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Author  |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings |
2022 |
Ultramicroscopy |
232 |
18 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Velazco Torrejón, A. |
Alternative scan strategies for high resolution STEM imaging |
2021 |
|
|
|
UA library record |
|
|
|
Veith, G.M.; Lobanov, M.V.; Emge, T.J.; Greenblatt, M.; Croft, M.; Stowasser, F.; Hadermann, J.; Van Tendeloo, G. |
Synthesis and charactreization of the new Ln(2)FeMoO(7) (Ln = Y, Dy, Ho) compounds |
2004 |
Journal of materials chemistry |
14 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vega-Paredes, M.; Aymerich-Armengol, R.; Arenas Esteban, D.; Marti-Sanchez, S.; Bals, S.; Scheu, C.; Manjon, A.G. |
Electrochemical stability of rhodium-platinum core-shell nanoparticles : an identical location scanning transmission electron microscopy study |
2023 |
ACS nano |
17 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vega Ibañez, F.; Béché, A.; Verbeeck, J. |
Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? |
2022 |
Microscopy and microanalysis |
|
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vávra, O.; Gaži, S.; Golubović, D.S.; Vávra, I.; Dérer, J.; Verbeeck, J.; Van Tendeloo, G.; Moshchalkov, V.V. |
0 and π phase Josephson coupling through an insulating barrier with magnetic impurities |
2006 |
Physical review : B : condensed matter and materials physics |
74 |
27 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. |
Bandgap measurement of high refractive index materials by off-axis EELS |
2017 |
Ultramicroscopy |
182 |
3 |
UA library record; WoS full record; WoS citing articles |
|
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|
Vast, L.; Carpentier, L.; Lallemand, F.; Colomer, J.-F.; Van Tendeloo, G.; Fonseca, A.; Nagy, J.B.; Mekhalif, Z.; Delhalle, J. |
Multiwalled carbon nanotubes functionalized with 7-octenyltrichlorosilane and n-octyltrichlorosilane: dispersion in Sylgard®184 silicone and Youngs modulus |
2009 |
Journal of materials science |
44 |
16 |
UA library record; WoS full record; WoS citing articles |
|
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|
Vassiliev, S.Y.; Laurinavichute, V.K.; Abakumov, A.M.; Govorov, V.A.; Bendovskii, E.B.; Turner, S.; Filatov, A.Y.; Tarasovskii, V.P.; Borzenko, A.G.; Alekseeva, A.M.; Antipov, E.V. |
Microstructural aspects of the degradation behavior of SnO2-based anodes for aluminum electrolysis |
2010 |
Journal of the electrochemical society |
157 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vasiliev, R.B.; Babynina, A.V.; Maslova, O.A.; Rumyantseva, M.N.; Ryabova, L.I.; Dobrovolsky, A.A.; Drozdov, K.A.; Khokhlov, D.R.; Abakumov, A.M.; Gaskov, A.M. |
Photoconductivity of nanocrystalline SnO2 sensitized with colloidal CdSe quantum dots |
2013 |
Journal of materials chemistry C : materials for optical and electronic devices |
1 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
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Vasiliev, A.L.; Van Tendeloo, G.; Boikov, Y.; Olsson, E.; Ivanov, Z.; Claeson, T.; Kiselev, N.A. |
Structural aspects of the combination of Si and YBa2Cu3O7-x |
1995 |
Institute of physics conference series |
146 |
|
UA library record; WoS full record; |
|
|
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Vasiliev, A.L.; Van Tendeloo, G.; Boikov, Y.; Olsson, E.; Ivanov, S. |
Microstructure of YBa2Cu3O7-x films on buffered Si for microelectronic applications |
1997 |
Superconductor science and technology |
10 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
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Vasiliev, A.L.; Van Tendeloo, G.; Amelinckx, S.; Boikov, Y.; Olsson, E.; Ivanov, Z. |
Structural aspect of YBa2Cu3O7-x films on Sis with complex barrier layers |
1995 |
Physica: C : superconductivity |
244 |
28 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vasiliev, A.L.; Stepantsov, E.A.; Ivanov, Z.G.; Verbist, K.; Van Tendeloo, G.; Olsson, E. |
The microstructure and interfaces of intermediate layers in sapphire bicrystals |
1997 |
Applied surface science |
119 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vasiliev, A.L.; Stepantsov, E.A.; Ivanov, Z.G.; Olsson, E.; Verbist, K.; Van Tendeloo, G. |
Structure of artificial grain boundaries in sapphire bicrystals with intermediate layers |
1997 |
Interface science |
