | Quantitative structure determination is needed in order to study and understand nanomaterials at the atomic scale. Materials characterisation resulting in precise structural information is a crucial point to understand the structure–property relation of materials. Counting the number of atoms and retrieving the 3D atomic structure of nanoparticles plays an important role here. In this paper, an overview will be given of the atom-counting methodology and its applications over the past decade. The procedure to count the number of atoms will be discussed in detail and it will be shown how the performance of the method can be further improved. Furthermore, advances toward mixed element nanostructures, 3D atomic modelling based on the atom-counting results, and quantifying the nanoparticle dynamics will be highlighted. | ||||
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| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000953765800001 | Publication Date | 2023-02-10 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
2.2 | Times cited | 3 | Open Access | OpenAccess |
| Notes | This work was supported by the European Research Council (Grant 770887 PICOMETRICS to S. Van Aert, Grant 815128 REALNANO to S. Bals, and Grant 823717 ESTEEM3). The authors acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through project fundings (G.0267.18N, G.0502.18N, G.0346.21N, and EOS 30489208) and a postdoctoral grant to A. De Backer. S. Van Aert acknowledges funding from the University of Antwerp Research fund (BOF) . The authors also thank the colleagues who have contributed to this work over the years, including T. Altantzis, E. Arslan Irmak, K.J. Batenburg, E. Bladt, A. De wael, R. Erni, C. Faes, B. Goris, L. Jones, L.M. Liz-Marzán, I. Lobato, G.T. Martinez, P.D. Nellist, M.D. Rosell, A. Rosenauer, K.H.W. van den Bos, A. Varambhia, and Z. Zhang.; esteem3reported; esteem3JRA | Approved | Most recent IF: 2.2; 2023 IF: 2.843 | ||
| Call Number | EMAT @ emat @c:irua:195896 | Serial | 7236 | ||
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| Author | De Schutter, B.; Van Stiphout, K.; Santos, N.M.; Bladt, E.; Jordan-Sweet, J.; Bals, S.; Lavoie, C.; Comrie, C.M.; Vantomme, A.; Detavernier, C. | ||||
| Title | Phase formation and texture of thin nickel germanides on Ge(001) and Ge(111) | Type | A1 Journal article | ||
| Year | 2016 | Publication | Journal of applied physics | Abbreviated Journal | J Appl Phys |
| Volume | 119 | Issue | 119 | Pages | 135305 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | We studied the solid-phase reaction between a thin Nifilm and a single crystal Ge(001) or Ge(111) substrate during a ramp anneal. The phase formation sequence was determined using in situX-ray diffraction and in situRutherford backscattering spectrometry (RBS), while the nature and the texture of the phases were studied using X-ray pole figures and transmission electron microscopy. The phase sequence is characterized by the formation of a single transient phase before NiGe forms as the final and stable phase. X-ray pole figures were used to unambiguously identify the transient phase as the ϵ-phase, a non-stoichiometric Ni-rich germanide with a hexagonal crystal structure that can exist for Ge concentrations between 34% and 48% and which forms with a different epitaxial texture on both substrate orientations. The complementary information gained from both RBS and X-ray pole figure measurements revealed a simultaneous growth of both the ϵ-phase and NiGe over a small temperature window on both substrate orientations. | ||||
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| Language | Wos | 000374150200035 | Publication Date | 2016-04-05 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0021-8979 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
2.068 | Times cited | 14 | Open Access | OpenAccess |
| Notes | The authors thank the FWO-vlaanderen, BOF-UGent (under Contract No. “GOA 01G01513”) and the Hercules Foundation (under Project No. “AUGE/09/014”) for financial support. S. Bals acknowledges financial support from European Research Council (ERC Starting Grant No. “#335078-COLOURATOMS”). A. Vantomme thanks the BOF-KULeuven (under Contract No. “GOA/14/007”) and the Joint Science and Technology Collaboration between the FWO (G.0031.14) and NRF (UID88013). The National Synchrotron Light Source (NSLS), Brookhaven National Laboratory, was supported by the U.S. Department of Energy, Office of Basic Energy Sciences (Contract No. DE-AC02-98CH10886).; ECAS_Sara; (ROMEO:green; preprint:; postprint:can ; pdfversion:restricted); | Approved | Most recent IF: 2.068 | ||
| Call Number | c:irua:132897 | Serial | 4066 | ||
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| Author | Geenen, F.A.; van Stiphout, K.; Nanakoudis, A.; Bals, S.; Vantomme, A.; Jordan-Sweet, J.; Lavoie, C.; Detavernier, C. | ||||
