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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Van Aert, S.; Chang, L.Y.; Bals, S.; Kirkland, A.I.; Van Tendeloo, G. |
Effect of amorphous layers on the interpretation of restored exit waves |
2009 |
Ultramicroscopy |
109 |
10 |
UA library record; WoS full record; WoS citing articles |
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Figuerola, A.; Franchini, I.R.; Fiore, A.; Mastria, R.; Falqui, A.; Bertoni, G.; Bals, S.; Van Tendeloo, G.; Kudera, S.; Cingolani, R.; Manna, L. |
End-to-end assembly of shape-controlled nanocrystals via a nanowelding approach mediated by gold domains |
2009 |
Advanced materials |
21 |
110 |
UA library record; WoS full record; WoS citing articles |
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Beyers, E.; Biermans, E.; Ribbens, S.; de Witte, K.; Mertens, M.; Meynen, V.; Bals, S.; Van Tendeloo, G.; Vansant, E.F.; Cool, P. |
Combined TiO2/SiO2 mesoporous photocatalysts with location and phase controllable TiO2 nanoparticles |
2009 |
Applied catalysis : B : environmental |
88 |
69 |
UA library record; WoS full record; WoS citing articles |
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Bals, S.; Stes, A.; Celis, V. |
Klassieke toetsing in de praktijk |
2009 |
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UA library record |
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Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. |
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data |
2008 |
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UA library record |
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Montoya, E.; Bals, S.; Van Tendeloo, G. |
Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam |
2008 |
Journal of microscopy |
231 |
|
UA library record; WoS full record |
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Krsmanovic, R.; Bals, S.; Bertoni, G.; Van Tendeloo, G. |
Structural characterization of Er-doped Li2O-Al2O3-SiO2 glass ceramics |
2008 |
Optical materials |
30 |
12 |
UA library record; WoS full record; WoS citing articles |
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Lisiecki, I.; Turner, S.; Bals, S.; Pileni, M.P.; Van Tendeloo, G. |
Enhanced stability against oxidation due to 2D self-organisation of hcp cobalt nanocrystals |
2008 |
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UA library record |
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Batenburg, K.J.; Bals, S.; Sijbers, J.; Van Tendeloo, G. |
DART explained: how to carry out a discrete tomography reconstruction |
2008 |
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UA library record |
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Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. |
Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy |
2007 |
Microscopy and microanalysis |
13 |
|
UA library record |
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Bals, S.; Batenburg, J.; Verbeeck, J.; Sijbers, J.; Van Tendeloo, G. |
Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes |
2007 |
Nano letters |
7 |
78 |
UA library record; WoS full record; WoS citing articles |
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Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. |
Evaluation of top, angle, and side cleaned FIB samples for TEM analysis |
2007 |
Microscopy research and technique |
70 |
36 |
UA library record; WoS full record; WoS citing articles |
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Bals, S.; Tirry, W.; Geurts, R.; Yang, Z.; Schryvers, D. |
High-quality sample preparation by low kV FIB thinning for analytical TEM measurements |
2007 |
Microscopy and microanalysis |
13 |
82 |
UA library record; WoS full record; WoS citing articles |
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Monticelli, O.; Musina, Z.; Russo, S.; Bals, S. |
On the use of TEM in the characterization of nanocomposites |
2007 |
Materials letters |
61 |
28 |
UA library record; WoS full record; WoS citing articles |
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Lebedev, O.I.; Bals, S.; Van Tendeloo, G.; Snoeck, G.E.; Retoux, R.; Boudin, S.; Hervieu, M. |
Mixed (Sr1-xCax)33Bi24Al48O141 fullerenoids: the defect structure analysed by (S)TEM techniques |
2006 |
International journal of materials research |
97 |
1 |
UA library record; WoS full record; WoS citing articles |
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Abakumov, A.M.; Hadermann, J.; Bals, S.; Nikolaev, I.V.; Antipov, E.V.; Van Tendeloo, G. |
