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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Heidari Mezerji, H.; van den Broek, W.; Bals, S. |
A practical method to determine the effective resolution in incoherent experimental electron tomography |
2011 |
Ultramicroscopy |
111 |
26 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Wang, A.; Van Aert, S.; Goos, P.; van Dyck, D. |
Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits? |
2012 |
Ultramicroscopy |
114 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Chen, D.; Goris, B.; Bleichrodt, F.; Heidari Mezerji, H.; Bals, S.; Batenburg, K.J.; de With, G.; Friedrich, H. |
The properties of SIRT, TVM, and DART for 3D imaging of tubular domains in nanocomposite thin-films and sections |
2014 |
Ultramicroscopy |
147 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bertoni, G.; Beyers, E.; Verbeeck, J.; Mertens, M.; Cool, P.; Vansant, E.F.; Van Tendeloo, G. |
Quantification of crystalline and amorphous content in porous TiO2 samples from electron energy loss spectroscopy |
2006 |
Ultramicroscopy |
106 |
83 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. |
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy |
2009 |
Ultramicroscopy |
109 |
166 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Schattschneider, P.; Verbeeck, J.; Hamon, A.L. |
Real space maps of atomic transitions |
2009 |
Ultramicroscopy |
109 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Schattschneider, P.; Ennen, I.; Stoger-Pollach, M.; Verbeeck, J.; Mauchamp, V.; Jaouen, M. |
Real space maps of magnetic moments on the atomic scale: theory and feasibility |
2010 |
Ultramicroscopy |
110 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Zhang, X.B.; Zhang, X.F.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
The reciprocal space of carbon tubes: a detailed interpretation of the electron diffraction effects |
1994 |
Ultramicroscopy |
54 |
59 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Müller, K.; Schowalter, M.; Jansen, J.; Tsuda, K.; Titantah, J.; Lamoen, D.; Rosenauer, A. |
Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data |
2009 |
Ultramicroscopy |
109 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Amelinckx, S.; Milat, O.; Van Tendeloo, G. |
Selective imaging of sublattices in complex structures |
1993 |
Ultramicroscopy |
51 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Milat, O.; Van Tendeloo, G.; Amelinckx, S. |
Selective imaging of the “substructures” in incommensurately modulated intergrowth crystal structures |
1992 |
Ultramicroscopy |
41 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Zhang, X.F.; Zhang, X.B.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Werner, H. |
A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60 |
1994 |
Ultramicroscopy |
55 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. |
Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography |
2013 |
Ultramicroscopy |
131 |
73 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Tendeloo, G.; Amelinckx, S.; Muto, S.; Verheijen, M.A.; van Loosdrecht, P.H.M.; Meijer, G. |
Structures and phase transitions in C60 and C70 fullerites |
1993 |
Ultramicroscopy |
51 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Ke, X.; Bals, S.; Romo Negreira, A.; Hantschel, T.; Bender, H.; Van Tendeloo, G. |
TEM sample preparation by FIB for carbon nanotube interconnects |
2009 |
Ultramicroscopy |
109 |
21 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Landuyt, J. |
The evolution of HVEM application in antwerp |
1991 |
Ultramicroscopy
T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan |
39 |
|
UA library record; WoS full record |
|
|
|
Verbeeck, J.; Bertoni, G.; Schattschneider, P. |
The Fresnel effect of a defocused biprism on the fringes in inelastic holography |
2008 |
Ultramicroscopy
T2 – 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN |
108 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Schattschneider, P.; Verbeeck, J. |
Theory of free electron vortices |
2011 |
Ultramicroscopy |
111 |
57 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. |
Throughput maximization of particle radius measurements by balancing size and current of the electron probe |
2011 |
Ultramicroscopy |
111 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Broek, W.; Verbeeck, J.; Schryvers, D.; de Backer, S.; Scheunders, P. |
Tomographic spectroscopic imaging; an experimental proof of concept |
2009 |
Ultramicroscopy |
109 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Béché, A.; Rouvière, J.L.; Barnes, J.P.; Cooper, D. |
Dark field electron holography for strain measurement |
2011 |
Ultramicroscopy |
111 |
31 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. |
Bandgap measurement of high refractive index materials by off-axis EELS |
2017 |
Ultramicroscopy |
182 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Grieb, T.; Krause, F.F.; Mahr, C.; Zillmann, D.; Müller-Caspary, K.; Schowalter, M.; Rosenauer, A. |
Optimization of NBED simulations for disc-detection measurements |
2017 |
Ultramicroscopy |
181 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Alania, M.; Lobato Hoyos, I.P.; Van Aert, S. |
Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy : a comparison study in terms of integrated intensity and atomic column position measurement |
2018 |
Ultramicroscopy |
184 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. |
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation |
2018 |
Ultramicroscopy |
184 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Korneychuk, S.; Partoens, B.; Guzzinati, G.; Ramaneti, R.; Derluyn, J.; Haenen, K.; Verbeeck, J. |
Exploring possibilities of band gap measurement with off-axis EELS in TEM |
2018 |
Ultramicroscopy |
189 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Grieb, T.; Krause, F.F.; Schowalter, M.; Zillmann, D.; Sellin, R.; Müller-Caspary, K.; Mahr, C.; Mehrtens, T.; Bimberg, D.; Rosenauer, A. |
Strain analysis from nano-beam electron diffraction : influence of specimen tilt and beam convergence |
2018 |
Ultramicroscopy |
190 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. |
Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose |
2019 |
Ultramicroscopy |
203 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Susi, T.; Madsen, J.; Ludacka, U.; Mortensen, J.J.; Pennycook, T.J.; Lee, Z.; Kotakoski, J.; Kaiser, U.; Meyer, J.C. |
Efficient first principles simulation of electron scattering factors for transmission electron microscopy |
2019 |
Ultramicroscopy |
197 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Pennycook, T.J.; Martinez, G.T.; Nellist, P.D.; Meyer, J.C. |
High dose efficiency atomic resolution imaging via electron ptychography |
2019 |
Ultramicroscopy |
196 |
1 |
UA library record; WoS full record; WoS citing articles |
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