| Title | Controlling the formation and stability of ultra-thin nickel silicides : an alloying strategy for preventing agglomeration | Type | A1 Journal article | ||
| Year | 2018 | Publication | Journal of applied physics | Abbreviated Journal | J Appl Phys |
| Volume | 123 | Issue | 123 | Pages | 075303 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | The electrical contact of the source and drain regions in state-of-the-art CMOS transistors is nowadays facilitated through NiSi, which is often alloyed with Pt in order to avoid morphological agglomeration of the silicide film. However, the solid-state reaction between as-deposited Ni and the Si substrate exhibits a peculiar change for as-deposited Ni films thinner than a critical thickness of t(c) = 5 nm. Whereas thicker films form polycrystalline NiSi upon annealing above 450 degrees C, thinner films form epitaxial NiSi2 films that exhibit a high resistance toward agglomeration. For industrial applications, it is therefore of utmost importance to assess the critical thickness with high certainty and find novel methodologies to either increase or decrease its value, depending on the aimed silicide formation. This paper investigates Ni films between 0 and 15 nm initial thickness by use of “thickness gradients,” which provide semi-continuous information on silicide formation and stability as a function of as-deposited layer thickness. The alloying of these Ni layers with 10% Al, Co, Ge, Pd, or Pt renders a significant change in the phase sequence as a function of thickness and dependent on the alloying element. The addition of these ternary impurities therefore changes the critical thickness t(c). The results are discussed in the framework of classical nucleation theory. Published by AIP Publishing. | ||||
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| Publisher | American Institute of Physics | Place of Publication | New York, N.Y. | Editor | |
| Language | Wos | 000425807400018 | Publication Date | 2018-02-21 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0021-8979; 1089-7550 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
2.068 | Times cited | 23 | Open Access | OpenAccess |
| Notes | ; The authors acknowledge the FWO Vlaanderen, the Hercules Foundation, and BOF-UGent (GOA 01G01513) for providing financial support for this work. This research used resources of the National Synchrotron Light Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DE-AC02-98CH10886. ; | Approved | Most recent IF: 2.068 | ||
| Call Number | UA @ lucian @ c:irua:149912UA @ admin @ c:irua:149912 | Serial | 4929 | ||
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| Author | Bals, S.; Goris, B.; Altantzis, T.; Heidari, H.; Van Aert, S.; Van Tendeloo, G. | ||||
| Title | Seeing and measuring in 3D with electrons | Type | A1 Journal article | ||
| Year | 2014 | Publication | Comptes rendus : physique | Abbreviated Journal | Cr Phys |
| Volume | 15 | Issue | 2-3 | Pages | 140-150 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | Modern TEM enables the investigation of nanostructures at the atomic scale. However, TEM images are only two-dimensional (2D) projections of a three-dimensional (3D) object. Electron tomography can overcome this limitation. The technique is increasingly focused towards quantitative measurements and reaching atomic resolution in 3D has been the ultimate goal for many years. Therefore, one needs to optimize the acquisition of the data, the 3D reconstruction techniques as well as the quantification methods. Here, we will review a broad range of methodologies and examples. Finally, we will provide an outlook and will describe future challenges in the field of electron tomography. | ||||
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| Publisher | Place of Publication | Paris | Editor | ||
| Language | Wos | 000334013600005 | Publication Date | 2014-01-20 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1631-0705; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
2.048 | Times cited | 15 | Open Access | OpenAccess |
| Notes | (FWO;Belgium); European Research Council under the 7th Framework Program (FP7); ERC grant No.246791 – COUNTATOMS; ERC grant No.335078 – COLOURATOMS; ECAS_Sara; (ROMEO:green; preprint:; postprint:can ; pdfversion:cannot); | Approved | Most recent IF: 2.048; 2014 IF: 2.035 | ||
| Call Number | UA @ lucian @ c:irua:113855 | Serial | 2960 | ||
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| Author | Turner, S.; Tavernier, S.M.F.; Huyberechts, G.; Bals, S.; Batenburg, K.J.; Van Tendeloo, G. | ||||
| Title | Assisted spray pyrolysis production and characterisation of ZnO nanoparticles with narrow size distribution | Type | A1 Journal article | ||
