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Author |
Title  |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Salje, E.K.H.; Zhang, H.; Idrissi, H.; Schryvers, D.; Carpenter, M.A.; Moya, X.; Planes, A. |
Mechanical resonance of the austenite/martensite interface and the pinning of the martensitic microstructures by dislocations in Cu74.08Al23.13Be2.79 |
2009 |
Physical review: B: condensed matter and materials physics |
80 |
38 |
UA library record; WoS full record; WoS citing articles |
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van der Rest, A.; Idrissi, H.; Henry, F.; Favache, A.; Schryvers, D.; Proost, J.; Raskin, J.-P.; Van Overmeere, Q.; Pardoen, T. |
Mechanical behavior of ultrathin sputter deposited porous amorphous Al2O3 films |
2017 |
Acta materialia |
125 |
5 |
UA library record; WoS full record; WoS citing articles |
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Hervieu, M.; Michel, C.; Martin, C.; Huvé, M.; Van Tendeloo, G.; Maignan, A.; Pelloquin, D.; Goutenoire, F.; Raveau, B. |
Mécanismes de la non-stoechiométrie dans les nouveaux supraconducteurs à haute Tc |
1994 |
Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation |
4 |
|
UA library record; WoS full record; |
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Guzzinati, G.; Clark, L.; Béché, A.; Verbeeck, J. |
Measuring the orbital angular momentum of electron beams |
2014 |
Physical review : A : atomic, molecular and optical physics |
89 |
42 |
UA library record; WoS full record; WoS citing articles |
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Kirilenko, D.A.; Brunkov, P.N. |
Measuring the height-to-height correlation function of corrugation in suspended graphene |
2016 |
Ultramicroscopy |
165 |
3 |
|
|
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Kirilenko, D.A.; Dideykin, A.T.; Van Tendeloo, G. |
Measuring the corrugation amplitude of suspended and supported graphene |
2011 |
Physical review : B : condensed matter and materials physics |
84 |
31 |
UA library record; WoS full record; WoS citing articles |
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Potapov, P.L.; Schryvers, D. |
Measuring the absolute position of EELS ionisation edges in a TEM |
2004 |
Ultramicroscopy |
99 |
29 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Tirry, W.; Yang, Z.Q.; |
Measuring strain fields and concentration gradients around Ni4Ti3 precipitates |
2006 |
Materials science and engineering A: structural materials properties microstructure and processing |
438 |
35 |
UA library record; WoS full record; WoS citing articles |
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Biermans, E.; Molina, L.; Batenburg, K.J.; Bals, S.; Van Tendeloo, G. |
Measuring porosity at the nanoscale by quantitative electron tomography |
2010 |
Nano letters |
10 |
79 |
UA library record; WoS full record; WoS citing articles |
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Felten, A.; Gillon, X.; Gulas, M.; Pireaux, J.-J.; Ke, X.; Van Tendeloo, G.; Bittencourt, C.; Najafi, E.; Hitchcock, A.P. |
Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy |
2010 |
ACS nano |
4 |
26 |
UA library record; WoS full record; WoS citing articles |
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Goris, B.; de Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, K.J.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Aert, S.; Bals, S.; Sijbers, J.; Van Tendeloo, G. |
Measuring lattice strain in three dimensions through electron microscopy |
2015 |
Nano letters |
15 |
87 |
UA library record; WoS full record; WoS citing articles |
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De wael, A.; De Backer, A.; Jones, L.; Varambhia, A.; Nellist, P.D.; Van Aert, S. |
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy |
2020 |
Physical Review Letters |
124 |
|
UA library record; WoS full record; WoS citing articles |
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Hendrich, C.; Favre, L.; Ievlev, D.N.; Dobrynin, A.N.; Bras, W.; Hörmann, U.; Piscopiello, E.; Van Tendeloo, G.; Lievens, P.; Temst, K. |
Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering |
2007 |
Applied physics A : materials science & processing |
86 |
11 |
UA library record; WoS full record; WoS citing articles |
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Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Microscopy of Semiconducting Materials |
107 |
|
UA library record; WoS full record; |
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Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R.; Waag, A. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Applied Physics Letters |
