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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links  |
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Guzzinati, G.; Altantzis, T.; Batuk, M.; De Backer, A.; Lumbeeck, G.; Samaee, V.; Batuk, D.; Idrissi, H.; Hadermann, J.; Van Aert, S.; Schryvers, D.; Verbeeck, J.; Bals, S. |
Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp |
2018 |
Materials |
11 |
15 |
UA library record; WoS full record; WoS citing articles |
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Bals, S.; Goris, B.; de Backer, A.; Van Aert, S.; Van Tendeloo, G. |
Atomic resolution electron tomography |
2016 |
MRS bulletin |
41 |
19 |
UA library record; WoS full record; WoS citing articles |
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Klingstedt, M.; Sundberg, M.; Eriksson, L.; Haigh, S.; Kirkland, A.; Grüner, D.; de Backer, A.; Van Aert, S.; Tarasaki, O. |
Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x\sim0.11) |
2012 |
Zeitschrift für Kristallographie |
227 |
4 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative |
2006 |
Optics express |
14 |
45 |
UA library record; WoS full record; WoS citing articles |
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Jones, L.; Yang, H.; Pennycook, T.J.; Marshall, M.S.J.; Van Aert, S.; Browning, N.D.; Castell, M.R.; Nellist, P.D. |
Smart Align : a new tool for robust non-rigid registration of scanning microscope data |
2015 |
Advanced Structural and Chemical Imaging |
1 |
131 |
UA library record; WoS full record; WoS citing articles |
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Monai, M.; Jenkinson, K.; Melcherts, A.E.M.; Louwen, J.N.; Irmak, E.A.; Van Aert, S.; Altantzis, T.; Vogt, C.; van der Stam, W.; Duchon, T.; Smid, B.; Groeneveld, E.; Berben, P.; Bals, S.; Weckhuysen, B.M. |
Restructuring of titanium oxide overlayers over nickel nanoparticles during catalysis |
2023 |
Science |
380 |
29 |
UA library record; WoS full record; WoS citing articles |
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Friedrich, T.; Yu, C.-P.; Verbeek, J.; Pennycook, T.; Van Aert, S. |
Phase retrieval from 4-dimensional electron diffraction datasets |
2021 |
Proceedings
T2 – IEEE International Conference on Image Processing (ICIP), SEP 19-22, 2021, Electr. network |
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UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. |
Advanced electron crystallography through model-based imaging |
2016 |
IUCrJ |
3 |
30 |
UA library record; WoS full record; WoS citing articles |
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Groenendijk, D.J.; Autieri, C.; van Thiel, T.C.; Brzezicki, W.; Hortensius, J.R.; Afanasiev, D.; Gauquelin, N.; Barone, P.; van den Bos, K.H.W.; van Aert, S.; Verbeeck, J.; Filippetti, A.; Picozzi, S.; Cuoco, M.; Caviglia, A.D. |
Berry phase engineering at oxide interfaces |
2020 |
|
2 |
58 |
UA library record; WoS full record; WoS citing articles |
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Samal, D.; Gauquelin, N.; Takamura, Y.; Lobato, I.; Arenholz, E.; Van Aert, S.; Huijben, M.; Zhong, Z.; Verbeeck, J.; Van Tendeloo, G.; Koster, G. |
Unusual structural rearrangement and superconductivity in infinite layer cuprate superlattices |
2023 |
Physical review materials |
7 |
|
UA library record; WoS full record |
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Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D. |
Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range |
2006 |
Physical review letters |
96 |
69 |
UA library record; WoS full record; WoS citing articles |
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van Thiel, T. c.; Brzezicki, W.; Autieri, C.; Hortensius, J. r.; Afanasiev, D.; Gauquelin, N.; Jannis, D.; Janssen, N.; Groenendijk, D. j.; Fatermans, J.; Van Aert, S.; Verbeeck, J.; Cuoco, M.; Caviglia, A. d. |
Coupling Charge and Topological Reconstructions at Polar Oxide Interfaces |
2021 |
Physical Review Letters |
127 |
17 |
UA library record; WoS full record; WoS citing articles |
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De wael, A.; De Backer, A.; Jones, L.; Varambhia, A.; Nellist, P.D.; Van Aert, S. |
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy |
2020 |
Physical Review Letters |
124 |
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UA library record; WoS full record; WoS citing articles |
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Müller-Caspary, K.; Grieb, T.; Müßener, J.; Gauquelin, N.; Hille, P.; Schörmann, J.; Verbeeck, J.; Van Aert, S.; Eickhoff, M.; Rosenauer, A. |
Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy |
2019 |
Physical review letters |
122 |
26 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; De Backer, A.; Jones, L.; Martinez, G.T.; Béché, A.; Nellist, P.D. |
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy |
2019 |
Physical review letters |
122 |
3 |