| Year | 2010 | Publication | Journal of nanoparticle research | Abbreviated Journal | J Nanopart Res |
| Volume | 12 | Issue | 2 | Pages | 615-622 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | Nano-sized ZnO particles with a narrow size distribution and high crystallinity were prepared from aqueous solutions with high concentrations of Zn2+ containing salts and citric acid in a conventional spray pyrolysis setup. Structure, morphology and size of the produced material were compared to ZnO material produced by simple spray pyrolysis of zinc nitrates in the same experimental setup. Using transmission electron microscopy and electron tomography it has been shown that citric acid-assisted spray pyrolysed material is made up of micron sized secondary particles comprising a shell of lightly agglomerated, monocrystalline primary ZnO nanoparticles with sizes in the 2030 nm range, separable by a simple ultrasonic treatment step. | ||||
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| Publisher | Place of Publication | S.l. | Editor | ||
| Language | Wos | 000275318700025 | Publication Date | 2009-04-20 | |
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| Series Volume | Series Issue | Edition | |||
| ISSN | 1388-0764;1572-896X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
2.02 | Times cited | 27 | Open Access | |
| Notes | Esteem 026019 | Approved | Most recent IF: 2.02; 2010 IF: 3.253 | ||
| Call Number | UA @ lucian @ c:irua:81771 | Serial | 156 | ||
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| Author | Skorikov, A.; Batenburg, K.J.; Bals, S. | ||||
| Title | Analysis of 3D elemental distribution in nanomaterials : towards higher throughput and dose efficiency | Type | A1 Journal article | ||
| Year | 2023 | Publication | Journal of microscopy | Abbreviated Journal | |
| Volume | 289 | Issue | 3 | Pages | 157-163 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | Many advanced nanomaterials rely on carefully designed morphology and elemental distribution to achieve their functionalities. Among the few experimental techniques that can directly visualise the 3D elemental distribution on the nanoscale are approaches based on electron tomography in combination with energy-dispersive X-ray spectroscopy (EDXS) and electron energy loss spectroscopy (EELS). Unfortunately, these highly informative methods are severely limited by the fundamentally low signal-to-noise ratio, which makes long experimental times and high electron irradiation doses necessary to obtain reliable 3D reconstructions. Addressing these limitations has been the major research question for the development of these techniques in recent years. This short review outlines the latest progress on the methods to reduce experimental time and electron irradiation dose requirements for 3D elemental distribution analysis and gives an outlook on the development of this field in the near future. | ||||
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| Language | Wos | 000910532600001 | Publication Date | 2022-12-26 | |
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| Series Volume | Series Issue | Edition | |||
| ISSN | 0022-2720 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
2 | Times cited | 2 | Open Access | OpenAccess |
| Notes | ERC Consolidator Grant, Grant/Award Number: 815128 | Approved | Most recent IF: 2; 2023 IF: 1.692 | ||
| Call Number | UA @ admin @ c:irua:193428 | Serial | 7281 | ||
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| Author | Leroux, O.; Leroux, F.; Bagniewska-Zadworna,.; Knox, J.P.; Claeys, M.; Bals, S.; Viane, R.L.L. | ||||
| Title | Ultrastructure and composition of cell wall appositions in the roots of Asplenium (Polypodiales) | Type | A1 Journal article | ||
| Year | 2011 | Publication | Micron | Abbreviated Journal | Micron |
| Volume | 42 | Issue | 8 | Pages | 863-870 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | Cell wall appositions (CWAs), formed by the deposition of extra wall material at the contact site with microbial organisms, are an integral part of the response of plants to microbial challenge. Detailed histological studies of CWAs in fern roots do not exist. Using light and electron microscopy we examined the (ultra)structure of CWAs in the outer layers of roots of Asplenium species. All cell walls studded with CWAs were impregnated with yellow-brown pigments. CWAs had different shapes, ranging from warts to elongated branched structures, as observed with scanning and transmission electron microscopy. Ultrastructural study further showed that infecting fungi grow intramurally and that they are immobilized by CWAs when attempting to penetrate intracellularly. Immunolabelling experiments using monoclonal antibodies indicated pectic homogalacturonan, xyloglucan, mannan and cellulose in the CWAs, but tests for lignins and callose were negative. We conclude that these appositions are defense-related structures made of a non-lignified polysaccharide matrix on which phenolic compounds are deposited in order to create a barrier protecting the root against infections. | ||||
