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Author Bals, S.; Van Tendeloo, G.; Kisielowski, C. pdf  doi
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  Title A new approach for electron tomography: annular dark-field transmission electron microscopy Type A1 Journal article
  Year (down) 2006 Publication Advanced materials Abbreviated Journal Adv Mater  
  Volume 18 Issue 7 Pages 892-895  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract Annular dark-field transmission electron microscopy uses an annular objective aperture that blocks the central beam and all electrons scattered up to a certain serniangle. A contrast suitable for electron tomography is generated and 3D reconstructions of CdTe tetrapods and C nanotubes (see figure) are successfully obtained. With short exposure times and high contrast, the technique could be useful not only for materials science, but also for biological applications.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Weinheim Editor  
  Language Wos 000236950500013 Publication Date 2006-03-24  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0935-9648;1521-4095; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 19.791 Times cited 53 Open Access  
  Notes Fwo Approved Most recent IF: 19.791; 2006 IF: NA  
  Call Number UA @ lucian @ c:irua:58258 Serial 2306  
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