toggle visibility
Search within Results:
Display Options:

Select All    Deselect All
List View
 |   | 
   print
  Author Title Year (up) Publication Volume Times cited Additional Links Links
Bogaerts, A.; Gijbels, R. Role of Ar2+ and Ar+2 ions in a direct current argon glow discharge: a numerical description 1999 Journal of applied physics 86 50 UA library record; WoS full record; WoS citing articles doi
Farvacque, J.L.; Bougrioua, Z.; Moerman, I.; Van Tendeloo, G.; Lebedev, O. Role of the defect microstructure on the electrical transport properties in undoped and Si-doped GaN grown by LP-MOVPE 1999 Physica: B : condensed matter T2 – 20th International Conference on Defects in Semiconductors (ICDS-20), JUL 26-30, 1999, BERKELEY, CA 273-4 5 UA library record; WoS full record; WoS citing articles pdf doi
Richard, O.; Schuddinck, W.; Van Tendeloo, G.; Millange, F.; Hervieu, M.; Caignaert, C.; Raveau, B. Room temperature and low-temperature structure of Nd1-xCaxMnO3 (0.3*x*0.5) 1999 Acta crystallographica: section A: foundations of crystallography 55 24 UA library record; WoS full record; WoS citing articles doi
Baguer, N.; Bogaerts, A.; Gijbels, R. A self-consistent mathematical model of a hollow cathode glow discharge 1999 UA library record; WoS full record;
Berezhnoi, S.; Kaganovich, I.; Misina, M.; Bogaerts, A.; Gijbels, R. Semianalytical description of nonlocal secondary electrons in a radio-frequency capacitively coupled plasma at intermediate pressures 1999 IEEE transactions plasma science 27 7 UA library record; WoS full record; WoS citing articles doi
Herrebout, D.; Bogaerts, A.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. Simulation of plasma processes in plasma assisted CVD reactors 1999 UA library record; WoS full record;
Helm, M.; Hilber, W.; Strasser, G.; de Meester, R.; Peeters, F.M.; Wacker, A. Simultaneous investigation of vertical transport and intersubband absorption in a superlattice: continuum Wannier-Strak ladders and next-nearest neighbor tunneling 1999 Physica: B : condensed matter 272 1 UA library record; WoS full record; WoS citing articles doi
Maignan, A.; Martin, C.; Van Tendeloo, G.; Hervieu, M.; Raveau, B. Size mismatch : a crucial factor for generating a spin-glass insulator in manganites 1999 Physical review : B : condensed matter and materials physics 60 75 UA library record; WoS full record; WoS citing articles url doi
Peeters, F.M.; Reijniers, J.; Badalian, S.M.; Vasilopoulos, P. Snake orbits in hybrid semiconductor/ferromagnetic devices 1999 Microelectronic engineering 47 6 UA library record; WoS full record; WoS citing articles doi
van Vaeck, L.; Adriaens, A.; Gijbels, R. Static secondary ion mass spectrometry (S-SIMS): part 1: methodology and structural interpretation 1999 Mass spectrometry reviews 18 112 UA library record; WoS full record; WoS citing articles
Nistor, L.; van Landuyt, J.; Ralchenko, V. Structural aspects of CVD idamond wafers grown at different hydrogen flow rates 1999 Physica status solidi: A: applied research 171 15 UA library record; WoS full record; WoS citing articles doi
Schuddinck, W.; Van Tendeloo, G.; Barnabé, A.; Hervieu, M.; Raveau, B. Structural determination of the charge ordering process in Nd0.5Ca0.5Mn1-xCrxO3 manganites 1999 Journal of solid state chemistry 148 12 UA library record; WoS full record; WoS citing articles pdf doi
Hadermann, J.; Abakumov, A.M.; Lebedev, O.I.; Van Tendeloo, G.; Rozova, M.G.; Shpanchenko, R.V.; Pavljuk, B.P.; Kopnin, E.M.; Antipov, E.V. Structural transformations in the fluorinated T* phase 1999 Journal of solid state chemistry 147 8 UA library record; WoS full record; WoS citing articles pdf doi
Lebedev, O.I.; Van Tendeloo, G.; Abakumov, A.M.; Amelinckx, S.; Leibold, B.; Habermeier, H.-U. A study of the domain structure of epitaxial (La-Ca)MnO3 films by high-resolution transmission electron microscopy 1999 Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 79 27 UA library record; WoS full record; WoS citing articles pdf doi