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| Publisher | Place of Publication | Oxford | Editor | ||
| Language | Wos | 000294942600013 | Publication Date | 2011-06-24 | |
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| Series Volume | Series Issue | Edition | |||
| ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
1.98 | Times cited | 20 | Open Access | |
| Notes | Fwo | Approved | Most recent IF: 1.98; 2011 IF: 1.527 | ||
| Call Number | UA @ lucian @ c:irua:92540 | Serial | 3798 | ||
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| Author | De Meyer, R.; Albrecht, W.; Bals, S. | ||||
| Title | Effectiveness of reducing the influence of CTAB at the surface of metal nanoparticles during in situ heating studies by TEM | Type | A1 Journal article | ||
| Year | 2021 | Publication | Micron | Abbreviated Journal | Micron |
| Volume | 144 | Issue | Pages | 103036 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | In situ TEM is a valuable technique to offer novel insights in the behavior of nanomaterials under various conditions. However, interpretation of in situ experiments is not straightforward since the electron beam can impact the outcome of such measurements. For example, ligands surrounding metal nanoparticles transform into a protective carbon layer upon electron beam irradiation and may impact the apparent thermal stability during in situ heating experiments. In this work, we explore the effect of different treatments typically proposed to remove such ligands. We found that plasma treatment prior to heating experiments for Au nanorods and nanostars increased the apparent thermal stability of the nanoparticles, while an activated carbon treatment resulted in a decrease of the observed thermal stability. Treatment with HCl barely changed the experimental outcome. These results demonstrate the importance of carefully selecting pre-treatments procedures during in situ heating experiments. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000632282600002 | Publication Date | 2021-02-19 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0968-4328 | ISBN | Additional Links | UA library record; WoS full record | |
| Impact Factor |
1.98 | Times cited | Open Access | OpenAccess | |
| Notes | H2020; European Research Council; This work was supported by the European Union’s Horizon 2020 research and innovation program [grant agreement No 823717 (ESTEEM3) and No 815128 (REALNANO)]; We acknowledge Prof. Luis M. Liz-Marzán and co-workers of the Bionanoplasmonics Laboratory, CICbiomaGUNE, Spain for providing the Au nanoparticles.; sygma; esteem3jra; esteem3reported | Approved | Most recent IF: 1.98 | ||
| Call Number | EMAT @ emat @c:irua:175874 | Serial | 6677 | ||
| Permanent link to this record | |||||
| Author | Altantzis, T.; Zanaga, D.; Bals, S. | ||||
| Title | Advanced electron tomography of nanoparticle assemblies | Type | A1 Journal article | ||
| Year | 2017 | Publication | Europhysics letters | Abbreviated Journal | Epl-Europhys Lett |
| Volume | 119 | Issue | 119 | Pages | 38001 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | Nanoparticle assemblies have attracted enormous scientific interest during the last years, due to their unique properties compared to those of their building blocks. To understand the origin of these properties and to establish the connection with their structure, a detailed and quantitative structural characterization is essential. Transmission electron microscopy has been widely used to investigate nano-assemblies. However, TEM images only correspond to a twodimensional projection of a three-dimensional object. Therefore, in order to obtain the necessary 3D structural information electron tomography has to be applied. By means of advanced electron tomography, both qualitative and quantitative information can be obtained, which can be used for detailed theoretical studies. |
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| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000415019400023 | Publication Date | 2017-10-12 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0295-5075 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
1.957 | Times cited | 8 | Open Access | OpenAccess |
