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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis |
2003 |
Institute of physics conference series |
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UA library record; WoS full record; |
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Nistor, L.C.; Richard, O.; Zhao, O.; Bender, H.; Stesmans, A.; Van Tendeloo, G. |
A microstructural study of the thermal stability of atomic layer deposited Al2O3 thin films |
2003 |
Institute of physics conference series
T2 – Microscopy of semiconducting materials |
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UA library record; WoS full record; |
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Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K. |
Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation |
2001 |
Institute of physics conference series |
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UA library record; WoS full record; |
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Nistor, L.; Bender, H.; van Landuyt, J.; Nemeth, S.; Boeve, H.; De Boeck, J.; Borghs, G. |
HREM investigation of a Fe/GaN/Fe tunnel junction |
2001 |
Institute of physics conference series
T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England |
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UA library record; WoS full record; |
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Hens, S.; Bender, H.; Donaton, R.A.; Maex, K.; Vanhaelemeersch, S.; van Landuyt, J. |
EFTEM study of plasma etched low-k Si-O-C dielectrics |
2001 |
Institute of physics conference series
T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, UNIV OXFORD, OXFORD, ENGLAND |
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UA library record; WoS full record; |
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Clustering of vacancies on {113} planes in Si layers close to Si-Si3N4 interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation |
1999 |
Institute of physics conference series
T2 – Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND |
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UA library record; WoS full record; |
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Vasiliev, A.L.; Van Tendeloo, G.; Boikov, Y.; Olsson, E.; Ivanov, Z.; Claeson, T.; Kiselev, N.A. |
Structural aspects of the combination of Si and YBa2Cu3O7-x |
1995 |
Institute of physics conference series |
146 |
|
UA library record; WoS full record; |
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Van Tendeloo, G.; op de Beeck, M.; De Meulenaere, P.; van Dyck, D. |
Towards quantitative high resolution electron microscopy? |
1995 |
Institute of physics conference series |
147 |
|
UA library record; WoS full record; |
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Vincze, L.; Janssens, K.; Adams, F. |
X-ray optics for synchrotron-radiation-induced X-ray micro fluorescence at the european synchrotron-radiation facility, Grenoble |
1993 |
Institute of physics conference series |
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UA library record; WoS full record |
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Eeckhaoudt, S.; Landsberg, J.; Van Grieken, R.; Jacob, W.; Watt, F.; Witters, H. |
A microanalytical study of the gills of aluminium-exposed catfish |
1993 |
Institute of physics conference series
T2 – Proceedings of the 13th International Congress on X-Ray Optics and Microanalysis / Kenway, P.B. [edit.] |
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UA library record; WoS full record |
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