toggle visibility
Search within Results:
Display Options:

Select All    Deselect All
List View
 |   | 
   print
  Author Title Year Publication Volume Times cited Additional Links Links
Paolella, A.; Bertoni, G.; Hovington, P.; Feng, Z.; Flacau, R.; Prato, M.; Colombo, M.; Marras, S.; Manna, L.; Turner, S.; Van Tendeloo, G.; Guerfi, A.; Demopoulos, G.P.; Zaghib, K.; Cation exchange mediated elimination of the Fe-antisites in the hydrothermal synthesis of LiFePO4 2015 Nano energy 16 27 UA library record; WoS full record; WoS citing articles pdf url doi
Abakumov, A.M.; Morozov, V.A.; Tsirlin, A.A.; Verbeeck, J.; Hadermann, J. Cation ordering and flexibility of the BO42- tetrahedra in incommensurately modulated CaEu2(BO4)4 (B = Mo, W) scheelites 2014 Inorganic chemistry 53 48 UA library record; WoS full record; WoS citing articles pdf doi
Van Tendeloo, G.; De Meulenaere, P.; Hervieu, M.; Letouze, F.; Martin, C. Cation ordering in Tl- and Hg-based superconducting materials 1996 UA library record
Van Tendeloo, G.; De Meulenaere, P.; Letouzé, F.; Martin, C.; Hervieu, M.; Raveau, B. Cation ordering in [(Tl, M)O] layers of “1202”-based cuprates : similarity to ordering in fcc-based alloys 1997 Journal of solid state chemistry 132 2 UA library record; WoS full record; WoS citing articles pdf doi
Kirsanova, M.A.; Mori, T.; Maruyama, S.; Abakumov, A.M.; Van Tendeloo, G.; Olenev, A.; Shevelkov, A.V. Cationic clathrate of type-III Ge172-xPxTey (y\approx21,5, x\approx2y) : synthesis, crystal structure and thermoelectric properties 2013 Inorganic chemistry 52 3 UA library record; WoS full record; WoS citing articles pdf doi
Zelaya, E.; Schryvers, D.; Tolley, A.; Fitchner, P.F.P. Cavity nucleation and growth in Cu-Zn-Al irradiated with Cu+ ions at different temperatures 2010 Intermetallics 18 1 UA library record; WoS full record; WoS citing articles pdf doi
Robin, I.-C.; Aichele, T.; Bougerol, C.; André, R.; Tatarenko, S.; Bellet-Amalric, E.; van Daele, B.; Van Tendeloo, G. CdSe quantum dot formation: alternative paths to relaxation of a strained CdSe layer and influence of the capping conditions 2007 Nanotechnology 18 8 UA library record; WoS full record; WoS citing articles pdf doi
Aichele, T.; Robin, I.-C.; Bougerol, C.; André, R.; Tatarenko, S.; Van Tendeloo, G. CdSe quantum dot formation induced by amorphous Se 2007 Surface science : a journal devoted to the physics and chemistry of interfaces T2 – International Conference on NANO-Structures Self Assembling, JUL 02-06, 2006, Aix en Provence, FRANCE 601 UA library record; WoS full record pdf doi
Gorlé, C.; van Beeck, J.; Rambaud, P.; Van Tendeloo, G. CFD modelling of small particle dispersion: the influence of the turbulence kinetic energy in the atmospheric boundary layer 2009 Atmospheric environment : an international journal 43 79 UA library record; WoS full record; WoS citing articles pdf doi
Van Holsbeke, C.S.; Verhulst, S.L.; Vos, W.G.; de Backer, J.W.; Vinchurkar, S.C.; Verdonck, P.R.; van Doorn, J.W.D.; Nadjmi, N.; de Backer, W.A. Change in upper airway geometry between upright and supine position during tidal nasal breathing 2014 Journal Of Aerosol Medicine And Pulmonary Drug Delivery 27 16 UA library record; WoS full record; WoS citing articles doi
Neyts, E.C.; van Duin, A.C.T.; Bogaerts, A. Changing chirality during single-walled carbon nanotube growth : a reactive molecular dynamics/Monte Carlo study 2011 Journal of the American Chemical Society 133 116 UA library record; WoS full record; WoS citing articles pdf doi
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K. Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation 2001 Institute of physics conference series UA library record; WoS full record;
Komendová, L. Characteristic length scales and vortex interactions in two-component superconducting systems 2013 UA library record