Crystallographic shear structures as a route to anion-deficient perovskites |
2006 |
Angewandte Chemie: international edition in English |
45 |
62 |
UA library record; WoS full record; WoS citing articles |
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Leca, V.; Blank, D.H.A.; Rijnders, G.; Bals, S.; Van Tendeloo, G. |
Superconducting single-phase Sr1-xLaxCuO2 thin films with improved crystallinity grown by pulsed laser deposition |
2006 |
Applied physics letters |
89 |
32 |
UA library record; WoS full record; WoS citing articles |
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Huijben, M.; Rijnders, G.; Blank, D.H.A.; Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Brinkman, A.; Hilgenkamp, H. |
Electronically coupled complementary interfaces between perovskite band insulators |
2006 |
Nature materials |
5 |
315 |
UA library record; WoS full record; WoS citing articles |
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Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. |
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images |
2006 |
Ultramicroscopy |
106 |
18 |
UA library record; WoS full record; WoS citing articles |
|
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Bals, S.; Van Tendeloo, G.; Kisielowski, C. |
A new approach for electron tomography: annular dark-field transmission electron microscopy |
2006 |
Advanced materials |
18 |
53 |
UA library record; WoS full record; WoS citing articles |
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Avila-Brande, D.; Otero-Díaz, L.C.; Landa-Cánovas, A.R.; Bals, S.; Van Tendeloo, G. |
A new Bi4Mn1/3W2/3O8Cl Sillén-Aurivillius intergrowth: synthesis and structural characterisation by quantitative transmission electron microscopy |
2006 |
European journal of inorganic chemistry |
|
12 |
UA library record; WoS full record; WoS citing articles |
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Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D. |
Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range |
2006 |
Physical review letters |
96 |
69 |
UA library record; WoS full record; WoS citing articles |
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Bals, S.; Kilaas, R.; Kisielowski, C. |
Nonlinear imaging using annular dark field TEM |
2005 |
Ultramicroscopy |
104 |
15 |
UA library record; WoS full record; WoS citing articles |
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Li, Z.Z.; Raffy, H.; Bals, S.; Van Tendeloo, G.; Megtert, S. |
Interplay of doping and structural modulation in superconducting Bi2Sr2-xLaxCuO6+\delta thin films |
2005 |
Physical review : B : condensed matter and materials physics |
71 |
11 |
UA library record; WoS full record; WoS citing articles |
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Bals, S.; Verbeeck, J.; Van Tendeloo, G.; Liu, Y.-L.; Grivel, J.-C. |
Quantitative electron microscopy of (Bi,Pb)2Sr2Ca2Cu3O10+\delta/Ag multifilament tapes during initial stages of annealing |
2005 |
Journal of the American Ceramic Society |
88 |
1 |
UA library record; WoS full record; WoS citing articles |
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Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D. |
Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction |
2005 |
Microscopy and microanalysis |
11 |
|
UA library record |
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Bals, S.; Kisielowski, C.; Croitoru, M.; Van Tendeloo, G. |
Tomography using annular dark field imaging in TEM |
2005 |
Microscopy and microanalysis |
11 |
|
UA library record |
|
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Jinschek, J.R.; Bals, S.; Gopal, V.; Xus, X.; Kisielowski, C. |
Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs |
2004 |
Microscopy and microanalysis |
10 |
|
UA library record |
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Bals, S.; Radmilovic, V.; Kisielowski, C. |
TEM annular objective apertures fabricated by FIB |
2004 |
Microscopy and microanalysis |
10 |
|
UA library record |
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Lubyshev, D.; Fastenau, J.M.; Fang, X.-M.; Wu, Y.; Doss, C.; Snyder, A.; Liu, W.K.; Lamb, M.S.M.; Bals, S.; Song, C. |
Comparison of As- and P-based metamorphic buffers for high performance InP heterojunction bipolar transistor and high electron mobility transistor applications |
2004 |
Journal of vacuum science & technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena |
22 |
25 |
UA library record; WoS full record; WoS citing articles |
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