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Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Altantzis, T.; Goris, B.; Sánchez-Iglesias, A.; Grzelczak, M.; Liz-Marzán, L.M.; Bals, S. |
Quantitative structure determination of large three-dimensional nanoparticle assemblies |
2013 |
Particle and particle systems characterization |
30 |
23 |
UA library record; WoS full record; WoS citing articles |
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Cooper, D.; Rouvière, J.-L.; Béché, A.; Kadkhodazadeh, S.; Semenova, E.S.; Dunin-Borkowsk, R. |
Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography |
2011 |
Applied physics letters |
99 |
26 |
UA library record; WoS full record; WoS citing articles |
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|
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Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. |
Quantitative STEM normalisation : the importance of the electron flux |
2015 |
Ultramicroscopy |
159 |
27 |
UA library record; WoS full record; WoS citing articles |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
1998 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals |
1999 |
Journal of the American Society for Mass Spectrometry |
10 |
4 |
UA library record; WoS full record; WoS citing articles |
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Vincze, L.; Janssens, K.; Adams, F.; Jones, K. |
Quantitative mu-XRF analysis of heterogeneous samples |
1995 |
Microbeam Analysis 1995: Proceedings Of The 29th Annual Conference Of The Microbeam Analysis Society |
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UA library record; WoS full record |
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Payne, L.M.; Masia, F.; Zilli, A.; Albrecht, W.; Borri, P.; Langbein, W. |
Quantitative morphometric analysis of single gold nanoparticles by optical extinction microscopy: Material permittivity and surface damping effects |
2021 |
Journal Of Chemical Physics |
154 |
|
UA library record; WoS full record; WoS citing articles |
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Bercx, M.; Partoens, B.; Lamoen, D. |
Quantitative modeling of secondary electron emission from slow-ion bombardment on semiconductors |
2019 |
Physical review B |
99 |
5 |
UA library record; WoS full record; WoS citing articles |
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Martínez Alanis, G.T. |
Quantitative model-based high angle annular dark field scanning transmission electron microscopy |
2015 |
|
|
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UA library record |
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Clark, L.; Béché, A.; Guzzinati, G.; Verbeeck, J. |
Quantitative measurement of orbital angular momentum in electron microscopy |
2014 |
Physical review : A : atomic, molecular and optical physics |
89 |
23 |
UA library record; WoS full record; WoS citing articles |
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Li, K.; Idrissi, H.; Sha, G.; Song, M.; Lu, J.; Shi, H.; Wang, W.; Ringer, S.P.; Du, Y.; Schryvers, D. |
Quantitative measurement for the microstructural parameters of nano-precipitates in Al-Mg-Si-Cu alloys |
2016 |
Materials characterization |
118 |
9 |
UA library record; WoS full record; WoS citing articles |
|
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|
Salje, E.K.H.; Zhang, H.; Schryvers, D.; Bartova, B. |
Quantitative Landau potentials for the martensitic transformation in Ni-Al |
2007 |
Applied physics letters |
90 |
9 |
UA library record; WoS full record; WoS citing articles |
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Samaeeaghmiyoni, V.; Idrissi, H.; Groten, J.; Schwaiger, R.; Schryvers, D. |
Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach |
2017 |
Micron |
94 |
11 |
UA library record; WoS full record; WoS citing articles |
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Grieb, T.; Tewes, M.; Schowalter, M.; Müller-Caspary, K.; Krause, F.F.; Mehrtens, T.; Hartmann, J.-M.; Rosenauer, A. |
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation |
2018 |
Ultramicroscopy |
184 |
7 |
UA library record; WoS full record; WoS citing articles |
|
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Cao, S.; Zeng, C.Y.; Li, Y.Y.; Yao, X.; Ma, X.; Samaee, V.; Schryvers, D.; Zhang, X.P. |
Quantitative FIB/SEM three-dimensional characterization of a unique Ni₄Ti₃ network in a porous Ni50.8Ti49.2 alloy undergoing a two-step martensitic transformation |
2020 |
Materials Characterization |
169 |
|
UA library record; WoS full record; WoS citing articles |
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Terzano, R.; Spagnuolo, M.; Ruggiero, P.; Vekemans, B.; Scoonjans, T.; Vincze, L.; Janssens, K.; Tomasi, N.; Cesco, S.; Falkenberg, G. |
Quantitative Fe determination inside tomato roots by confocal μ-XRF |
2008 |
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UA library record |
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Heidari Mezerji, H. |
Quantitative electron tomography of nanoparticles |
2012 |
|
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UA library record |
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Heidari, H.; van den Broek, W.; Bals, S. |
Quantitative electron tomography : the effect of the three-dimensional point spread function |
2013 |
Ultramicroscopy |
135 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
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Bals, S.; Verbeeck, J.; Van Tendeloo, G.; Liu, Y.-L.; Grivel, J.-C. |
Quantitative electron microscopy of (Bi,Pb)2Sr2Ca2Cu3O10+\delta/Ag multifilament tapes during initial stages of annealing |
2005 |
Journal of the American Ceramic Society |
88 |
1 |
UA library record; WoS full record; WoS citing articles |
|
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Karakulina, O. |
Quantitative electron diffraction tomography for structure characterization of cathode materials for Li-ion batteries |
2018 |
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UA library record |
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Hens, S.; Stuer, C.; Bender, H.; Loo, R.; van Landuyt, J. |
Quantitative EFTEM study of germanium quantum dots |
2001 |
|
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UA library record; WoS full record; |
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Tirry, W.; Schryvers, D.; Jorissen, K.; Lamoen, D. |
Quantitative determination of the crystal structure of Ni4Ti3 precipitates |
2006 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
438 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Tirry, W.; Schryvers, D. |
Quantitative determination of strain fields around Ni4Ti3 precipitates in NiTi |
2005 |
Acta materialia |
53 |
97 |
UA library record; WoS full record; WoS citing articles |
|
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Mahr, C.; Kundu, P.; Lackmann, A.; Zanaga, D.; Thiel, K.; Schowalter, M.; Schwan, M.; Bals, S.; Wittstock, A.; Rosenauer, A. |
Quantitative determination of residual silver distribution in nanoporous gold and its influence on structure and catalytic performance |
2017 |
Journal of catalysis |
352 |
42 |
UA library record; WoS full record; WoS citing articles |
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Choël, M.; Deboudt, K.; Osán, J.; Flament, P.; Van Grieken, R. |
Quantitative determination of low-Z elements in single atmospheric particles on boron substrates by automated scanning electron microscopy: energy-dispersive X-ray spectrometry |
2005 |
Analytical chemistry |
77 |
|
UA library record; WoS full record; WoS citing articles |
|
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van Cleempoel, A.; Gijbels, R.; Zhu, D.; Claeys, M.; Richter, H.; Fonseca, A. |
Quantitative determination of C60 and C70 in soot extracts by high performance liquid chromatography and mass spectrometric characterization |
1996 |
Fullerene science and technology |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
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De Kerf, T.; Gestels, A.; Janssens, K.; Scheunders, P.; Steenackers, G.; Vanlanduit, S. |
Quantitative detection of corrosion minerals in carbon steel using shortwave infrared hyperspectral imaging |
2022 |
RSC advances |
12 |
|
UA library record; WoS full record |
|
|
|
Martinez, G.T.; Rosenauer, A.; de Backer, A.; Verbeeck, J.; Van Aert, S. |
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy |
2014 |
Ultramicroscopy |
137 |
74 |
UA library record; WoS full record; WoS citing articles |
|
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van Put, A.; Vertes, A.; Wegrzynek, D.; Treiger, B.; Van Grieken, R. |
Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images |
1994 |
Fresenius' journal of analytical chemistry |
350 |
|
UA library record; WoS full record; WoS citing articles |
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Szalóki, I.; Osán, J.; Ro, C.-U.; Van Grieken, R. |
Quantitative characterization of individual aerosol particles by thin-window electron probe microanalysis combined with iterative simulation |
2000 |
Spectrochimica acta: part B : atomic spectroscopy |
55 |
|
UA library record; WoS full record; WoS citing articles |
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