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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. Evolution of impurity clusters and photographic sensitivity 2000 Zhurnal nauchnoj prikladnoj fotografii i kinematografii 45 UA library record
Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. Evolution of impurity clusters and mechanism of formation of photographic sensitivity 1998 UA library record
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Combined characterization of nanostructures by AEM and STM 1996 Mikrochimica acta: supplementum 13 UA library record; WoS full record;
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Characterization of complex silver halide photographic systems by means of analytical electron microscopy 1995 Microbeam analysis 4 9 UA library record; WoS full record; WoS citing articles
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Complex structural and analytical characterization of silver halide photographic systems by means of analytical electron microscopy 1994 UA library record; WoS full record;
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Characterization of complex silver halide photographic systems by means of analytical electron microscopy 1994 Microbeam analysis 3 UA library record
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