Yasuda, K.; Hisatsune, K.; Udoh, K.; Tanaka, Y.; Van Tendeloo, G.; van Landuyt, J. Characteristic mosaic texture related to orderingin AuCu-9at.%Ag pseudobinary alloy 1992 Dentistry in Japan 29 UA library record
Austing, D.G.; Payette, C.; Yu, G.; Gupta, J.A.; Aers, G.C.; Nair, S.V.; Partoens, B.; Amaha, S.; Tarucha, S. Characterization and modeling of single-particle energy levels and resonant currents in a coherent quantum dot mixer 2011 AIP conference proceedings T2 – 30th International Conference on the Physics of Semiconductors (ICPS-30), JUL 25-30, 2010, Seoul, SOUTH KOREA UA library record; WoS full record doi
Ghica, C.; Nistor, L.C.; Bender, H.; Richard, O.; Van Tendeloo, G.; Ulyashin, A.; Characterization of {111} planar defects induced in silicon by hydrogen plasma treatments 2006 Philosophical magazine 86 12 UA library record; WoS full record; WoS citing articles pdf doi
d' Hondt, H. Characterization of anion deficient perovskites 2011 UA library record
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Characterization of complex silver halide photographic systems by means of analytical electron microscopy 1995 Microbeam analysis 4 9 UA library record; WoS full record; WoS citing articles
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Characterization of complex silver halide photographic systems by means of analytical electron microscopy 1994 Microbeam analysis 3 UA library record
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging 1991 UA library record
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry 1991 Journal of crystal growth 110 40 UA library record; WoS full record; WoS citing articles
Oleshko, V.; Gijbels, R.; Jacob, W.; Lakiere, F.; van Daele, A.; Silaev, E.; Kaplun, L. Characterization of double structure tabular microcrystals of silver halide emulsions by means of electron energy-loss spectroscopy, zero-loss electron spectroscopic imaging and energy dispersive X-ray microanalysis 1995 Microscopy, microanalysis, microstructures 6 7 UA library record; WoS full record; WoS citing articles doi
Kirilenko, D. Characterization of graphene by electron diffraction 2012 UA library record
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas 1997 Journal of crystal growth 173 4 UA library record; WoS full record; WoS citing articles
Wiktor, C. Characterization of metal-organic frameworks and other porous materials via advanced transmission electron microscopy 2014 UA library record
Ahonen, P.P.; Kauppinen, E.I.; Tapper, U.; Nenonen, P.; Joubert, J.C.; Deschanvres, J.L.; Van Tendeloo, G. Characterization of MO derived nanostructured titania powders 1998 Electron microscopy: vol. 2 UA library record; WoS full record;
Mortet, V.; Zhang, L.; Echert, M.; Soltani, A.; d' Haen, J.; Douheret, O.; Moreau, M.; Osswald, S.; Neyts, E.; Troadec, D.; Wagner, P.; Bogaerts, A.; Van Tendeloo, G.; Haenen, K. Characterization of nano-crystalline diamond films grown under continuous DC bias during plasma enhanced chemical vapor deposition 2009 Materials Research Society symposium proceedings UA library record doi
Tirumalasetty, G.K.; van Huis, M.A.; Fang, C.M.; Xu, Q.; Tichelaar, F.D.; Hanlon, D.N.; Sietsma, J.; Zandbergen, H.W. Characterization of NbC and (Nb, Ti)N nanoprecipitates in TRIP assisted multiphase steels 2011 Acta materialia 59 58 UA library record; WoS full record; WoS citing articles pdf doi
Verleysen, E.; Bender, H.; Richard, O.; Schryvers, D.; Vandervorst, W. Characterization of nickel silicides using EELS-based methods 2010 Journal of microscopy 240 11 UA library record; WoS full record; WoS citing articles doi
de Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.I.; van Landuyt, J.; Simoen, E.; Claeys, C. Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy 2004 Journal of the electrochemical society 151 13 UA library record; WoS full record; WoS citing articles pdf doi
Select All    Deselect All
List View
 |   | 
   print

Save Citations:
Export Records: