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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Vasiliev, A.L.; Van Tendeloo, G.; Boikov, Y.; Olsson, E.; Ivanov, S. |
Microstructure of YBa2Cu3O7-x films on buffered Si for microelectronic applications |
1997 |
Superconductor science and technology |
10 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vasiliev, A.L.; Stepantsov, E.A.; Ivanov, Z.G.; Verbist, K.; Van Tendeloo, G.; Olsson, E. |
The microstructure and interfaces of intermediate layers in sapphire bicrystals |
1997 |
Applied surface science |
119 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vasiliev, A.L.; Stepantsov, E.A.; Ivanov, Z.G.; Olsson, E.; Verbist, K.; Van Tendeloo, G. |
Structure of artificial grain boundaries in sapphire bicrystals with intermediate layers |
1997 |
Interface science |
5 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Vasiliev, A.L.; Van Tendeloo, G.; Amelinckx, S.; Boikov, Y.; Olsson, E.; Ivanov, Z. |
Structural aspect of YBa2Cu3O7-x films on Sis with complex barrier layers |
1995 |
Physica: C : superconductivity |
244 |
28 |
UA library record; WoS full record; WoS citing articles |
|
|
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Verbist, K.; Vasiliev, A.L.; Van Tendeloo, G. |
Y2O3 inclusions in YBa2Cu3O7-\delta thin films |
1995 |
Applied physics letters |
66 |
28 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Zhang, X.B.; Vasiliev, A.L.; Van Tendeloo, G.; He, Y.; Yu, L.-M.; Thiry, P.A. |
EM, XPS and LEED study of deposition of Ag on hydrogenated Si substrate prepared by wet chemical treatments |
1995 |
Surface science : a journal devoted to the physics and chemistry of interfaces |
340 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
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Vasiliev, A.L.; Van Tendeloo, G.; Boikov, Y.; Olsson, E.; Ivanov, Z.; Claeson, T.; Kiselev, N.A. |
Structural aspects of the combination of Si and YBa2Cu3O7-x |
1995 |
Institute of physics conference series |
146 |
|
UA library record; WoS full record; |
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