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) 1999 Journal of analytical atomic spectrometry 14 10 UA library record; WoS full record; WoS citing articles doi
Colomer, J.-F.; Bister, G.; Willems, I.; Konya, Z.; Fonseca, A.; Van Tendeloo, G.; Nagy, J.B. Synthesis of single wall carbon nanotubes by catalytic decomposition of hydrocarbons 1999 Chemical communications 110 UA library record; WoS full record; WoS citing articles pdf doi
Fröba, M.; Köhn, R.; Bouffaud, G.; Richard, O.; Van Tendeloo, G. _Fe2O3 nanoparticles with mesoporous MCM-48 silica: in situ formation and characterisation 1999 Chemistry of materials 11 202 UA library record; WoS full record; WoS citing articles pdf doi
Tafuri, F.; Carillo, F.; Lombardi, F.; Granozio, F.M.; dii Uccio, U.S.; Testa, G.; Sarnelli, E.; Verbist, K.; Van Tendeloo, G. YBa2Cu3O7-x Josephson junctions and dc SQUIDs based on 45\text{\textdegree} a-axis tilt and twist grain boundaries : atomically clean interfaces for applications 1999 Superconductor science and technology T2 – International Superconductive Electronics Conference, JUN 21-25, 1999, BERKELEY, CALIFORNIA 12 3 UA library record; WoS full record; WoS citing articles pdf doi
Partoens, B.; Matulis, A.; Peeters, F.M. The two electron artificial molecule 1999 Physical review : B : condensed matter and materials physics 59 34 UA library record; WoS full record; WoS citing articles doi
Mayrock, O.; Wünsche, H.-J.; Henneberger, F.; Riva, C.; Schweigert, V.A.; Peeters, F.M. Weakly localized biexcitons in quantum wells 1999 Physical review : B : condensed matter and materials physics 60 17 UA library record; WoS full record; WoS citing articles doi
Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers 1999 Thin solid films : an international journal on the science and technology of thin and thick films 343/344 1 UA library record; WoS full record; WoS citing articles doi
Vannier, R.-N.; Théry, O.; Kinowski, C.; Huvé, M.; Van Tendeloo, G.; Suard, E.; Abraham, F. Zr substituted bismuth uranate 1999 Journal of materials chemistry 9 4 UA library record; WoS full record; WoS citing articles pdf doi
Kuczumov, A.; Vekemans, B.; Schalm, O.; Dorriné, W.; Chevallier, P.; Dillmann, P.; Ro, C.-U.; Janssens, K.; Van Grieken, R. Analyses of petrified wood by electron, X-ray and optical microprobes 1999 Journal of analytical atomic spectroscopy 14 UA library record; WoS full record; WoS citing articles doi
Schalm, O.; Janssens, K.; Caen, J.; Adams, F. Chemische en morfologische karakterisatie van de grissailles van Capronnier met behulp van EPXMA 1999 UA library record
Deraedt, I.; Janssens, K.; Veeckman, J. Compositional distinctions between 16th century “Façon-de-Venise” and Venetian glass vessels, excavated in Antwerp, Belgium 1999 Journal of analytical atomic spectroscopy 14 UA library record; WoS full record; WoS citing articles doi
de Raedt, I.; Janssens, K.; Veeckman, J. Echt of namaak? Venetiaans glas uit het oude Antwerpen 1999 De wetenschappelijke bibliotheek 67 UA library record
Janssens, K.; Vincze, L.; Wei, F.; Proost, K.; Vekemans, B.; Vittiglio, G.; Yan, Y.; Falkenberg, G. Feasibility of (trace-level) micro-XANES at Beamline L 1999 UA library record
Vekemans, B.; Vincze, L.; Vittiglio, G.; Janssens, K.; Adams, F. Fluorescent tomography of phantom samples at the beamline L 1999 HASYLAB Jahresbericht UA library record
Vittiglio, G.; Janssens, K.; Adams, F.; Oost, A. Localised and non-destructive analysis of metallic artefacts from ancient Egypt by means of a compact μ-XRF instrument 1999 Spectrochimica acta: part B : atomic spectroscopy 54 UA library record; WoS full record; WoS citing articles doi
Claes, M.; van Ham, R.; Janssens, K.; Van Grieken, R.; Klockenkämper, R.; von Bohlen, A. Micro-analysis of artists' pigments by grazing-emission X-ray fluorescence spectrometry 1999 Advances in X-ray analysis 41 UA library record
Select All    Deselect All
List View
 |   | 
   print

Save Citations:
Export Records: