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	Author	van Vaeck, L.; Adriaens, A.; Gijbels, R.
	Title	Static secondary ion mass spectrometry (S-SIMS): part 1: methodology and structural interpretation			Type	A1 Journal article
	Year	1999	Publication	Mass spectrometry reviews	Abbreviated Journal	Mass Spectrom Rev
	Volume	18	Issue		Pages	1-47
	Keywords	A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
	Abstract
	Address
	Corporate Author				Thesis
	Publisher		Place of Publication	New York, N.Y.	Editor
	Language		Wos	000082318900001	Publication Date	0000-00-00
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	0277-7037	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor	9.373	Times cited	112	Open Access
	Notes				Approved	Most recent IF: 9.373; 1999 IF: 6.885
	Call Number	UA @ lucian @ c:irua:24931			Serial	3151
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