5 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Varambhia, A.M.; Jones, L.; De Backer, A.; Fauske, V.T.; Van Aert, S.; Ozkaya, D.; Nellist, P.D. |
Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM |
2016 |
Particle and particle systems characterization |
33 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vantomme, A.; Wu, M.F.; Hogg, S.; van Landuyt, J.; et al. |
Comparative study of structural properties and photoluminescence in InGaN layers with a high In content |
2000 |
Internet journal of nitride semiconductor research
T2 – Symposium on GaN and Related Alloys Held at the MRS Fall Meeting, NOV 29-DEC 03, 1999, BOSTON, MASSACHUSETTS |
5 |
|
UA library record; WoS full record; |
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Vanrompay, H.; Skorikov, A.; Bladt, E.; Béché, A.; Freitag, B.; Verbeeck, J.; Bals, S. |
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges |
2021 |
Ultramicroscopy |
221 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vanrompay, H.; Buurlage, J.‐W.; Pelt, D.M.; Kumar, V.; Zhuo, X.; Liz‐Marzán, L.M.; Bals, S.; Batenburg, K.J. |
Real‐Time Reconstruction of Arbitrary Slices for Quantitative and In Situ 3D Characterization of Nanoparticles |
2020 |
Particle & Particle Systems Characterization |
37 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
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Vanrompay, H.; Bladt, E.; Albrecht, W.; Béché, A.; Zakhozheva, M.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Bals, S. |
3D characterization of heat-induced morphological changes of Au nanostars by fast in situ electron tomography |
2018 |
Nanoscale |
10 |
55 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vanrompay, H.; Béché, A.; Verbeeck, J.; Bals, S. |
Experimental Evaluation of Undersampling Schemes for Electron Tomography of Nanoparticles |
2019 |
Particle and particle systems characterization |
36 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vanrompay, H. |
Toward fast and dose efficient electron tomography |
2020 |
|
|
|
UA library record |
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Vanrenterghem, B.; Papaderakis, A.; Sotiropoulos, S.; Tsiplakides, D.; Balomenou, S.; Bals, S.; Breugelmans, T. |
The reduction of benzylbromide at Ag-Ni deposits prepared by galvanic replacement |
2016 |
Electrochimica acta |
196 |
21 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vanrenterghem, B.; Geboes, B.; Bals, S.; Ustarroz, J.; Hubin, A.; Breugelmans, T. |
Influence of the support material and the resulting particle distribution on the deposition of Ag nanoparticles for the electrocatalytic activity of benzyl bromide reduction |
2016 |
Applied catalysis : B : environmental |
181 |
16 |
UA library record; WoS full record; WoS citing articles |
|
|
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Vannier, R.-N.; Théry, O.; Kinowski, C.; Huvé, M.; Van Tendeloo, G.; Suard, E.; Abraham, F. |
Zr substituted bismuth uranate |
1999 |
Journal of materials chemistry |
9 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vanhumbeeck, J.-F.; Tian, H.; Schryvers, D.; Proost, J. |
Stress-assisted crystallisation in anodic titania |
2011 |
Corrosion science |
53 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vanhellemont, J.; Romano-Rodriguez, A.; Fedina, L.; van Landuyt, J.; Aseev, A. |
Point defect reactions in silicon studies in situ by high flux electron irradiation in high voltage transmission electron microscope |
1995 |
Materials science and technology |
11 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vanhellemont, J.; Romano Rodriguez, A.; Fedina, L.; van Landuyt, J.; Aseev, A. |
Point defect reactions in silicon studied in situ by high flux electron irradiation in high voltage transmission electron microscope |
1995 |
Materials science and technology |
11 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vanhellemont, J.; Claeys, C.; van Landuyt, J. |
In-situ HVEM study of dislocation generation in patterned stress fields at silicon surfaces |
1995 |
Physica status solidi: A: applied research |
150 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vanhellemont, J.; Bender, H.; van Landuyt, J. |
TEM studies of processed Si device materials |
1997 |
Conference series of the Institute of Physics |
157 |
|
UA library record; WoS full record; |
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