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Extension of the basis set of linearized augmented plane wave (LAPW) method by using supplemented tight binding basis functions”. Nikolaev AV, Lamoen D, Partoens B, The journal of chemical physics 145, 014101 (2016). http://doi.org/10.1063/1.4954962
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Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy”. Muller-Caspary K, Krause FF, Grieb T, Loffler S, Schowalter M, Béché, A, Galioit V, Marquardt D, Zweck J, Schattschneider P, Verbeeck J, Rosenauer A, Ultramicroscopy 178, 62 (2016). http://doi.org/10.1016/j.ultramic.2016.05.004
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Long-Range Domain Structure and Symmetry Engineering by Interfacial Oxygen Octahedral Coupling at Heterostructure Interface”. Liao Z, Green RJ, Gauquelin N, Macke S, Li L, Gonnissen J, Sutarto R, Houwman EP, Zhong Z, Van Aert S, Verbeeck J, Sawatzky GA, Huijben M, Koster G, Rijnders G, Advanced functional materials 26, 6627 (2016). http://doi.org/10.1002/adfm.201602155
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High viscosity to highly dispersed PtPd bimetallic nanocrystals for enhanced catalytic activity and stability”. Ying J, Hu Z-Y, Yang X-Y, Wei H, Xiao Y-X, Janiak C, Mu S-C, Tian G, Pan M, Van Tendeloo G, Su B-L, Chemical communications 52, 8219 (2016). http://doi.org/10.1039/c6cc00912c
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First-principles analysis of the spectroscopic limited maximum efficiency of photovoltaic absorber layers for CuAu-like chalcogenides and silicon”. Bercx M, Sarmadian N, Saniz R, Partoens B, Lamoen D, Physical chemistry, chemical physics 18, 20542 (2016). http://doi.org/10.1039/c6cp03468c
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First-principles study of the optoelectronic properties and photovoltaic absorber layer efficiency of Cu-based chalcogenides”. Sarmadian N, Saniz R, Partoens B, Lamoen D, Journal of applied physics 120, 085707 (2016). http://doi.org/10.1063/1.4961562
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Superconducting YBa2Cu3O7-δNanocomposites Using Preformed ZrO2Nanocrystals: Growth Mechanisms and Vortex Pinning Properties”. De Keukeleere K, Cayado P, Meledin A, Vallès F, De Roo J, Rijckaert H, Pollefeyt G, Bruneel E, Palau A, Coll M, Ricart S, Van Tendeloo G, Puig T, Obradors X, Van Driessche I, Advanced Electronic Materials 2, 1600161 (2016). http://doi.org/10.1002/aelm.201600161
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Enhanced optoelectronic performances of vertically aligned hexagonal boron nitride nanowalls-nanocrystalline diamond heterostructures”. Sankaran KJ, Hoang DQ, Kunuku S, Korneychuk S, Turner S, Pobedinskas P, Drijkoningen S, Van Bael MK, D' Haen J, Verbeeck J, Leou K-C, Lin I-N, Haenen K, Scientific reports 6, 29444 (2016). http://doi.org/10.1038/srep29444
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The effect of molecular structure of organic compound on the direct high-pressure synthesis of boron-doped nanodiamond: Effect of organic compound on synthesis of boron-doped nanodiamond”. Ekimov EA, Kudryavtsev OS, Turner S, Korneychuk S, Sirotinkin VP, Dolenko TA, Vervald AM, Vlasov II, Physica status solidi : A : applications and materials science 213, 2582 (2016). http://doi.org/10.1002/pssa.201600181
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Direct imaging of boron segregation at dislocations in B:diamond heteroepitaxial films”. Turner S, Idrissi H, Sartori AF, Korneychuck S, Lu Y-G, Verbeeck J, Schreck M, Van Tendeloo G, Nanoscale 8, 2212 (2016). http://doi.org/10.1039/c5nr07535a
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Bending Gold Nanorods with Light”. Babynina A, Fedoruk M, Kuhler P, Meledin A, Doblinger M, Lohmueller T, Nano letters 16, 6485 (2016). http://doi.org/10.1021/acs.nanolett.6b03029
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Measuring the height-to-height correlation function of corrugation in suspended graphene”. Kirilenko DA, Brunkov PN, Ultramicroscopy 165, 1 (2016). http://doi.org/10.1016/j.ultramic.2016.03.010
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Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design”. Gonnissen J, De Backer A, den Dekker AJ, Sijbers J, Van Aert S, Ultramicroscopy 170, 128 (2016). http://doi.org/10.1016/j.ultramic.2016.07.014
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Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall-Meanders, Kinks, and Local Electric Charges”. Gonnissen J, Batuk D, Nataf GF, Jones L, Abakumov AM, Van Aert S, Schryvers D, Salje EKH, Advanced functional materials 26, 7599 (2016). http://doi.org/10.1002/adfm.201603489
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Influence of defect distribution on the reducibility of CeO2-x nanoparticles”. Spadaro MC, Luches P, Bertoni G, Grillo V, Turner S, Van Tendeloo G, Valeri S, D'Addato S, Nanotechnology 27, 425705 (2016). http://doi.org/10.1088/0957-4484/27/42/425705
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StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images”. De Backer A, van den Bos KHW, Van den Broek W, Sijbers J, Van Aert S, Ultramicroscopy 171, 104 (2016). http://doi.org/10.1016/j.ultramic.2016.08.018
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MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA”. Lobato I, Van Dyck D, Ultramicroscopy 156, 9 (2015). http://doi.org/10.1016/j.ultramic.2015.04.016
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Solution-derived YBa2Cu3O7-\delta (YBCO) superconducting films with BaZrO3 (BZO) nanodots based on reverse micelle stabilized nanoparticles”. Bretos I, Schneller T, Falter M, Baecker M, Hollmann E, Woerdenweber R, Molina-Luna L, Van Tendeloo G, Eibl O, Journal of materials chemistry C : materials for optical and electronic devices 3, 3971 (2015). http://doi.org/10.1039/c4tc02543a
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Structural, electrochemical and magnetic properties of a novel KFeSO4F polymorph”. Lander L, Rousse G, Abakumov AM, Sougrati M, Van Tendeloo G, Tarascon J-M, Journal of materials chemistry A : materials for energy and sustainability 3, 19754 (2015). http://doi.org/10.1039/c5ta05548b
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Water electrolysis on La1-xSrxCoO3-\delta perovskite electrocatalysts”. Mefford JT, Rong X, Abakumov AM, Hardin WG, Dai S, Kolpak AM, Johnston KP, Stevenson KJ, Nature communications 7, 11053 (2016). http://doi.org/10.1038/ncomms11053
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Strong oxygen participation in the redox governing the structural and electrochemical properties of Na-rich layered oxide Na2IrO3”. Perez AJ, Batuk D, Saubanère M, Rousse G, Foix D, Mc Calla E, J Berg E, Dugas R, van den Bos K H W, Doublet M-L, Gonbeau D, Abakumov AM, Van Tendeloo G, Tarascon J-M, Chemistry of materials 28, 8278 (2016). http://doi.org/10.1021/acs.chemmater.6b03338
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Locating light and heavy atomic column positions with picometer precision using ISTEM”. van den Bos KHW, Krause FF, Béché, A, Verbeeck J, Rosenauer A, Van Aert S, Ultramicroscopy 172, 75 (2016). http://doi.org/10.1016/j.ultramic.2016.10.003
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Annealing-Induced Bi Bilayer on Bi2Te3 Investigated via Quasi-Particle-Interference Mapping”. Schouteden K, Govaerts K, Debehets J, Thupakula U, Chen T, Li Z, Netsou A, Song F, Lamoen D, Van Haesendonck C, Partoens B, Park K, ACS nano 10, 8778 (2016). http://doi.org/10.1021/acsnano.6b04508
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Unique nanostructural features in Fe, Mn-doped YBCO thin films”. Meledin A, Turner S, Cayado P, Mundet B, Solano E, Ricart S, Ros J, Puig T, Obradors X, Van Tendeloo G, Superconductor science and technology 29, 125009 (2016). http://doi.org/10.1088/0953-2048/29/12/125009
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Evaluation of Ce-doped Pr2CuO4for potential application as a cathode material for solid oxide fuel cells”. Kolchina L M, Lyskov NV, Kuznetsov AN, Kazakov SM, Galin MZ, Meledin A, Abakumov AM, Bredikhin SI, Mazo GN, Antipov EV, RSC advances 6, 101029 (2016). http://doi.org/10.1039/C6RA21970E
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Layered-to-Tunnel Structure Transformation and Oxygen Redox Chemistry in LiRhO2upon Li Extraction and Insertion”. Mikhailova D, Karakulina OM, Batuk D, Hadermann J, Abakumov AM, Herklotz M, Tsirlin AA, Oswald S, Giebeler L, Schmidt M, Eckert J, Knapp M, Ehrenberg H, Inorganic chemistry 55, 7079 (2016). http://doi.org/10.1021/acs.inorgchem.6b01008
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Complex Microstructure and Magnetism in Polymorphic CaFeSeO”. Cassidy SJ, Batuk M, Batuk D, Hadermann J, Woodruff DN, Thompson AL, Clarke SJ, Inorganic chemistry 55, 10714 (2016). http://doi.org/10.1021/acs.inorgchem.6b01951
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Strength, toughness and aging stability of highly-translucent Y-TZP ceramics for dental restorations”. Zhang F, Inokoshi M, Batuk M, Hadermann J, Naert I, Van Meerbeek B, Vleugels J, Dental Materials 32, e327 (2016). http://doi.org/10.1016/j.dental.2016.09.025
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Extension of Friedel's law to vortex-beam diffraction”. Juchtmans R, Guzzinati G, Verbeeck J, Physical Review A 94, 033858 (2016). http://doi.org/10.1103/PhysRevA.94.033858
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Atom-counting in High Resolution Electron Microscopy: TEM or STEM –, that's the question”. Gonnissen J, De Backer A, den Dekker AJ, Sijbers J, Van Aert S, Ultramicroscopy 174, 112 (2016). http://doi.org/10.1016/j.ultramic.2016.10.011
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