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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Skorikov, A.; Batenburg, K.J.; Bals, S. Analysis of 3D elemental distribution in nanomaterials : towards higher throughput and dose efficiency 2023 Journal of microscopy 289 2 UA library record; WoS full record; WoS citing articles pdf url doi
Cautaerts, N.; Delville, R.; Schryvers, D. ALPHABETA: a dedicated open-source tool for calculating TEM stage tilt angles 2019 Journal of microscopy 273 2 UA library record; WoS full record; WoS citing articles pdf doi
Mehta, A.N.; Zhang, H.; Dabral, A.; Richard, O.; Favia, P.; Bender, H.; Delabie, A.; Caymax, M.; Houssa, M.; Pourtois, G.; Vandervorst, W. Structural characterization of SnS crystals formed by chemical vapour deposition 2017 Journal of microscopy T2 – 20th International Conference on Microscopy of Semiconducting Materials, (MSM), APR 09-13, 2017, Univ Oxford, Univ Oxford, Oxford, ENGLAND 268 2 UA library record; WoS full record; WoS citing articles pdf doi
Lu, J.; Bartholomeeusen, E.; Sels, B.F.; Schryvers, D. Internal architecture of coffin-shaped ZSM-5 zeolite crystals with hourglass contrast unravelled by focused ion beam-assisted transmission electron microscopy: INTERNAL ARCHITECTURE OF COFFIN-SHAPED 2017 Journal of microscopy 265 4 UA library record; WoS full record; WoS citing articles pdf url doi
Ramachandran, D.; Egoavil, R.; Crabbe, A.; Hauffman, T.; Abakumov, A.; Verbeeck, J.; Vandendael, I.; Terryn, H.; Schryvers, D. TEM and AES investigations of the natural surface nano-oxide layer of an AISI 316L stainless steel microfibre 2016 Journal of microscopy 264 12 UA library record; WoS full record; WoS citing articles pdf url doi
Verleysen, E.; Bender, H.; Richard, O.; Schryvers, D.; Vandervorst, W. Characterization of nickel silicides using EELS-based methods 2010 Journal of microscopy 240 11 UA library record; WoS full record; WoS citing articles doi
Cao, S.; Tirry, W.; van den Broek, W.; Schryvers, D. Optimization of a FIB/SEM slice-and-view study of the 3D distribution of Ni4Ti3 precipitates in NiTi 2009 Journal of microscopy 233 22 UA library record; WoS full record; WoS citing articles pdf doi
Montoya, E.; Bals, S.; Van Tendeloo, G. Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam 2008 Journal of microscopy 231 UA library record; WoS full record pdf doi
Yang, Z.; Schryvers, D.; Roels, F.; d' Haese, P.C.; de Broe, M.E. Demonstration of lanthanum in liver cells by energy-dispersive X-ray spectroscopy, electron energy loss spectroscopy and high-resolution transmission electron microscopy 2006 Journal of microscopy 223 29 UA library record; WoS full record; WoS citing articles pdf doi
Potapov, P.L.; Kulkova, S.E.; Schryvers, D. Study of changes in L32 EELS ionisation edges upon formation of Ni-based intermetallic compounds 2003 Journal of microscopy 210 11 UA library record; WoS full record; WoS citing articles pdf doi
Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy 1997 Journal of microscopy 188 6 UA library record; WoS full record; WoS citing articles
Oleshko, V.; Gijbels, R.; Jacob, W. Energy-filtering TEM and electron energy-loss spectroscopy of double structure tabular microcrystals of silver halide emulsions 1996 Journal of microscopy 183 8 UA library record; WoS full record; WoS citing articles doi
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