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  Author Title Year Publication (up) Volume Times cited Additional Links Links
Jannis, D.; Müller-Caspary, K.; Béché, A.; Verbeeck, J. Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope 2021 Applied Sciences-Basel 11 9 UA library record; WoS full record; WoS citing articles pdf url doi
Hillen, M.; Legrand, S.; Dirkx, Y.; Janssens, K.; van der Snickt, G.; Caen, J.; Steenackers, G. Cluster analysis of IR thermography data for differentiating glass types in historical leaded-glass windows 2020 Applied Sciences-Basel 10 UA library record; WoS full record; WoS citing articles url doi
Azadi, H.; Akbar Barati, A.; Rafiaani, P.; Raufirad, V.; Zarafshani, K.; Mamoorian, M.; Van Passel, S.; Lebailly, P. Agricultural land conversion drivers in Northeast Iran : application of structural equation model 2016 Applied Spatial Analysis And Policy 9 6 UA library record; WoS full record; WoS citing articles doi
van der Snickt, G.; Martins, A.; Delaney, J.; Janssens, K.; Zeibel, J.; Duffy, M.; McGlinchey, C.; Van Driel, B.; Dik, J. Exploring a hidden painting below the surface of Rene Magritte's Le Portrait 2016 Applied spectroscopy 70 13 UA library record; WoS full record; WoS citing articles pdf doi
LaBrecque, J.J.; Beusen, J.M.; Van Grieken, R.E. Analysis of lateritic material from Cerro impacto by instrumental neutron activation employing a low-energy photon semiconductor and a high-energy Ge(Li) detector 1986 Applied spectroscopy 40 UA library record; WoS full record; WoS citing articles doi
Schelles, W.; de Gendt, S.; Müller, V.; Van Grieken, R. Evaluation of secondary cathodes for glow discharge mass spectrometry analysis of different nonconducting sample types 1995 Applied spectroscopy 49 UA library record; WoS full record; WoS citing articles doi
Spolnik, Z.; Belikov, K.; van Meel, K.; Adriaenssens, E.; de Roeck, F.; Van Grieken, R. Optimization of measurement conditions of an energy dispersive X-ray fluorescence spectrometer with high-energy polarized beam excitation for analysis of aerosol filters 2005 Applied spectroscopy 59 UA library record; WoS full record; WoS citing articles doi
Potgieter-Vermaak, S.S.; Van Grieken, R. Preliminary evaluation of micro-Raman spectrometry for the characterization of individual aerosol particles 2006 Applied spectroscopy 60 UA library record; WoS full record; WoS citing articles doi
Marguí, E.; Van Grieken, R.; Fontàs, C.; Hidalgo, M.; Queralt, I. Preconcentration methods for the analysis of liquid samples by X-ray fluorescence techniques 2010 Applied spectroscopy reviews 45 UA library record; WoS full record; WoS citing articles doi
Nowak, J.; Nowak, D.; Chevallier, P.; Lekki, J.; Van Grieken, R.; Kuczumov, A. Analysis of composite structure and primordial wood remains in petrified wood 2007 Applied spectrsocopy 61 UA library record; WoS full record; WoS citing articles doi
Muret, P.; Nguyen, T.T.A.; Frangis, N.; Van Tendeloo, G.; van Landuyt, J. Photoelectric and electrical responses of several erbium silicide/silicon interfaces 1996 Applied surface science T2 – International Symposium on Si Heterostructures – From Physics to Devices, SEP 11-14, 1995, IRAKLION, GREECE 102 3 UA library record; WoS full record; WoS citing articles pdf doi
Vanhellemont, J.; Maes, H.E.; Schaekers, M.; Armigliato, A.; Cerva, H.; Cullis, A.; de Sande, J.; Dinges, H.; Hallais, J.; Nayar, V.; Pickering, C.; Stehlé, J.L.; Van Landuyt, J.; Walker, C.; Werner, H.; Salieri, P.; Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry 1993 Applied surface science T2 – SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63 13 UA library record; WoS full record; WoS citing articles pdf doi
Adriaensen, L.; Vangaever, F.; Gijbels, R. A comparative study of carbocyanine dyes measured with TOF-SIMS and other mass spectrometric techniques 2004 Applied surface science 231/232 7 UA library record; WoS full record; WoS citing articles doi
Ignatova, V.A.; Conard, T.; Möller, W.; Vandervorst, W.; Gijbels, R. Depth profiling of ZrO2/SiO2/Si stacks : a TOF-SIMS and computer simulation study 2004 Applied surface science 231/232 4 UA library record; WoS full record; WoS citing articles doi
Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate 1996 Applied surface science 102 9 UA library record; WoS full record; WoS citing articles doi
de Mondt, R.; Adriaensen, L.; Vangaever, F.; Lenaerts, J.; van Vaeck, L.; Gijbels, R. Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) 2006 Applied surface science 252 9 UA library record; WoS full record; WoS citing articles doi
van den Broek, B.; Houssa, M.; Scalise, E.; Pourtois, G.; Afanas'ev, V.V.; Stesmans, A. First-principles electronic functionalization of silicene and germanene by adatom chemisorption 2014 Applied surface science 291 32 UA library record; WoS full record; WoS citing articles doi
Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G.; Frangis, N.; van Landuyt, J. High crystalline quality erbium silicide films on (100) silicon grown in high vacuum 1996 Applied surface science 102 14 UA library record; WoS full record; WoS citing articles doi
Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. Imaging TOF-SIMS for the surface analysis of silver halide microcrystals 2003 Applied surface science 203/204 7 UA library record; WoS full record; WoS citing articles doi
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks 2003 Applied surface science 203 15 UA library record; WoS full record; WoS citing articles doi
Vasiliev, A.L.; Stepantsov, E.A.; Ivanov, Z.G.; Verbist, K.; Van Tendeloo, G.; Olsson, E. The microstructure and interfaces of intermediate layers in sapphire bicrystals 1997 Applied surface science 119 2 UA library record; WoS full record; WoS citing articles
Adriaensen, L.; Vangaever, F.; Gijbels, R. Organic SIMS: the influence of time on the ion yield enhancement by silver and gold deposition 2004 Applied surface science 231/232 10 UA library record; WoS full record; WoS citing articles doi
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings 2006 Applied surface science 252 3 UA library record; WoS full record; WoS citing articles doi
Houssa, M.; van den Broek, B.; Scalise, E.; Ealet, B.; Pourtois, G.; Chiappe, D.; Cinquanta, E.; Grazianetti, C.; Fanciulli, M.; Molle, A.; Afanas’ev, V.V.; Stesmans, A.; Theoretical aspects of graphene-like group IV semiconductors 2014 Applied surface science 291 20 UA library record; WoS full record; WoS citing articles doi
Scalise, E.; Cinquanta, E.; Houssa, M.; van den Broek, B.; Chiappe, D.; Grazianetti, C.; Pourtois, G.; Ealet, B.; Molle, A.; Fanciulli, M.; Afanas’ev, V.V.; Stesmans, A.; Vibrational properties of epitaxial silicene layers on (111) Ag 2014 Applied surface science 291 36 UA library record; WoS full record; WoS citing articles doi
Nematollahi, P.; Neyts, E.C. A comparative DFT study on CO oxidation reaction over Si-doped BC2N nanosheet and nanotube 2018 Applied surface science 439 8 UA library record; WoS full record; WoS citing articles doi
Aydin, H.; Bacaksiz, C.; Yagmurcukardes, N.; Karakaya, C.; Mermer, O.; Can, M.; Senger, R.T.; Sahin, H.; Selamet, Y. Experimental and computational investigation of graphene/SAMs/n-Si Schottky diodes 2018 Applied Surface Science 428 2 UA library record; WoS full record; WoS citing articles doi
Sathiyamoorthy, S.; Girijakumari, G.; Kannan, P.; Venugopal, K.; Thiruvottriyur Shanmugam, S.; Veluswamy, P.; De Wael, K.; Ikeda, H. Tailoring the functional properties of polyurethane foam with dispersions of carbon nanofiber for power generator applications 2018 Applied surface science 449 4 UA library record; WoS full record; WoS citing articles pdf url doi
Nematollahi, P.; Neyts, E.C. Direct methane conversion to methanol on M and MN4 embedded graphene (M = Ni and Si): a comparative DFT study 2019 Applied surface science 496 2 UA library record; WoS full record; WoS citing articles pdf doi
Sozen, Y.; Eren, I.; Ozen, S.; Yagmurcukardes, M.; Sahin, H. Interaction of Ge with single layer GaAs : from Ge-island nucleation to formation of novel stable monolayers 2020 Applied Surface Science 505 UA library record; WoS full record pdf url doi
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