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Au@MOF-5 and Au/Mox@MOF-5 (M = Zn, Ti, x = 1, 2) : preparation and microstructural characterisation”. Müller M, Turner S, Lebedev OI, Wang Y, Van Tendeloo G, Fischer RA, European journal of inorganic chemistry , 1876 (2011). http://doi.org/10.1002/ejic.201001297
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New insights in the formation of combined zeolitic/mesoporous materials by using a one-pot templating synthesis”. Vernimmen J, Meynen V, Herregods SJF, Mertens M, Lebedev OI, Van Tendeloo G, Cool P, European journal of inorganic chemistry , 4234 (2011). http://doi.org/10.1002/ejic.201100268
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Metals@MOFs –, loading MOFs with metal nanoparticles for hybrid functions”. Meilikhov M, Yusenko K, Esken D, Turner S, Van Tendeloo G, Fischer RA, European journal of inorganic chemistry 2010, 3701 (2010). http://doi.org/10.1002/ejic.201000473
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Mixed tellurides Ni3-xGaTe2 (0\leq x\leq0.65): crystal and electronic structures, properties, and nickel deficiency effects on vacancy ordering”. Isaeva AA, Makarevich ON, Kutznetsov AN, Doert T, Abakumov AM, Van Tendeloo G, European journal of inorganic chemistry , 1395 (2010). http://doi.org/10.1002/ejic.200901027
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A new Bi4Mn1/3W2/3O8Cl Sillén-Aurivillius intergrowth: synthesis and structural characterisation by quantitative transmission electron microscopy”. Avila-Brande D, Otero-Díaz LC, Landa-Cánovas AR, Bals S, Van Tendeloo G, European journal of inorganic chemistry , 1853 (2006). http://doi.org/10.1002/ejic.200501021
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Fe3O4@MIL-101-A selective and regenerable adsorbent for the removal of as species from water”. Folens K, Leus K, Nicomel NR, Meledina M, Turner S, Van Tendeloo G, Du Laing G, Van Der Voort P, European journal of inorganic chemistry 2016, 4395 (2016). http://doi.org/10.1002/EJIC.201600160
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The influence of acids on tuning the pore size of mesoporous TiO2 templated by non-ionic block copolymers”. Loreto S, Vanrompay H, Mertens M, Bals S, Meynen V, European journal of inorganic chemistry 2018, 62 (2018). http://doi.org/10.1002/EJIC.201701266
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Tuning the crystal structure of A2CoPO4F(A=Li,Na) fluoride-phosphates : a new layered polymorph of LiNaCoPO4F”. Fedotov SS, Aksyonov DA, Samarin AS, Karakulina OM, Hadermann J, Stevenson KJ, Khasanova NR, Abakumov AM, Antipov E V, European journal of inorganic chemistry 2019, 4365 (2019). http://doi.org/10.1002/EJIC.201900660
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From olivine to ringwoodite : a TEM study of a complex process”. Pittarello L, Ji G, Yamaguchi A, Schryvers D, Debaille V, Claeys P, Meteoritics and Planetary Science 50, 944 (2015). http://doi.org/10.1111/maps.12441
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Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy”. Hens S, van Landuyt J, Bender H, Boullart W, Vanhaelemeersch S, Materials science in semiconductor processing 4, 109 (2001). http://doi.org/10.1016/S1369-8001(00)00147-5
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The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures”. Stuer C, van Landuyt J, Bender H, Rooyackers R, Badenes G, Materials science in semiconductor processing 4, 117 (2001). http://doi.org/10.1016/S1369-8001(00)00110-4
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Influence of 4H-SiC substrate miscut on the epitaxy and microstructure of AlGaN/GaN heterostructures”. Gkanatsiou A, Lioutas CB, Frangis N, Polychroniadis EK, Prystawko P, Leszczynski M, Altantzis T, Van Tendeloo G, Materials science in semiconductor processing 91, 159 (2019). http://doi.org/10.1016/j.mssp.2018.11.008
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Microstructure and high temperature transport properties of high quality epitaxial SrFeO3-\delta films”. Solís C, Rossell MD, Garcia G, Figueras A, Van Tendeloo G, Santiso J, Solid state ionics 179, 1996 (2008). http://doi.org/10.1016/j.ssi.2008.06.004
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Synthesis and characterization of oxygen-deficient oxides BaCo1-xYxO3-y' x = 0.15, 0.25 and 0.33, with the perovskite structure”. Lomakov MV, Istomin SY, Abakumov AM, Van Tendeloo G, Antipov EV, Solid state ionics 179, 1885 (2008). http://doi.org/10.1016/j.ssi.2008.05.004
