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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Schulze, A.; Hantschel, T.; Dathe, A.; Eyben, P.; Ke, X.; Vandervorst, W. Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects 2012 Nanotechnology 23 29 UA library record; WoS full record; WoS citing articles pdf doi
Stuer, G.; Bender, H.; van Landuyt, J.; Eyben, P. Stress analysis with convergent beam electron diffraction around NMOS transistors 2001 UA library record; WoS full record;
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