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Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Bogaerts, A.; van Straaten, M.; Gijbels, R. |
Mathematical modelling of an analytical glow discharge |
1995 |
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UA library record |
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Vos, L.; Van Grieken, R. |
Matrix effects and analysis of biological material by spark source mass spectrometry |
1985 |
Fresenius' Zeitschrift für analytische Chemie |
321 |
|
UA library record |
|
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|
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
Matrix-enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films |
2005 |
Rapid communications in mass spectrometry |
19 |
24 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
2005 |
Ultramicroscopy |
104 |
37 |
UA library record; WoS full record; WoS citing articles |
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den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework |
2005 |
Ultramicroscopy |
104 |
70 |
UA library record; WoS full record; WoS citing articles |
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Saison, J.-Y.; Roekens, E.; Matheeussen, C.; Verlinden, L.; Desmedt, M.; Van Grieken, R.; Stranger, M. |
Measurement campaigns in the Euro-region |
2005 |
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UA library record |
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Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. |
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy |
2016 |
Ultramicroscopy |
178 |
93 |
UA library record; WoS full record; WoS citing articles |
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Mahr, C.; Müller-Caspary, K.; Graf, M.; Lackmann, A.; Grieb, T.; Schowalter, M.; Krause, F.F.; Mehrtens, T.; Wittstock, A.; Weissmueller, J.; Rosenauer, A. |
Measurement of local crystal lattice strain variations in dealloyed nanoporous gold |
2018 |
Materials research letters |
6 |
4 |
UA library record; WoS full record; WoS citing articles |
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Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. |
Measurement of specimen thickness by phase change determination in TEM |
2008 |
Ultramicroscopy |
108 |
2 |
UA library record; WoS full record; WoS citing articles |
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Korneychuk, S.; Guzzinati, G.; Verbeeck, J. |
Measurement of the Indirect Band Gap of Diamond with EELS in STEM |
2018 |
Physica status solidi : A : applications and materials science |
215 |
6 |
UA library record; WoS full record; WoS citing articles |
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Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Microscopy of Semiconducting Materials |
107 |
|
UA library record; WoS full record; |
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Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R.; Waag, A. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Applied Physics Letters |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
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Hendrich, C.; Favre, L.; Ievlev, D.N.; Dobrynin, A.N.; Bras, W.; Hörmann, U.; Piscopiello, E.; Van Tendeloo, G.; Lievens, P.; Temst, K. |
Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering |
2007 |
Applied physics A : materials science & processing |
86 |
11 |
UA library record; WoS full record; WoS citing articles |
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Alföldy, B.; Lööv, J.B.; Lagler, F.; Bencs, L.; Horemans, B.; Van Grieken, R.; et al. |
Measurements of air pollution emission factors for marine transportation in SECA |
2013 |
Atmospheric measurement techniques |
6 |
|
UA library record; WoS full record; WoS citing articles |
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Spiller, M. |
Measuring adaptive capacity of urban wastewater infrastructure : change impact and change propagation |
2017 |
The science of the total environment |
601-602 |
|
UA library record; WoS full record; WoS citing articles |
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De wael, A.; De Backer, A.; Jones, L.; Varambhia, A.; Nellist, P.D.; Van Aert, S. |
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy |
2020 |
Physical Review Letters |
124 |
|
UA library record; WoS full record; WoS citing articles |
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Van Passel, S.; Nevens, F.; Mathijs, E.; Van Huylenbroeck, G. |
Measuring farm sustainability and explaining differences in sustainable efficiency |
2007 |
Ecological Economics |
62 |
101 |
UA library record; WoS full record; WoS citing articles |
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Rosenberg, E.; De Santis, F.; Kontozova-Deutsch, V.; Odlyha, M.; Van Grieken, R.; Vichi, F. |
Measuring gaseous and particulate pollutants: instruments and instrumental problems |
2010 |
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UA library record |
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Goris, B.; de Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, K.J.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Aert, S.; Bals, S.; Sijbers, J.; Van Tendeloo, G. |
Measuring lattice strain in three dimensions through electron microscopy |
2015 |
Nano letters |
15 |
87 |
UA library record; WoS full record; WoS citing articles |
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Felten, A.; Gillon, X.; Gulas, M.; Pireaux, J.-J.; Ke, X.; Van Tendeloo, G.; Bittencourt, C.; Najafi, E.; Hitchcock, A.P. |
Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy |
2010 |
ACS nano |
4 |
26 |
UA library record; WoS full record; WoS citing articles |
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Biermans, E.; Molina, L.; Batenburg, K.J.; Bals, S.; Van Tendeloo, G. |
Measuring porosity at the nanoscale by quantitative electron tomography |
2010 |
Nano letters |
10 |
79 |
UA library record; WoS full record; WoS citing articles |
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van der Burgt, M.; Peeters, F.M.; Singleton, J.; Nicholas, R.J.; Herlach, F.; Harris, J.J.; Foxon, C.T. |
Measuring quantum Hall resistors in pulsed magnetic fields |
1995 |
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UA library record |
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Schryvers, D.; Tirry, W.; Yang, Z.Q.; |
Measuring strain fields and concentration gradients around Ni4Ti3 precipitates |
2006 |
Materials science and engineering A: structural materials properties microstructure and processing |
438 |
35 |
UA library record; WoS full record; WoS citing articles |
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Potapov, P.L.; Schryvers, D. |
Measuring the absolute position of EELS ionisation edges in a TEM |
2004 |
Ultramicroscopy |
99 |
29 |
UA library record; WoS full record; WoS citing articles |
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Kirilenko, D.A.; Dideykin, A.T.; Van Tendeloo, G. |
Measuring the corrugation amplitude of suspended and supported graphene |
2011 |
Physical review : B : condensed matter and materials physics |
84 |
31 |
UA library record; WoS full record; WoS citing articles |
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Kirilenko, D.A.; Brunkov, P.N. |
Measuring the height-to-height correlation function of corrugation in suspended graphene |
2016 |
Ultramicroscopy |
165 |
3 |
|
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Guzzinati, G.; Clark, L.; Béché, A.; Verbeeck, J. |
Measuring the orbital angular momentum of electron beams |
2014 |
Physical review : A : atomic, molecular and optical physics |
89 |
42 |
UA library record; WoS full record; WoS citing articles |
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Hervieu, M.; Michel, C.; Martin, C.; Huvé, M.; Van Tendeloo, G.; Maignan, A.; Pelloquin, D.; Goutenoire, F.; Raveau, B. |
Mécanismes de la non-stoechiométrie dans les nouveaux supraconducteurs à haute Tc |
1994 |
Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation |
4 |
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UA library record; WoS full record; |
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Çakir, D.; Peeters, F.M.; Sevik, C. |
Mechanical and thermal properties of h-MX2 (M = Cr, Mo, W; X = O, S, Se, Te) monolayers : a comparative study |
2014 |
Applied physics letters |
104 |
130 |
UA library record; WoS full record; WoS citing articles |
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van der Rest, A.; Idrissi, H.; Henry, F.; Favache, A.; Schryvers, D.; Proost, J.; Raskin, J.-P.; Van Overmeere, Q.; Pardoen, T. |
Mechanical behavior of ultrathin sputter deposited porous amorphous Al2O3 films |
2017 |
Acta materialia |
125 |
5 |
UA library record; WoS full record; WoS citing articles |
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