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Author Title Year Publication Volume Times cited Additional Links
Nord, M.; Webster, R.W.H.; Paton, K.A.; McVitie, S.; McGrouther, D.; MacLaren, I.; Paterson, G.W. Fast pixelated detectors in scanning transmission electron microscopy. Part I: data acquisition, live processing, and storage 2020 Microscopy And Microanalysis 26 4 UA library record; WoS full record; WoS citing articles
Goris, B.; Freitag, B.; Zanaga, D.; Bladt, E.; Altantzis, T.; Ringnalda, J.; Bals, S. Towards quantitative EDX results in 3 dimensions 2014 Microscopy and microanalysis 20 UA library record
Masenelli-Varlot, K.; Malchere, A.; Ferreira, J.; Heidari Mezerji, H.; Bals, S.; Messaoudi, C.; Garrido, S.M. Wet-STEM tomography : principles, potentialities and limitations 2014 Microscopy and microanalysis 20 9 UA library record; WoS full record; WoS citing articles
Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. Ultra-high resolution electron tomography for materials science : a roadmap 2011 Microscopy and microanalysis 17 UA library record
Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. Computational aspects in quantitative EELS 2010 Microscopy and microanalysis 16 UA library record
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy 2009 Microscopy and microanalysis 15 1 UA library record; WoS full record; WoS citing articles
Tian, H.; Schryvers, D.; Shabalovskaya, S.; van Humbeeck, J. Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwire 2009 Microscopy and microanalysis 15 15 UA library record; WoS full record; WoS citing articles
Pennycook, T.J.; Martinez, G.T.; O'Leary, C.M.; Yang, H.; Nellist, P.D. Efficient Phase Contrast Imaging via Electron Ptychography, a Tutorial 2019 Microscopy and microanalysis 25 UA library record
Tafuri, F.; Granozio, F.M.; Carillo, F.; Lombardi, F.; Di Uccio, U.S.; Verbist, K.; Lebedev, O.; Van Tendeloo, G. Josephson phenomenology and microstructure of YBaCuO artificial grain boundaries characterized by misalignment of the c-axes 1999 Physica: C : superconductivity 327 7 UA library record; WoS full record; WoS citing articles
Yu, R.; Zeng, W.; Zhou, L.; Van Tendeloo, G.; Mai, L.; Yao, Z.; Wu, J. Layer-by-layer delithiation during lattice collapse as the origin of planar gliding and microcracking in Ni-rich cathodes 2023 Cell reports physical science 4 UA library record; WoS full record; WoS citing articles
Ding, Y.; Maitra, S.; Arenas Esteban, D.; Bals, S.; Vrielinck, H.; Barakat, T.; Roy, S.; Van Tendeloo, G.; Liu, J.; Li, Y.; Vlad, A.; Su, B.-L. Photochemical production of hydrogen peroxide by digging pro-superoxide radical carbon vacancies in carbon nitride 2022 Cell reports physical science 3 12 UA library record; WoS full record; WoS citing articles
Sun, C.; Liao, X.; Peng, H.; Zhang, C.; Van Tendeloo, G.; Zhao, Y.; Wu, J. Interfacial gliding-driven lattice oxygen release in layered cathodes 2022 Cell reports physical science 3 UA library record; WoS full record; WoS citing articles
Adam, N.; Leroux, F.; Knapen, D.; Bals, S.; Blust, R. The uptake and elimination of ZnO and CuO nanoparticles in Daphnia magna under chronic exposure scenarios 2015 Water research 68 51 UA library record; WoS full record; WoS citing articles
Şentürk, D.G.; De Backer, A.; Van Aert, S. Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination 2024 Ultramicroscopy 259
Hofer, C.; Gao, C.; Chennit, T.; Yuan, B.; Pennycook, T.J. Phase offset method of ptychographic contrast reversal correction 2024 Ultramicroscopy UA library record
Gao, C.; Hofer, C.; Pennycook, T.J. On central focusing for contrast optimization in direct electron ptychography of thick samples 2024 Ultramicroscopy 256 UA library record; WoS full record; WoS citing articles
Şentürk, DG.; Yu, CP.; De Backer, A.; Van Aert, S. Atom counting from a combination of two ADF STEM images 2024 Ultramicroscopy 255 UA library record; WoS full record
Van den Broek, W.; Jannis, D.; Verbeeck, J. Convexity constraints on linear background models for electron energy-loss spectra 2023 Ultramicroscopy 254 UA library record
Hofer, C.; Pennycook, T.J. Reliable phase quantification in focused probe electron ptychography of thin materials 2023 Ultramicroscopy 254 UA library record; WoS full record; WoS citing articles
Denisov, N.; Jannis, D.; Orekhov, A.; Müller-Caspary, K.; Verbeeck, J. Characterization of a Timepix detector for use in SEM acceleration voltage range 2023 Ultramicroscopy 253 UA library record; WoS full record
Lobato, I.; De Backer, A.; Van Aert, S. Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network 2023 Ultramicroscopy 251 UA library record; WoS full record
De Backer, A.; Bals, S.; Van Aert, S. A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection 2023 Ultramicroscopy 3 UA library record; WoS full record; WoS citing articles
Zhang, Z.; Lobato, I.; De Backer, A.; Van Aert, S.; Nellist, P. Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions 2023 Ultramicroscopy 246 UA library record; WoS full record; WoS citing articles
Sentürk, D.G.; De Backer, A.; Friedrich, T.; Van Aert, S. Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors 2022 Ultramicroscopy 242 UA library record; WoS full record; WoS citing articles
Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process 2022 Ultramicroscopy 4 UA library record; WoS full record; WoS citing articles
Robert, Hl.; Lobato, I.; Lyu, Fj.; Chen, Q.; Van Aert, S.; Van Dyck, D.; Müller-Caspary, K. Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution 2022 Ultramicroscopy 233 UA library record; WoS full record; WoS citing articles
Jannis, D.; Hofer, C.; Gao, C.; Xie, X.; Béché, A.; Pennycook, Tj.; Verbeeck, J. Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications 2022 Ultramicroscopy 233 31 UA library record; WoS full record; WoS citing articles
Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings 2022 Ultramicroscopy 232 18 UA library record; WoS full record; WoS citing articles
De wael, A.; De Backer, A.; Lobato, I.; Van Aert, S. Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt 2021 Ultramicroscopy UA library record; WoS full record; WoS citing articles
Madsen, J.; Pennycook, T.J.; Susi, T. ab initio description of bonding for transmission electron microscopy 2021 Ultramicroscopy 231 UA library record; WoS full record; WoS citing articles