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Author Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. doi  openurl
  Title Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) Type A1 Journal article
  Year (down) 1999 Publication Journal of analytical atomic spectrometry Abbreviated Journal J Anal Atom Spectrom  
  Volume 14 Issue Pages 429-434  
  Keywords A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication London Editor  
  Language Wos 000079138500015 Publication Date 2002-07-26  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0267-9477;1364-5544; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 3.379 Times cited 10 Open Access  
  Notes Approved Most recent IF: 3.379; 1999 IF: 3.677  
  Call Number UA @ lucian @ c:irua:24928 Serial 3390  
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