Nano Home

NANOlab Center of Excellence literature database

Home |  Show All |  Simple Search |  Advanced Search
Quick Search:
1–30 of 61 records found matching your query (RSS):
toggle visibility
Search within Results:
Display Options:
Select All    Deselect All << 1 2 3 >>
List View
 | 
Citations
 | 
Details
   print
  Author Title Year Publication Volume Times cited Additional Links (up) Links
Şentürk, D.G.; De Backer, A.; Van Aert, S. Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination 2024 Ultramicroscopy 259 url doi
de Backer, A. Quantitative atomic resolution electron microscopy using advanced statistical techniques 2015 UA library record url
de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits? 2015 Journal of physics : conference series 644 UA library record url doi
Klingstedt, M.; Sundberg, M.; Eriksson, L.; Haigh, S.; Kirkland, A.; Grüner, D.; de Backer, A.; Van Aert, S.; Tarasaki, O. Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x\sim0.11) 2012 Zeitschrift für Kristallographie 227 4 UA library record; WoS full record; WoS citing articles pdf url doi
Van Aert, S.; de Backer, A.; Martinez, G.T.; Goris, B.; Bals, S.; Van Tendeloo, G.; Rosenauer, A. Procedure to count atoms with trustworthy single-atom sensitivity 2013 Physical review : B : condensed matter and materials physics 87 106 UA library record; WoS full record; WoS citing articles url doi
den Dekker, A.J.; Gonnissen, J.; de Backer, A.; Sijbers, J.; Van Aert, S. Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits? 2013 Ultramicroscopy 134 31 UA library record; WoS full record; WoS citing articles pdf doi
de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations 2013 Ultramicroscopy 134 48 UA library record; WoS full record; WoS citing articles pdf url doi
Goris, B.; de Backer, A.; Van Aert, S.; Gómez-Graña, S.; Liz-Marzán, L.M.; Van Tendeloo, G.; Bals, S. Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals 2013 Nano letters 13 90 UA library record; WoS full record; WoS citing articles pdf doi
Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy 2014 Ultramicroscopy 137 74 UA library record; WoS full record; WoS citing articles pdf doi
Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images 2014 Micron 63 25 UA library record; WoS full record; WoS citing articles pdf url doi
Gonnissen, J.; de Backer, A.; den Dekker, A.J.; Martinez, G.T.; Rosenauer, A.; Sijbers, J.; Van Aert, S. Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images 2014 Applied physics letters 105 12 UA library record; WoS full record; WoS citing articles pdf url doi
de Backer, A.; De wael, A.; Gonnissen, J.; Van Aert, S. Optimal experimental design for nano-particle atom-counting from high-resolution STEM images 2015 Ultramicroscopy 151 24 UA library record; WoS full record; WoS citing articles pdf url doi
de Backer, A.; Martinez, G.T.; MacArthur, K.E.; Jones, L.; Béché, A.; Nellist, P.D.; Van Aert, S. Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting 2015 Ultramicroscopy 151 29 UA library record; WoS full record; WoS citing articles pdf url doi
Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. Quantitative STEM normalisation : the importance of the electron flux 2015 Ultramicroscopy 159 27 UA library record; WoS full record; WoS citing articles pdf url doi
Goris, B.; de Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, K.J.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Aert, S.; Bals, S.; Sijbers, J.; Van Tendeloo, G. Measuring lattice strain in three dimensions through electron microscopy 2015 Nano letters 15 87 UA library record; WoS full record; WoS citing articles pdf url doi
De Backer, A.; De Wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits? 2015 Journal of physics : conference series 644 UA library record; WoS full record pdf url doi
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. Advanced electron crystallography through model-based imaging 2016 IUCrJ 3 30 UA library record; WoS full record; WoS citing articles pdf url doi
van den Bos, K.H. W.; De Backer, A.; Martinez, G.T.; Winckelmans, N.; Bals, S.; Nellist, P.D.; Van Aert, S. Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy 2016 Physical review letters 116 46 UA library record; WoS full record; WoS citing articles pdf url doi
Varambhia, A.M.; Jones, L.; De Backer, A.; Fauske, V.T.; Van Aert, S.; Ozkaya, D.; Nellist, P.D. Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM 2016 Particle and particle systems characterization 33 4 UA library record; WoS full record; WoS citing articles pdf url doi
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design 2016 Ultramicroscopy 170 6 UA library record; WoS full record; WoS citing articles pdf url doi
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images 2016 Ultramicroscopy 171 43 UA library record; WoS full record; WoS citing articles pdf url doi
Bals, S.; Goris, B.; de Backer, A.; Van Aert, S.; Van Tendeloo, G. Atomic resolution electron tomography 2016 MRS bulletin 41 19 UA library record; WoS full record; WoS citing articles pdf url doi
Geuchies, J.J.; van Overbeek, C.; Evers, W.H.; Goris, B.; de Backer, A.; Gantapara, A.P.; Rabouw, F.T.; Hilhorst, J.; Peters, J.L.; Konovalov, O.; Petukhov, A.V.; Dijkstra, M.; Siebbeles, L.D.A.; van Aert, S.; Bals, S.; Vanmaekelbergh, D. In situ study of the formation mechanism of two-dimensional superlattices from PbSe nanocrystals 2016 Nature materials 15 182 UA library record; WoS full record; WoS citing articles url doi
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, J.; Van Aert, S. Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question 2016 Ultramicroscopy 174 2 UA library record; WoS full record; WoS citing articles url doi
Alania, M.; Altantzis, T.; De Backer, A.; Lobato, I.; Bals, S.; Van Aert, S. Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure 2016 Ultramicroscopy 177 13 UA library record; WoS full record; WoS citing articles pdf url doi
De wael, A.; De Backer, A.; Jones, L.; Nellist, P.D.; Van Aert, S. Hybrid statistics-simulations based method for atom-counting from ADF STEM images 2017 Ultramicroscopy 177 8 UA library record; WoS full record; WoS citing articles pdf url doi
Alania, M.; De Backer, A.; Lobato, I.; Krause, F.F.; Van Dyck, D.; Rosenauer, A.; Van Aert, S. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images? 2017 Ultramicroscopy 181 3 UA library record; WoS full record; WoS citing articles pdf url doi
De Backer, A.; Jones, L.; Lobato, I.; Altantzis, T.; Goris, B.; Nellist, P.D.; Bals, S.; Van Aert, S. Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities 2017 Nanoscale 9 33 UA library record; WoS full record; WoS citing articles url doi
Goris, B.; De Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, J.; Sanchez-Iglesias, A.; Liz-Marzan, L.; Van Aert, S.; Sijbers, J.; Van Tendeloo, G.; Bals, S. Investigating lattice strain in Au nanodecahedrons 2016 UA library record doi
De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images 2017 Journal of physics : conference series T2 – Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK 902 1 UA library record; WoS full record; WoS citing articles pdf url doi
Select All    Deselect All << 1 2 3 >>
List View
 | 
Citations
 | 
Details
   print
toggle visibility
Save Citations:
Export Records:
Home CQL Search  |  Library Search  |  Show Record  |  Extract Citations Help