| |
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links  |
Links |
|
|
Teodorescu, V.S.; Mihailescu, I.N.; Dinescu, M.; Chitica, N.; Nistor, L.C.; van Landuyt, J.; Barborica, A. |
Laser induced phase transition in iron thin films |
1994 |
Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation |
4 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S. |
Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp |
1994 |
MRS bulletin |
|
|
UA library record; WoS full record; |
|
|
|
Leroux, F. |
Characterization of soft-hard matter composite materials by advanced transmission electron microscopy |
2012 |
|
|
|
UA library record |
|
|
|
Kirilenko, D. |
Characterization of graphene by electron diffraction |
2012 |
|
|
|
UA library record |
|
|
|
Van Aert, S. |
Statistical parameter estimation theory : a tool for quantitative electron microscopy |
2012 |
|
|
|
UA library record |
|
|
|
Tan, H. |
From EELS to oxidation state mapping : an investigation into oxidation state mapping of transition metals with electron energy-loss spectroscopy |
2012 |
|
|
|
UA library record |
|
|
|
Van Tendeloo, G.; Hervieu, M.; Chaillout, C. |
Defect structure of Hg-based ceramic superconductors (invited) |
1994 |
Sciences |
|
|
UA library record; WoS full record; |
|
|
|
Schryvers, D.; Van Tendeloo, G.; van Landuyt, J.; Le Tanner |
HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys (Invited) |
1994 |
|
|
|
UA library record; WoS full record; |
|
|
|
Bernaerts, D.; Zhang, X.; Zhang, X.; Van Tendeloo, G.; Vanlanduyt, J.; Amelinckx, S. |
HREM study of Rb6C60 and helical shaped carbon nanotubules |
1994 |
Sciences |
|
|
UA library record; WoS full record; |
|
|
|
Schryvers, D.; Tanner, L.E. |
On the phase-like nature of the 7m structure in ni-al |
1994 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Tendeloo, G.; Amelinckx, S. |
Electron-microscopy and the structural studies of superconducting materials and fullerites |
1994 |
NATO Advanced Study Institutes series: series E : applied sciences
T2 – NATO Advanced Study Institute on Materials and crystallographic Aspects, of HT(c)-Superconductivity, May 17-30, 1993, Erice, Italy |
|
|
UA library record; WoS full record; |
|
|
|
Vasiliev, A.L.; Van Tendeloo, G.; Boikov, Y.; Olsson, E.; Ivanov, Z.; Claeson, T.; Kiselev, N.A. |
Structural aspects of the combination of Si and YBa2Cu3O7-x |
1995 |
Institute of physics conference series |
146 |
|
UA library record; WoS full record; |
|
|
|
Lebedev, O.; Van Tendeloo, G.; Amelinckx, S.; Leibold, B.; Habermeier, H.U. |
HREM investigation of La(1-x)Ca(x)MnO3-delta thin films |
1998 |
|
|
|
UA library record; WoS full record; |
|
|
|
Seo, J.W.; Schryvers, D.; Potapov, P. |
Electron microscopy study of ternary precipitates in Ni39.6Mn47.5Ti12.9 |
1998 |
|
|
|
UA library record; WoS full record; |
|
|
|
Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B. |
Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study |
2000 |
|
|
|
UA library record; WoS full record; |
|
|
|
Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C. |
The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals |
2000 |
|
|
|
UA library record; WoS full record; |
|
|
|
Stuer, G.; Bender, H.; van Landuyt, J.; Eyben, P. |
Stress analysis with convergent beam electron diffraction around NMOS transistors |
2001 |
|
|
|
UA library record; WoS full record; |
|
|
|
Hens, S.; Stuer, C.; Bender, H.; Loo, R.; van Landuyt, J. |
Quantitative EFTEM study of germanium quantum dots |
2001 |
|
|
|
UA library record; WoS full record; |
|
|
|
Nistor, L.; Bender, H.; van Landuyt, J.; Nemeth, S.; Boeve, H.; De Boeck, J.; Borghs, G. |
HREM investigation of a Fe/GaN/Fe tunnel junction |
2001 |
Institute of physics conference series
T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England |
|
|
UA library record; WoS full record; |
|
|
|
Leon, M.; Merino, J.M.; Van Tendeloo, G. |
Structural analysis of CuInSe2, CuInTe2 and CuInSeTe by electron microscopy and X-ray techniques |
2009 |
Acta Microscopica |
18 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Weill; Chevalier; Chambon; Tressaud; Darriet; Etourneau; Van Tendeloo, G. |
Electron-microscopy investigation of superconducting la2cu(o, f)4+y oxyfluoride |
1993 |
European journal of solid state and inorganic chemistry |
30 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K. |
Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation |
2001 |
Institute of physics conference series |
|
|
UA library record; WoS full record; |
|
|
|
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis |
2003 |
Institute of physics conference series |
|
|
UA library record; WoS full record; |
|
|
|
De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. |
Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy |
2002 |
|
|
|
UA library record; WoS full record; |
|
|
|
Yandouzi, M.; Pauwels, B.; Schryvers, D.; Van Swygenhoven, H.; Van Tendeloo, G. |
Structural characterization of nanostructured Ni3Al processed by inert gas condensation |
2003 |
Diffusion and defect data : solid state data : part A : defect and diffusion forum |
213 |
|
UA library record; WoS full record; |
|
|
|
Horvath, Z.E.; Biro, L.P.; Van Tendeloo, G.; Tondeur, C.; Bister, G.; Pierard, N.; Fonseca, A.; Nagy, J.B. |
Optimization of the amount of catalyst and reaction time in single wall nanotube production |
2003 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
94 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
van Daele, B.; Van Tendeloo, G.; Ruythooren, W.; Derluyn, J.; Leys, M.R.; Germain, M. |
Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN |
2005 |
Springer proceedings in physics |
107 |
|
UA library record; WoS full record; |
|
|
|
Schryvers, D.; Tirry, W.; Yang, Z. |
Ni4Ti3 precipitates and their influence on the surrounding NiTi matrix |
2005 |
|
|
|
UA library record; WoS full record; |
|
|
|
Krsmanovic, R.; Bertoni, G.; Van Tendeloo, G. |
Structural characterization of erbium doped LAS glass ceramics obtained by glass melting technique |
2007 |
Materials science forum |
555 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Biermans, E. |
Electron tomography : from qualitative to quantitative |
2012 |
|
|
|
UA library record |
|
