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Author  |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Van Eyndhoven, G.; Kurttepeli, M.; van Oers, C.J.; Cool, P.; Bals, S.; Batenburg, K.J.; Sijbers, J. |
Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials |
2015 |
Ultramicroscopy |
148 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Landuyt, J. |
The evolution of HVEM application in antwerp |
1991 |
Ultramicroscopy
T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan |
39 |
|
UA library record; WoS full record |
|
|
|
Van Tendeloo, G.; Amelinckx, S.; Muto, S.; Verheijen, M.A.; van Loosdrecht, P.H.M.; Meijer, G. |
Structures and phase transitions in C60 and C70 fullerites |
1993 |
Ultramicroscopy |
51 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vanrompay, H.; Skorikov, A.; Bladt, E.; Béché, A.; Freitag, B.; Verbeeck, J.; Bals, S. |
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges |
2021 |
Ultramicroscopy |
221 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. |
Bandgap measurement of high refractive index materials by off-axis EELS |
2017 |
Ultramicroscopy |
182 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings |
2022 |
Ultramicroscopy |
232 |
18 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. |
Evaluation of different rectangular scan strategies for STEM imaging |
2020 |
Ultramicroscopy |
|
13 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J. |
Interpretation of “Energy-filtered electron-diffracted beam holography” by R.A. Herring |
2006 |
Ultramicroscopy |
106 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Béché, A.; Müller-Caspary, K.; Guzzinati, G.; Luong, M.A.; Den Hertog, M. |
Demonstration of a 2 × 2 programmable phase plate for electrons |
2018 |
Ultramicroscopy |
190 |
73 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Béché, A.; van den Broek, W. |
A holographic method to measure the source size broadening in STEM |
2012 |
Ultramicroscopy |
120 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Bertoni, G. |
Deconvolution of core electron energy loss spectra |
2009 |
Ultramicroscopy |
109 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Bertoni, G. |
Model-based quantification of EELS spectra: treating the effect of correlated noise |
2008 |
Ultramicroscopy |
108 |
16 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Bertoni, G.; Lichte, H. |
A holographic biprism as a perfect energy filter? |
2011 |
Ultramicroscopy |
111 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Bertoni, G.; Schattschneider, P. |
The Fresnel effect of a defocused biprism on the fringes in inelastic holography |
2008 |
Ultramicroscopy
T2 – 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN |
108 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Hébert; Rubino, S.; Novák, P.; Rusz, J.; Houdellier, F.; Gatel, C.; Schattschneider, P. |
Optimal aperture sizes and positions for EMCD experiments |
2008 |
Ultramicroscopy |
108 |
27 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Sc hattschneider, P.; Rosenauer, A. |
Image simulation of high resolution energy filtered TEM images |
2009 |
Ultramicroscopy |
109 |
36 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Tian, H.; Béché, A. |
A new way of producing electron vortex probes for STEM |
2012 |
Ultramicroscopy |
113 |
62 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Van Aert, S. |
Model based quantification of EELS spectra |
2004 |
Ultramicroscopy |
101 |
147 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Van Aert, S.; Bertoni, G. |
Model-based quantification of EELS spectra: including the fine structure |
2006 |
Ultramicroscopy |
106 |
38 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. |
Plasmon holographic experiments: theoretical framework |
2005 |
Ultramicroscopy |
102 |
43 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
Direct structure inversion from exit waves: part 1: theory and simulations |
2010 |
Ultramicroscopy |
110 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
Direct structure inversion from exit waves : part 2 : a practical example |
2012 |
Ultramicroscopy |
116 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
A method to determine the local surface profile from reconstructed exit waves |
2011 |
Ultramicroscopy |
111 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. |
An alternative approach to determine attainable resolution directly from HREM images |
2013 |
Ultramicroscopy |
133 |
|
UA library record; WoS full record |
|
|
|
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. |
Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? |
2012 |
Ultramicroscopy |
114 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Xu, Q.; Zandbergen, H.W.; van Dyck, D. |
Applying an information transmission approach to extract valence electron information from reconstructed exit waves |
2011 |
Ultramicroscopy |
111 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Zanaga, D.; Altantzis, T.; Sanctorum, J.; Freitag, B.; Bals, S. |
An alternative approach for ζ-factor measurement using pure element nanoparticles |
2016 |
Ultramicroscopy |
164 |
19 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Zanaga, D.; Altantzis, T.; Sanctorum, J.; Freitag, B.; Bals, S. |
An alternative approach for \zeta-factor measurement using pure element nanoparticles |
2016 |
Ultramicroscopy |
164 |
19 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Zhang, X.B.; Zhang, X.F.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
The reciprocal space of carbon tubes: a detailed interpretation of the electron diffraction effects |
1994 |
Ultramicroscopy |
54 |
59 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Zhang, X.F.; Zhang, X.B.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Werner, H. |
A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60 |
1994 |
Ultramicroscopy |
55 |
2 |
UA library record; WoS full record; WoS citing articles |
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