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Thickness-dependent transport properties of Sr4Fe6O13 epitaxial thin films”. Pardo JA, Santiso J, Solis C, Garcia G, Figueras A, Rossell MD, Solid state ionics 177, 423 (2006). http://doi.org/10.1016/J.SSI.2005.11.024
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Cross-section transmission electron microscopy characterization of the near-surface structure of medical Nitinol superelastic tubing”. Potapov PL, Tirry W, Schryvers D, Sivel VGM, Wu M-Y, Aslanidis D, Zandbergen H, Journal of materials science: materials in medicine 18, 483 (2007). http://doi.org/10.1007/s10856-007-2008-y
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Effect of interface evolution on thermal conductivity of vacuum hot pressed SiC/Al composites”. Chen Z, Tan Z, Ji G, Schryvers D, Ouyang Q, Li Z, Advanced engineering materials 17, 1076 (2015). http://doi.org/10.1002/adem.201400412
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RAMS and WRF sensitivity to grid spacing in large-eddy simulations of the dry convective boundary layer”. Ercolani G, Gorle C, Garcia Sánchez C, Corbari C, Mancini M, Computers and fluids 123, 54 (2015). http://doi.org/10.1016/j.compfluid.2015.09.009
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The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography”. Denneulin T, Rouvière JL, Béché, A, Py M, Barnes JP, Rochat N, Hartmann JM, Cooper D, Semiconductor science and technology 26, 1 (2011). http://doi.org/10.1088/0268-1242/26/12/125010
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Strain measurement in semiconductor FinFET devices using a novel moiré, demodulation technique”. Prabhakara V, Jannis D, Béché, A, Bender H, Verbeeck J, Semiconductor science and technology (2019). http://doi.org/10.1088/1361-6641/ab5da2
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Phase offset method of ptychographic contrast reversal correction”. Hofer C, Gao C, Chennit T, Yuan B, Pennycook TJ, Ultramicroscopy , 113922 (2024). http://doi.org/10.1016/j.ultramic.2024.113922
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Atom counting from a combination of two ADF STEM images”. Şentürk DG, Yu CP, De Backer A, Van Aert S, Ultramicroscopy 255, 113859 (2024). http://doi.org/10.1016/j.ultramic.2023.113859
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Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination”. Şentürk DG, De Backer A, Van Aert S, Ultramicroscopy 259, 113941 (2024). http://doi.org/10.1016/j.ultramic.2024.113941
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On central focusing for contrast optimization in direct electron ptychography of thick samples”. Gao C, Hofer C, Pennycook TJ, Ultramicroscopy 256, 113879 (2024). http://doi.org/10.1016/J.ULTRAMIC.2023.113879
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Reliable phase quantification in focused probe electron ptychography of thin materials”. Hofer C, Pennycook TJ, Ultramicroscopy 254, 113829 (2023). http://doi.org/10.1016/j.ultramic.2023.113829
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A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection”. De Backer A, Bals S, Van Aert S, Ultramicroscopy , 113702 (2023). http://doi.org/10.1016/j.ultramic.2023.113702
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Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions”. Zhang Z, Lobato I, De Backer A, Van Aert S, Nellist P, Ultramicroscopy 246, 113671 (2023). http://doi.org/10.1016/j.ultramic.2022.113671
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Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network”. Lobato I, De Backer A, Van Aert S, Ultramicroscopy 251, 113769 (2023). http://doi.org/10.1016/j.ultramic.2023.113769
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Characterization of a Timepix detector for use in SEM acceleration voltage range”. Denisov N, Jannis D, Orekhov A, Müller-Caspary K, Verbeeck J, Ultramicroscopy 253, 113777 (2023). http://doi.org/10.1016/j.ultramic.2023.113777
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Convexity constraints on linear background models for electron energy-loss spectra”. Van den Broek W, Jannis D, Verbeeck J, Ultramicroscopy 254, 113830 (2023). http://doi.org/10.1016/j.ultramic.2023.113830
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