86 |
5 |
UA library record; WoS full record; WoS citing articles |
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Korneychuk, S.; Guzzinati, G.; Verbeeck, J. |
Measurement of the Indirect Band Gap of Diamond with EELS in STEM |
2018 |
Physica status solidi : A : applications and materials science |
215 |
6 |
UA library record; WoS full record; WoS citing articles |
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Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. |
Measurement of specimen thickness by phase change determination in TEM |
2008 |
Ultramicroscopy |
108 |
2 |
UA library record; WoS full record; WoS citing articles |
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Mahr, C.; Müller-Caspary, K.; Graf, M.; Lackmann, A.; Grieb, T.; Schowalter, M.; Krause, F.F.; Mehrtens, T.; Wittstock, A.; Weissmueller, J.; Rosenauer, A. |
Measurement of local crystal lattice strain variations in dealloyed nanoporous gold |
2018 |
Materials research letters |
6 |
4 |
UA library record; WoS full record; WoS citing articles |
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Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. |
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy |
2016 |
Ultramicroscopy |
178 |
93 |
UA library record; WoS full record; WoS citing articles |
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den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework |
2005 |
Ultramicroscopy |
104 |
70 |
UA library record; WoS full record; WoS citing articles |
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Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
2005 |
Ultramicroscopy |
104 |
37 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D.; Boullay, P.; Potapov, P.; Satto, C. |
Martensitic transformations studied on nano- and microscopic length scales |
2000 |
Festkörperprobleme |
40 |
|
UA library record |
|
|
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Schryvers, D.; Holland-Moritz, D. |
Martensitic transformations and microstructures in splat-cooled Ni-Al |
1999 |
Materials science and engineering: part A: structural materials: properties, microstructure and processing |
273/275 |
6 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D. |
Martensitic and related transformations in Ni-Al alloys |
1995 |
Journal de physique: 4
T2 – IIIrd European Symposium on Martensitic Transformations (ESOMAT 94), SEP 14-16, 1994, BARCELONA, SPAIN |
5 |
21 |
UA library record; WoS full record; WoS citing articles |
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Schryvers, D. |
Martensitic and bainitic transformations in Ni-Al alloys |
1994 |
Journal de physique: 4 |
C2 |
|
UA library record |
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Du, C.; Hoefnagels, J.P.M.; Kolling, S.; Geers, M.G.D.; Sietsma, J.; Petrov, R.; Bliznuk, V.; Koenraad, P.M.; Schryvers, D.; Amin-Ahmadi, B. |
Martensite crystallography and chemistry in dual phase and fully martensitic steels |
2018 |
Materials characterization |
139 |
|
UA library record; WoS full record; WoS citing articles |
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Schattschneider, P.; Schaffer, B.; Ennen, I.; Verbeeck, J. |
Mapping spin-polarized transitions with atomic resolution |
2012 |
Physical review : B : condensed matter and materials physics |
85 |
41 |
UA library record; WoS full record; WoS citing articles |
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Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. |
Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures |
2013 |
Physical review : B : condensed matter and materials physics |
88 |
15 |
UA library record; WoS full record; WoS citing articles |
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Choukroun, D.; Pacquets, L.; Li, C.; Hoekx, S.; Arnouts, S.; Baert, K.; Hauffman, T.; Bals, S.; Breugelmans, T. |
Mapping composition–selectivity relationships of supported sub-10 nm Cu–Ag nanocrystals for high-rate CO₂ electroreduction |
2021 |
Acs Nano |
15 |
25 |
UA library record; WoS full record; WoS citing articles |
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Du, K.; Zhang, M.; Dai, C.; Zhou, Z.N.; Xie, Y.W.; Ren, Z.H.; Tian, H.; Chen, L.Q.; Van Tendeloo, G.; Zhang, Z. |
Manipulating topological transformations of polar structures through real-time observation of the dynamic polarization evolution |
2019 |
Nature communications |
10 |
|
UA library record; WoS full record; WoS citing articles |
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