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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
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UA library record |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry |
1991 |
Journal of crystal growth |
110 |
40 |
UA library record; WoS full record; WoS citing articles |
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Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Depth profiling of silver halide microcrystals |
1992 |
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UA library record |
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Bertoni, G.; Verbeeck, J.; Brosens, F. |
Fitting the momentum dependent loss function in EELS |
2011 |
Microscopy research and technique |
74 |
6 |
UA library record; WoS full record; WoS citing articles |
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Lebedev, O.I.; Verbeeck, J.; Van Tendeloo, G.; Hayashi, N.; Terashima, T.; Takano, M. |
Structure and microstructure of epitaxial SrnFenO3n-1 films |
2004 |
Philosophical magazine |
84 |
4 |
UA library record; WoS full record; WoS citing articles |
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Guda, A.A.; Smolentsev, N.; Verbeeck, J.; Kaidashev, E.M.; Zubavichus, Y.; Kravtsova, A.N.; Polozhentsev, O.E.; Soldatov, A.V. |
X-ray and electron spectroscopy investigation of the coreshell nanowires of ZnO:Mn |
2011 |
Solid state communications |
151 |
12 |
UA library record; WoS full record; WoS citing articles |
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Jannis, D.; Müller-Caspary, K.; Béché, A.; Verbeeck, J. |
Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope |
2021 |
Applied Sciences-Basel |
11 |
9 |
UA library record; WoS full record; WoS citing articles |
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Ramachandran, D.; Egoavil, R.; Crabbe, A.; Hauffman, T.; Abakumov, A.; Verbeeck, J.; Vandendael, I.; Terryn, H.; Schryvers, D. |
TEM and AES investigations of the natural surface nano-oxide layer of an AISI 316L stainless steel microfibre |
2016 |
Journal of microscopy |
264 |
12 |
UA library record; WoS full record; WoS citing articles |
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Guzzinati, G.; Béché, A.; McGrouther, D.; Verbeeck, J. |
Prospects for out-of-plane magnetic field measurements through interference of electron vortex modes in the TEM |
2019 |
Journal of optics |
21 |
3 |
UA library record; WoS full record; WoS citing articles |
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Sankaran, K.J.; Hoang, D.Q.; Srinivasu, K.; Korneychuk, S.; Turner, S.; Drijkoningen, S.; Pobedinskas, P.; Verbeeck, J.; Leou, K.C.; Lin, I.N.; Haenen, K. |
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2016 |
Physica status solidi : A : applications and materials science |
213 |
5 |
UA library record; WoS full record; WoS citing articles |
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Korneychuk, S.; Guzzinati, G.; Verbeeck, J. |
Measurement of the Indirect Band Gap of Diamond with EELS in STEM |
2018 |
Physica status solidi : A : applications and materials science |
215 |
6 |
UA library record; WoS full record; WoS citing articles |
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Mortet, V.; Zhang, L.; Eckert, M.; D'Haen, J.; Soltani, A.; Moreau, M.; Troadec, D.; Neyts, E.; De Jaeger, J.C.; Verbeeck, J.; Bogaerts, A.; Van Tendeloo, G.; Haenen, K.; Wagner, P. |
Grain size tuning of nanocrystalline chemical vapor deposited diamond by continuous electrical bias growth : experimental and theoretical study |
2012 |
Physica status solidi : A : applications and materials science |
209 |
31 |
UA library record; WoS full record; WoS citing articles |
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Turner, S.; Shenderova, O.; da Pieve, F.; Lu, Y.-G.; Yücelen, E.; Verbeeck, J.; Lamoen, D.; Van Tendeloo, G. |
Aberration-corrected microscopy and spectroscopy analysis of pristine, nitrogen containing detonation nanodiamond |
2013 |
Physica status solidi : A : applications and materials science |
210 |
37 |
UA library record; WoS full record; WoS citing articles |
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Nord, M.; Verbeeck, J. |
Towards Reproducible and Transparent Science of (Big) Electron Microscopy Data Using Version Control |
2019 |
Microscopy and microanalysis
T2 – Microscopy & Microanalysis 2019, 4-8 August, 2019, Portland, Oregon |
25 |
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UA library record |
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Nord, M.; Verbeeck, J. |
Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis |
2019 |
Microscopy And Microanalysis |
25 |
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Esteban, D.A.; Vanrompay, H.; Skorikov, A.; Béché, A.; Verbeeck, J.; Freitag, B.; Bals, S. |