| Notes | We would like to thank the colleagues who have contributed to this work over the years, including L. M. Liz- Marzan, M. Grzelczak, A. Sanchez-Iglesias, D. Vanmaekelbergh, M. P. Boneschanscher, W. H. Evers, J. J. Geuchies, B. Goris, A. de Backer, S. van Aert, M.-P. Pileni, Z. Yang, K. J. Batenburg, J. Sijbers, F. Bleichrodt, W. J. Palenstijn, A. van Blaaderen, M. A. van Huis, F. M. Peeters, N. Winckelmans and D. Wang. The authors gratefully acknowledge funding from the Research Foundation Flanders (G.0381.16N, G.036915 G.0374.13 and funding of a postdoctoral grant to TA). SB and DZ acknowledge funding from the European Research Council, ERC grant No. 335078 – Colouratom. (ROMEO:green; preprint:; postprint:can ; pdfversion:cannot); saraecas; ECAS_Sara; | Approved | Most recent IF: 1.957 | ||
| Call Number | EMAT @ emat @c:irua:146096UA @ admin @ c:irua:146096 | Serial | 4733 | ||
| Permanent link to this record | |||||
| Author | Leroux, F.; Bladt, E.; Timmermans, J.-P.; Van Tendeloo, G.; Bals, S. | ||||
| Title | Annular dark-field transmission electron microscopy for low contrast materials | Type | A1 Journal article | ||
| Year | 2013 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 19 | Issue | 3 | Pages | 629-634 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | Imaging soft matter by transmission electron microscopy (TEM) is anything but straightforward. Recently, interest has grown in developing alternative imaging modes that generate contrast without additional staining. Here, we present a dark-field TEM technique based on the use of an annular objective aperture. Our experiments demonstrate an increase in both contrast and signal-to-noise ratio in comparison to conventional bright-field TEM. The proposed technique is easy to implement and offers an alternative imaging mode to investigate soft matter. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | 000319126300014 | Publication Date | 2013-04-04 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
1.891 | Times cited | 5 | Open Access | |
| Notes | 262348 Esmi; Fwo G002410n G018008 | Approved | Most recent IF: 1.891; 2013 IF: 2.161 | ||
| Call Number | UA @ lucian @ c:irua:108712 | Serial | 133 | ||
| Permanent link to this record | |||||
| Author | Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. | ||||
| Title | Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy | Type | A1 Journal article | ||
| Year | 2009 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 15 | Issue | S:2 | Pages | 464-465 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | 000208119100230 | Publication Date | 2009-07-27 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
1.891 | Times cited | 1 | Open Access | |
| Notes | Approved | Most recent IF: 1.891; 2009 IF: 3.035 | |||
| Call Number | UA @ lucian @ c:irua:96555UA @ admin @ c:irua:96555 | Serial | 178 | ||
| Permanent link to this record | |||||
| Author | Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. | ||||
| Title | High-quality sample preparation by low kV FIB thinning for analytical TEM measurements | Type | A1 Journal article | ||
| Year | 2007 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 13 | Issue | 2 | Pages | 80-86 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | Focused ion beam specimen preparation has been used for NiTi samples and SrTiO(3)/SrRuO(3) multilayers with prevention of surface amorphization and Ga implantation by a 2-kV cleaning procedure. Transmission electron microscopy techniques show that the samples are of high quality with a controlled thickness over large scales. Furthermore, preferential thinning effects in multicompounds are avoided, which is important when analytical transmission electron microscopy measurements need to be interpreted in a quantitative manner. The results are compared to similar measurements acquired for samples obtained using conventional preparation techniques such as electropolishing for alloys and ion milling for oxides. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | 000245662200002 | Publication Date | 2007-03-19 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
1.891 | Times cited | 82 | Open Access | |
| Notes | Fwo; Goa | Approved | Most recent IF: 1.891; 2007 IF: 1.941 | ||
| Call Number | UA @ lucian @ c:irua:65850 | Serial | 1441 | ||
| Permanent link to this record | |||||
| Author | Jinschek, J.R.; Bals, S.; Gopal, V.; Xus, X.; Kisielowski, C. | ||||
| Title | Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs | Type | A3 Journal article | ||
| Year | 2004 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 10 | Issue | S:2 | Pages | 294-295 |
| Keywords | A3 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | Publication Date | 2008-01-04 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record | |
| Impact Factor |
1.891 | Times cited | Open Access | ||
| Notes | Approved | Most recent IF: 1.891; 2004 IF: 2.389 | |||
| Call Number | UA @ lucian @ c:irua:87599 | Serial | 2714 | ||
| Permanent link to this record | |||||
| Author | Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. | ||||
| Title | Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy | Type | A1 Journal article | ||
| Year | 2007 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 13 | Issue | S:3 | Pages | 332-333 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | Publication Date | 2008-02-13 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record | |
| Impact Factor |
1.891 | Times cited | Open Access | ||
| Notes | Approved | Most recent IF: 1.891; 2007 IF: 1.941 | |||
| Call Number | UA @ lucian @ c:irua:96553 | Serial | 3224 | ||
| Permanent link to this record | |||||
| Author | Bals, S.; Radmilovic, V.; Kisielowski, C. | ||||
| Title | TEM annular objective apertures fabricated by FIB | Type | A1 Journal article | ||
| Year | 2004 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 10 | Issue | S:2 | Pages | 1148-1149 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | Publication Date | 2008-01-04 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record | |
| Impact Factor |
1.891 | Times cited | Open Access | ||
| Notes | Approved | Most recent IF: 1.891; 2004 IF: 2.389 | |||
| Call Number | UA @ lucian @ c:irua:87603 | Serial | 3475 | ||
| Permanent link to this record | |||||
| Author | Ke, X.; Bals, S.; Cott, D.; Hantschel, T.; Bender, H.; Van Tendeloo, G. | ||||
| Title | Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts | Type | A1 Journal article | ||
| Year | 2010 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 16 | Issue | 2 | Pages | 210-217 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | The three-dimensional (3D) distribution of carbon nanotubes (CNTs) grown inside semiconductor contact holes is studied by electron tomography. The use of a specialized tomography holder results in an angular tilt range of ±90°, which means that the so-called missing wedge is absent. The transmission electron microscopy (TEM) sample for this purpose consists of a micropillar that is prepared by a dedicated procedure using the focused ion beam (FIB) but keeping the CNTs intact. The 3D results are combined with energy dispersive X-ray spectroscopy (EDS) to study the relation between the CNTs and the catalyst particles used during their growth. The reconstruction, based on the full range of tilt angles, is compared with a reconstruction where a missing wedge is present. This clearly illustates that the missing wedge will lead to an unreliable interpretation and will limit quantitative studies | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | 000276137200011 | Publication Date | 2010-02-26 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
1.891 | Times cited | 42 | Open Access | |
| Notes | Esteem 026019; Fwo; Iap-Vi | Approved | Most recent IF: 1.891; 2010 IF: 3.259 | ||
| Call Number | UA @ lucian @ c:irua:82279 | Serial | 3642 | ||
| Permanent link to this record | |||||
| Author | Goris, B.; Freitag, B.; Zanaga, D.; Bladt, E.; Altantzis, T.; Ringnalda, J.; Bals, S. | ||||
| Title | Towards quantitative EDX results in 3 dimensions | Type | A1 Journal article | ||
| Year | 2014 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 20 | Issue | S:3 | Pages | 766-767 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | Publication Date | 2014-08-27 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record | |
| Impact Factor |
1.891 | Times cited | Open Access | OpenAccess | |
| Notes | 335078 Colouratom; Fwo; ECAS_Sara; (ROMEO:green; preprint:; postprint:can ; pdfversion:cannot); | Approved | Most recent IF: 1.891; 2014 IF: 1.877 | ||
| Call Number | UA @ lucian @ c:irua:125381 | Serial | 3687 | ||
| Permanent link to this record | |||||
| Author | Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. | ||||
| Title | Ultra-high resolution electron tomography for materials science : a roadmap | Type | A1 Journal article | ||
| Year | 2011 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 17 | Issue | S:2 | Pages | 934-935 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | Publication Date | 2011-10-07 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record | |
| Impact Factor |
1.891 | Times cited | Open Access | ||
| Notes | Approved | Most recent IF: 1.891; 2011 IF: 3.007 | |||
| Call Number | UA @ lucian @ c:irua:96554 | Serial | 3792 | ||
| Permanent link to this record | |||||
| Author | Masenelli-Varlot, K.; Malchere, A.; Ferreira, J.; Heidari Mezerji, H.; Bals, S.; Messaoudi, C.; Garrido, S.M. | ||||
| Title | Wet-STEM tomography : principles, potentialities and limitations | Type | A1 Journal article | ||
| Year | 2014 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 20 | Issue | 2 | Pages | 366-375 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | The characterization of biological and inorganic materials by determining their three-dimensional structure in conditions closer to their native state is a major challenge of technological research. Environmental scanning electron microscopy (ESEM) provides access to the observation of hydrated samples in water environments. Here, we present a specific device for ESEM in the scanning transmission electron microscopy mode, allowing the acquisition of tilt-series suitable for tomographic reconstructions. The resolution which can be obtained with this device is first determined. Then, we demonstrate the feasibility of tomography on wet materials. The example studied here is hydrophilic mesoporous silica (MCM-41). Finally, the minimum thickness of water which can be detected is calculated from Monte Carlo simulations and compared with the resolution expected in the tomograms. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | 000337304700005 | Publication Date | 2014-02-26 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
1.891 | Times cited | 9 | Open Access | OpenAccess |
| Notes | IAP-PAI; European Research Council under the 7th Framework Program (FP7); ERC grant no. 335078-COLOURATOMS.; ECAS_Sara; (ROMEO:green; preprint:; postprint:can ; pdfversion:cannot); | Approved | Most recent IF: 1.891; 2014 IF: 1.877 | ||
| Call Number | UA @ lucian @ c:irua:118411 | Serial | 3915 | ||
| Permanent link to this record | |||||
| Author | Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. | ||||
| Title | Fast electron low dose tomography for beam sensitive materials | Type | A1 Journal article | ||
| Year | 2021 | Publication | Microscopy And Microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 27 | Issue | S1 | Pages | 2116-2118 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | Publication Date | 2021-07-30 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276 | ISBN | Additional Links | UA library record | |
| Impact Factor |
1.891 | Times cited | Open Access | OpenAccess | |
| Notes | Approved | Most recent IF: 1.891 | |||
| Call Number | EMAT @ emat @c:irua:183278 | Serial | 6813 | ||
| Permanent link to this record | |||||
| Author | De Schutter, B.; Devulder, W.; Schrauwen, A.; van Stiphout, K.; Perkisas, T.; Bals, S.; Vantomme, A.; Detavernier, C. | ||||
| Title | Phase formation in intermixed NiGe thin films : influence of Ge content and low-temperature nucleation of hexagonal nickel germanides | Type | A1 Journal article | ||
| Year | 2014 | Publication | Microelectronic engineering | Abbreviated Journal | Microelectron Eng |
| Volume | 120 | Issue | Pages | 168-173 | |
| Keywords | A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) | ||||
| Abstract | In this study, we focus on phase formation in intermixed NiGe thin films as they represent a simplified model of the small intermixed interface layer that is believed to form upon deposition of Ni on Ge and where initial phase formation happens. A combinatorial sputter deposition technique was used to co-deposit a range of intermixed NiGe thin films with Ge concentrations varying between 0 and 50 at.%Ge in a single deposition on both Ge (100) and inert SiO2 substrates. In situ X-ray diffraction and transmission electron microscopy where used to study phase formation. In almost the entire composition range under investigation, crystalline phases where found to be present in the as-deposited films. Between 36 and 48 at.%Ge, high-temperature hexagonal nickel germanides were found to occur metastabily below 300 °C, both on SiO2 and Ge (100) substrates. For Ge concentrations in the range between 36 and 42 at.%, this hexagonal germanide phase was even found to be present at room temperature in the as-deposited films. The results obtained in this work could provide more insight in the phase sequence of a pure Ni film on Ge. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000336697300028 | Publication Date | 2013-09-20 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0167-9317; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
1.806 | Times cited | 9 | Open Access | Not_Open_Access |
| Notes | FWO project Nr. G076112N | Approved | Most recent IF: 1.806; 2014 IF: 1.197 | ||
| Call Number | UA @ lucian @ c:irua:116958 | Serial | 2584 | ||
| Permanent link to this record | |||||
| Author | Montoya, E.; Bals, S.; Van Tendeloo, G. | ||||
| Title | Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam | Type | A1 Journal article | ||
| Year | 2008 | Publication | Journal of microscopy | Abbreviated Journal | J Microsc-Oxford |
| Volume | 231 | Issue | 3 | Pages | 359-363 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Oxford | Editor | ||
| Language | Wos | 000259611000001 | Publication Date | 2008-08-28 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0022-2720;1365-2818; | ISBN | Additional Links | UA library record; WoS full record | |
| Impact Factor |
1.692 | Times cited | Open Access | ||
| Notes | The authors are grateful to M. Huijben and G. Rijnders of the MESA+ group at the University of Twente (NI) for the growth of the multilayers. This work has been performed under the Interuniversity Attraction Poles programme – Belgian State Belgian Science Policy. The authors acknowledge financial support from the European Union under the framework 6 program under a contract for an Integrated Infrastructure initiative. Part of this work was performed with financial support from the European Union under the framework 6 programme, under a contract for an Integrated Infrastructure Initiative (Reference No. 02601.9 ESTEEM). | Approved | Most recent IF: 1.692; 2008 IF: 1.409 | ||
| Call Number | UA @ lucian @ c:irua:76522 | Serial | 2849 | ||
| Permanent link to this record | |||||
| Author | Martin, É.; Gossuin, Y.; Bals, S.; Kavak, S.; Vuong, Q.L. | ||||
| Title | Monte Carlo simulations of the magnetic behaviour of iron oxide nanoparticle ensembles: taking size dispersion, particle anisotropy, and dipolar interactions into account | Type | A1 Journal article | ||
| Year | 2022 | Publication | European physical journal : B : condensed matter and complex systems | Abbreviated Journal | Eur Phys J B |
| Volume | 95 | Issue | 12 | Pages | 201 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | In this work, the magnetic properties of superparamagnetic iron oxide nanoparticles (SPIONs) submitted to an external magnetic field are studied using a Metropolis algorithm. The influence on the M(B) curves of the size distribution of the nanoparticles, of uniaxial anisotropy, and of dipolar interaction between the cores are examined, as well as the influence of drying the samples under a zero or non-zero magnetic field. It is shown that the anisotropy impacts the shape of the magnetization curves, which then deviate from a pure Langevin behaviour, whereas the dipolar interaction has no influence on the curves at 300 K for small particles (with a radius of 3 nm). The fitting of the magnetization curves of particles with magnetic anisotropy to a Langevin model (including a size distribution of the particles) can then lead to erroneous values of the distribution parameters. The simulation results are qualitatively compared to experimental results obtained for iron oxide nanoparticles (with a 3.21 nm median radius). | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000901937400001 | Publication Date | 2022-12-21 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1434-6028 | ISBN | Additional Links | UA library record; WoS full record | |
| Impact Factor |
1.6 | Times cited | Open Access | OpenAccess | |
| Notes | The authors would like to thank Sophie Laurent from the University of Mons for the access to the Dynamic Light Scattering equipment. Computational resources have been provided by the Consortium des Equipements de Calcul Intensif (C ´ ECI), funded by the ´ Fonds de la Recherche Scientifique de Belgique (F.R.S.- FNRS) under Grant No. 2.5020.11 and by the Walloon Region. | Approved | Most recent IF: 1.6 | ||
| Call Number | EMAT @ emat @c:irua:192706 | Serial | 7232 | ||
| Permanent link to this record | |||||
| Author | Bals, S.; Kabius, B.; Haider, M.; Radmilovic, V.; Kisielowski, C. | ||||
| Title | Annular dark field imaging in a TEM | Type | A1 Journal article | ||
| Year | 2004 | Publication | Solid state communications | Abbreviated Journal | Solid State Commun |
| Volume | 130 | Issue | 10 | Pages | 675-680 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | Annular objective apertures are fabricated for a CM300 transmission electron microscope using a focused ion beam system. A central beam stop in the back focal plane of the objective lens of the microscope blocks all electrons scattered up to a semi-angle of approximately 20 mrad. In this manner, contributions to the image from Bragg scattering are largely reduced and the image contrast is sensitive to the atomic number Z. Experimentally, we find that single atom scattering cross sections measured with this technique are close to Rutherford scattering values. A comparison between this new method and STEM-HAADF shows that both techniques result in qualitatively similar images although the resolution of ADF-TEM is limited by contrast delocalization caused by the spherical aberration of the objective lens. This problem can be overcome by using an aberration corrected microscope. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | New York, N.Y. | Editor | ||
| Language | Wos | 000221489300007 | Publication Date | 2004-04-10 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0038-1098; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor |
1.554 | Times cited | 43 | Open Access | |
| Notes | Approved | Most recent IF: 1.554; 2004 IF: 1.523 | |||
| Call Number | UA @ lucian @ c:irua:87584 | Serial | 132 | ||
| Permanent link to this record | |||||