UA library record; WoS full record; WoS citing articles |
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Fatermans, J.; den Dekker, A. J.; Müller-Caspary, K.; Lobato, I.; O’Leary, C. M.; Nellist, P. D.; Van Aert, S. |
Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images |
2018 |
Physical review letters |
121 |
6 |
UA library record; WoS full record; WoS citing articles |
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van den Bos, K.H. W.; De Backer, A.; Martinez, G.T.; Winckelmans, N.; Bals, S.; Nellist, P.D.; Van Aert, S. |
Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy |
2016 |
Physical review letters |
116 |
46 |
UA library record; WoS full record; WoS citing articles |
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Müller-Caspary, K.; Duchamp, M.; Roesner, M.; Migunov, V.; Winkler, F.; Yang, H.; Huth, M.; Ritz, R.; Simson, M.; Ihle, S.; Soltau, H.; Wehling, T.; Dunin-Borkowski, R.E.; Van Aert, S.; Rosenauer, A. |
Atomic-scale quantification of charge densities in two-dimensional materials |
2018 |
Physical review B |
98 |
10 |
UA library record; WoS full record; WoS citing articles |
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Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. |
Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures |
2013 |
Physical review : B : condensed matter and materials physics |
88 |
15 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; de Backer, A.; Martinez, G.T.; Goris, B.; Bals, S.; Van Tendeloo, G.; Rosenauer, A. |
Procedure to count atoms with trustworthy single-atom sensitivity |
2013 |
Physical review : B : condensed matter and materials physics |
87 |
106 |
UA library record; WoS full record; WoS citing articles |
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Friedrich, T.; Yu, C.-P.; Verbeeck, J.; Van Aert, S. |
Phase object reconstruction for 4D-STEM using deep learning |
2023 |
Microscopy and microanalysis |
29 |
1 |
UA library record; WoS full record; WoS citing articles |
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De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. |
StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images |
2017 |
Journal of physics : conference series
T2 – Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK |
902 |
1 |
UA library record; WoS full record; WoS citing articles |
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De Backer, A.; De Wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits? |
2015 |
Journal of physics : conference series |
644 |
|
UA library record; WoS full record |
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de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. |
Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits? |
2015 |
Journal of physics : conference series |
644 |
|
UA library record |
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Schryvers, D.; Cao, S.; Tirry, W.; Idrissi, H.; Van Aert, S. |
Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials |
2013 |
Science and technology of advanced materials |
14 |
6 |
UA library record; WoS full record; WoS citing articles |
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van den Bos, K.H.W.; Altantzis, T.; De Backer, A.; Van Aert, S.; Bals, S. |
Recent breakthroughs in scanning transmission electron microscopy of small species |
2018 |
Advances in Physics: X |
3 |
8 |
UA library record; WoS full record; WoS citing articles |
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Liao, Z.; Gauquelin, N.; Green, R.J.; Müller-Caspary, K.; Lobato, I.; Li, L.; Van Aert, S.; Verbeeck, J.; Huijben, M.; Grisolia, M.N.; Rouco, V.; El Hage, R.; Villegas, J.E.; Mercy, A.; Bibes, M.; Ghosez, P.; Sawatzky, G.A.; Rijnders, G.; Koster, G. |
Metal–insulator-transition engineering by modulation tilt-control in perovskite nickelates for room temperature optical switching |
2018 |
America |
115 |
50 |
UA library record; WoS full record; WoS citing articles |
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Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S. |
Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images |
2014 |
Applied physics letters |
105 |
12 |
UA library record; WoS full record; WoS citing articles |
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Fatermans, J.; Romolini, G.; Altantzis, T.; Hofkens, J.; Roeffaers, M.B.J.; Bals, S.; Van Aert, S. |
Atomic-scale detection of individual lead clusters confined in Linde Type A zeolites |
2022 |
Nanoscale |
|
2 |
UA library record; WoS full record; WoS citing articles |
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Liu, P.; Arslan Irmak, E.; De Backer, A.; De wael, A.; Lobato, I.; Béché, A.; Van Aert, S.; Bals, S. |
Three-dimensional atomic structure of supported Au nanoparticles at high temperature |
2021 |
Nanoscale |
13 |
13 |
UA library record; WoS full record; WoS citing articles |
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