Fast electron low dose tomography for beam sensitive materials |
2021 |
Microscopy And Microanalysis |
27 |
|
UA library record |
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Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Verbeeck, J. |
EELS investigations of different niobium oxide phases |
2006 |
Microscopy and microanalysis |
12 |
50 |
UA library record; WoS full record; WoS citing articles |
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Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. |
Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy |
2007 |
Microscopy and microanalysis |
13 |
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UA library record |
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Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. |
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy |
2009 |
Microscopy and microanalysis |
15 |
1 |
UA library record; WoS full record; WoS citing articles |
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Bach, D.; Schneider, R.; Gerthsen, D.; Verbeeck, J.; Sigle, W. |
EELS of niobium and stoichiometric niobium-oxide phases: part 1: plasmon and Near-edges fine structure |
2009 |
Microscopy and microanalysis |
15 |
55 |
UA library record; WoS full record; WoS citing articles |
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Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. |
Computational aspects in quantitative EELS |
2010 |
Microscopy and microanalysis |
16 |
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UA library record |
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Bhat, S.G.; Gauquelin, N.; Sebastian, N.K.; Sil, A.; Béché, A.; Verbeeck, J.; Samal, D.; Kumar, P.S.A. |
Orthorhombic vs. hexagonal epitaxial SrIrO3 thin films : structural stability and related electrical transport properties |
2018 |
Europhysics letters |
122 |
4 |
UA library record; WoS full record; WoS citing articles |
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Van Boxem, R.; Verbeeck, J.; Partoens, B. |
Spin effects in electron vortex states |
2013 |
Europhysics letters |
102 |
11 |
UA library record; WoS full record; WoS citing articles |
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Samal, D.; Tan, H.; Takamura, Y.; Siemons, W.; Verbeeck, J.; Van Tendeloo, G.; Arenholz, E.; Jenkins, C.A.; Rijnders, G.; Koster, G. |
Direct structural and spectroscopic investigation of ultrathin films of tetragonal CuO: Six-fold coordinated copper |
2014 |
Europhysics letters |
105 |
15 |
UA library record; WoS full record; WoS citing articles |
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Godet, M.; Vergès-Belmin, V.; Gauquelin, N.; Saheb, M.; Monnier, J.; Leroy, E.; Bourgon, J.; Verbeeck, J.; Andraud, C. |
Nanoscale investigation by TEM and STEM-EELS of the laser induced yellowing |
2018 |
Micron |
115 |
9 |
UA library record; WoS full record; WoS citing articles |
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Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. |
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images |
2014 |
Micron |
63 |
25 |
UA library record; WoS full record; WoS citing articles |
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Béché, A.; Winkler, R.; Plank, H.; Hofer, F.; Verbeeck, J. |
Focused electron beam induced deposition as a tool to create electron vortices |
2015 |
Micron |
80 |
21 |
UA library record; WoS full record; WoS citing articles |
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Achari, A.; Bekaert, J.; Sreepal, V.; Orekhov, A.; Kumaravadivel, P.; Kim, M.; Gauquelin, N.; Pillai, P.B.; Verbeeck, J.; Peeters, F.M.; Geim, A.K.; Milošević, M.V.; Nair, R.R. |
Alternating superconducting and charge density wave monolayers within bulk 6R-TaS₂ |
2022 |
Nano letters |
22 |
12 |
UA library record; WoS full record; WoS citing articles |
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Gauquelin, N.; Forte, F.; Jannis, D.; Fittipaldi, R.; Autieri, C.; Cuono, G.; Granata, V.; Lettieri, M.; Noce, C.; Miletto-Granozio, F.; Vecchione, A.; Verbeeck, J.; Cuoco, M. |
Pattern Formation by Electric-Field Quench in a Mott Crystal |
2023 |
Nano letters |
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2 |
UA library record; WoS full record; WoS citing articles |
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Tan, H.; Tian, H.; Verbeeck, J.; Janssens, K.; Van Tendeloo, G. |
Nanoscale investigation of the degradation mechanism of a historical chrome yellow paint by quantitative electron energy loss spectroscopy mapping of chromium species |
2013 |
Angewandte Chemie: international edition in English |
52 |
29 |
UA library record; WoS full record; WoS citing articles |
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